R. E. Acosta

649 total citations
32 papers, 477 citations indexed

About

R. E. Acosta is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, R. E. Acosta has authored 32 papers receiving a total of 477 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Electrical and Electronic Engineering, 9 papers in Surfaces, Coatings and Films and 8 papers in Biomedical Engineering. Recurrent topics in R. E. Acosta's work include Advancements in Photolithography Techniques (12 papers), Electron and X-Ray Spectroscopy Techniques (9 papers) and Electrodeposition and Electroless Coatings (7 papers). R. E. Acosta is often cited by papers focused on Advancements in Photolithography Techniques (12 papers), Electron and X-Ray Spectroscopy Techniques (9 papers) and Electrodeposition and Electroless Coatings (7 papers). R. E. Acosta collaborates with scholars based in United States, Germany and Brazil. R. E. Acosta's co-authors include R. J. von Gutfeld, C. H. Bajorek, J. Cl. Puippe, Chung-Wen Ho, D. A. Chance, L. T. Romankiw, Charles W. Tobias, D. Landolt, Rolf Müller and José R. Maldonado and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Thin Solid Films.

In The Last Decade

R. E. Acosta

32 papers receiving 431 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. E. Acosta United States 9 339 150 86 82 69 32 477
Qi-Chu Zhang Australia 16 425 1.3× 49 0.3× 146 1.7× 41 0.5× 108 1.6× 24 803
F. Sabary France 11 416 1.2× 96 0.6× 127 1.5× 32 0.4× 20 0.3× 25 543
Henri Michel Germany 9 212 0.6× 102 0.7× 213 2.5× 41 0.5× 74 1.1× 12 427
S. Craig Australia 11 175 0.5× 23 0.2× 185 2.2× 82 1.0× 69 1.0× 18 426
Shun Tanaka Japan 10 108 0.3× 51 0.3× 213 2.5× 40 0.5× 116 1.7× 52 428
P.K. Vasudev United States 12 575 1.7× 80 0.5× 126 1.5× 70 0.9× 26 0.4× 57 667
Frank Torregrosa France 11 318 0.9× 162 1.1× 191 2.2× 169 2.1× 36 0.5× 69 514
D.J. Sharp United States 13 245 0.7× 25 0.2× 189 2.2× 77 0.9× 27 0.4× 35 480
Osamu Maida Japan 16 639 1.9× 106 0.7× 477 5.5× 42 0.5× 45 0.7× 53 807
V. Kopustinskas Lithuania 14 167 0.5× 179 1.2× 362 4.2× 72 0.9× 51 0.7× 47 571

Countries citing papers authored by R. E. Acosta

Since Specialization
Citations

This map shows the geographic impact of R. E. Acosta's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. E. Acosta with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. E. Acosta more than expected).

Fields of papers citing papers by R. E. Acosta

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. E. Acosta. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. E. Acosta. The network helps show where R. E. Acosta may publish in the future.

Co-authorship network of co-authors of R. E. Acosta

This figure shows the co-authorship network connecting the top 25 collaborators of R. E. Acosta. A scholar is included among the top collaborators of R. E. Acosta based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. E. Acosta. R. E. Acosta is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Acosta, R. E., et al.. (2012). On-chip 4to20mA reconfigurable current loop transmitter for smart sensor applications. 16. 1–6. 1 indexed citations
2.
Acosta, R. E., et al.. (2002). Reliability and fracture of metal-polymer structures with fine-line geometries (packaging). 2108–2111. 1 indexed citations
3.
Maldonado, Juan R., et al.. (1998). Pellicles for x-ray lithography masks. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3331. 245–245. 1 indexed citations
4.
Laird, Daniel, et al.. (1996). Predicting in-plane distortion from electron-beam lithography on x-ray mask membranes. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(6). 4308–4313. 5 indexed citations
5.
Acosta, R. E., et al.. (1996). Image placement errors in x-ray masks induced by changes in resist stress during electron-beam writing. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(6). 4354–4358. 5 indexed citations
6.
Schmidt, A., et al.. (1995). Micromachining using Helios. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2437. 134–134. 1 indexed citations
7.
Acosta, R. E., Walter A. Johnson, B. S. Berry, & W. C. Pritchet. (1992). Annealing behavior of gold absorber in x-ray masks. Microelectronic Engineering. 17(1-4). 189–192. 6 indexed citations
8.
Acosta, R. E.. (1991). X-ray mask distortion due to radiation damage. Microelectronic Engineering. 13(1-4). 259–262. 6 indexed citations
9.
Gutfeld, R. J. von, et al.. (1991). Copper exchange plating on palladium and its relation to circuit repair. Applied Physics Letters. 59(26). 3490–3492. 2 indexed citations
10.
Viswanathan, R., R. E. Acosta, David E. Seeger, et al.. (1989). Fully scaled 0.5μm MOS circuits by synchrotron radiation X-ray lithography: Mask fabrication and chraterization. Microelectronic Engineering. 9(1-4). 93–96. 2 indexed citations
11.
Acosta, R. E., et al.. (1989). Fracture of Metal-Polymer Interfaces with Fine-Line Geometries. MRS Proceedings. 167. 1 indexed citations
12.
Uzoh, Cyprian, et al.. (1988). Mechanical characterization of membranes for x-ray lithography masks. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 6(6). 2178–2183. 8 indexed citations
13.
Acosta, R. E., et al.. (1985). Distortion of masks for x-ray lithography. Microelectronic Engineering. 3(1-4). 615–621. 6 indexed citations
14.
Acosta, R. E., et al.. (1985). Characterization of stress in the absorber of x-ray masks using a holographic technique. Microelectronic Engineering. 3(1-4). 573–579. 1 indexed citations
15.
Gutfeld, R. J. von, L. T. Romankiw, & R. E. Acosta. (1982). Laser-Enhanced Plating and Etching: Mechanisms and Applications. IBM Journal of Research and Development. 26(2). 136–144. 60 indexed citations
16.
Acosta, R. E., L. T. Romankiw, & R. J. von Gutfeld. (1982). Laser-enhanced plating: A review of its mechanisms and applications. Thin Solid Films. 95(2). 131–132. 4 indexed citations
17.
Ho, Chung-Wen, D. A. Chance, C. H. Bajorek, & R. E. Acosta. (1982). The Thin-Film Module as a High-Performance Semiconductor Package. IBM Journal of Research and Development. 26(3). 286–296. 115 indexed citations
18.
Puippe, J. Cl., R. E. Acosta, & R. J. von Gutfeld. (1981). Investigation of Laser‐Enhanced Electroplating Mechanisms. Journal of The Electrochemical Society. 128(12). 2539–2545. 88 indexed citations
19.
Romankiw, L. T., et al.. (1978). Coercive force of electrodeposited NiFe on top of conductors for SLM bubble device applications. IEEE Transactions on Magnetics. 14(5). 424–426. 6 indexed citations
20.
Acosta, R. E.. (1974). TRANSPORT PROCESSES IN HIGH RATE ELECTROLYSIS. eScholarship (California Digital Library). 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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