S. M. Hu

4.6k total citations · 1 hit paper
66 papers, 3.5k citations indexed

About

S. M. Hu is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, S. M. Hu has authored 66 papers receiving a total of 3.5k indexed citations (citations by other indexed papers that have themselves been cited), including 50 papers in Electrical and Electronic Engineering, 23 papers in Materials Chemistry and 21 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in S. M. Hu's work include Silicon and Solar Cell Technologies (35 papers), Semiconductor materials and devices (19 papers) and Semiconductor materials and interfaces (17 papers). S. M. Hu is often cited by papers focused on Silicon and Solar Cell Technologies (35 papers), Semiconductor materials and devices (19 papers) and Semiconductor materials and interfaces (17 papers). S. M. Hu collaborates with scholars based in United States and China. S. M. Hu's co-authors include R.W. Dutton, P. Fahey, W. Patrick, D. R. Kerr, H. Föll, T. Y. Tan, D. Ahlgren, J. O. Chu, Paul Ronsheim and Soo‐Young Oh and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

S. M. Hu

64 papers receiving 3.1k citations

Hit Papers

Stress-related problems in silicon technology 1991 2026 2002 2014 1991 100 200 300 400
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Stress-related problems in silicon technology
    1991 402 citations S. M. Hu Journal of Applied Physics profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. M. Hu United States 34 2.9k 1.3k 1.0k 752 344 66 3.5k
Kôji Sumino Japan 34 2.9k 1.0× 1.7k 1.3× 1.9k 1.9× 768 1.0× 363 1.1× 191 4.0k
T. Y. Tan United States 32 3.0k 1.1× 1.6k 1.3× 1.1k 1.1× 688 0.9× 121 0.4× 112 3.5k
E.P. EerNisse United States 27 1.8k 0.6× 1.1k 0.8× 1.1k 1.0× 1.4k 1.9× 787 2.3× 100 3.4k
Jan Vanhellemont Belgium 29 3.0k 1.0× 1.5k 1.2× 1.2k 1.2× 426 0.6× 130 0.4× 305 3.5k
R. Reif United States 36 3.8k 1.3× 599 0.5× 1.1k 1.1× 470 0.6× 184 0.5× 162 4.1k
M. Ettenberg United States 27 2.5k 0.9× 1.7k 1.4× 543 0.5× 482 0.6× 311 0.9× 133 3.2k
L. I. Maissel United States 16 1.9k 0.7× 597 0.5× 1.2k 1.2× 481 0.6× 784 2.3× 31 3.1k
J.P. McVittie United States 30 2.6k 0.9× 517 0.4× 987 1.0× 649 0.9× 532 1.5× 116 3.3k
R. Glang United States 10 1.4k 0.5× 581 0.5× 1.0k 1.0× 438 0.6× 524 1.5× 20 2.4k
K.M. Geib United States 34 3.4k 1.2× 2.4k 1.9× 699 0.7× 237 0.3× 207 0.6× 177 4.1k

Countries citing papers authored by S. M. Hu

Since Specialization
Citations

This map shows the geographic impact of S. M. Hu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. M. Hu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. M. Hu more than expected).

Fields of papers citing papers by S. M. Hu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. M. Hu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. M. Hu. The network helps show where S. M. Hu may publish in the future.

Co-authorship network of co-authors of S. M. Hu

This figure shows the co-authorship network connecting the top 25 collaborators of S. M. Hu. A scholar is included among the top collaborators of S. M. Hu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. M. Hu. S. M. Hu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Hu, S. M. & D. Chidambarrao. (1992). Effect of crystallographic alignment of isolation trenches: A resolved-shear-stress perspective. Applied Physics Letters. 61(7). 783–785. 6 indexed citations
3.
Hu, S. M.. (1992). Vacancies and Self‐Interstitials in Silicon: Generation and Interaction in Diffusion. Journal of The Electrochemical Society. 139(7). 2066–2075. 13 indexed citations
4.
Hu, S. M.. (1991). Stress-driven void growth in narrow interconnection lines. Applied Physics Letters. 59(21). 2685–2687. 10 indexed citations
5.
Hu, S. M.. (1985). Oxygen Precipitation in Silicon. MRS Proceedings. 59. 21 indexed citations
6.
Hu, S. M.. (1982). Between carrier distributions and dopant atomic distribution in beveled silicon substrates. Journal of Applied Physics. 53(3). 1499–1510. 52 indexed citations
7.
Hu, S. M., et al.. (1982). Flaws in Sidewall Oxides Grown on Polysilicon Gate. Journal of The Electrochemical Society. 129(5). 1084–1089. 13 indexed citations
8.
Tan, T. Y., H. Föll, & S. M. Hu. (1981). On the diamond-cubic to hexagonal phase transformation in silicon. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 44(1). 127–140. 87 indexed citations
9.
Hu, S. M.. (1980). Oxygen, Oxidation Stacking Faults, and Related Phenomena in Silicon. MRS Proceedings. 2. 12 indexed citations
10.
Hu, S. M.. (1977). A method for finding critical stresses of dislocation movement. Applied Physics Letters. 31(3). 139–141. 36 indexed citations
11.
Hu, S. M.. (1977). Cathodic Mapping of Leakage Defects. Journal of The Electrochemical Society. 124(4). 578–582. 4 indexed citations
12.
Hu, S. M.. (1975). Effects of surface films and film edges on dislocation movement in silicon. Journal of Applied Physics. 46(4). 1465–1469. 17 indexed citations
13.
Hu, S. M.. (1973). On Interaction Potential, Correlation Factor, Vacancy Mobility, and Activation Energy of Impurity Diffusion in Diamond Lattice. physica status solidi (b). 60(2). 595–604. 52 indexed citations
14.
Hu, S. M.. (1973). Dislocations in thermally stressed silicon wafers. Applied Physics Letters. 22(5). 261–264. 22 indexed citations
15.
Hu, S. M.. (1971). Interface Equilibrium Concentrations During Diffusion. Journal of The Electrochemical Society. 118(11). 1770–1770. 2 indexed citations
16.
Hu, S. M., et al.. (1971). Reply to ``Discussion on `Approximate Theory of Emitter-Push Effect' ''. Journal of Applied Physics. 42(5). 2153–2155. 2 indexed citations
17.
Hu, S. M. & M. S. Mock. (1970). Vacancy Transients During Impurity Diffusion in Semiconductors. Physical review. B, Solid state. 1(6). 2582–2586. 3 indexed citations
18.
Hu, S. M.. (1968). Redistribution of Diffused Layers during Epitaxy and Other Process Steps. Journal of Applied Physics. 39(8). 3844–3849. 4 indexed citations
19.
Hu, S. M. & D. R. Kerr. (1967). Observation of Etching of n-Type Silicon in Aqueous HF Solutions. Journal of The Electrochemical Society. 114(4). 414–414. 59 indexed citations
20.
Hu, S. M.. (1966). Properties of Amorphous Silicon Nitride Films. Journal of The Electrochemical Society. 113(7). 693–693. 88 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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