I. Ames
- Electrical and Electronic Engineering top 10%
- Electronic, Optical and Magnetic Materials top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Condensed Matter Physics top 10%
- Materials Chemistry
- Co-authors
- F. M. d’HeurleS. BasavaiahJ. H. GreinerB. S. BerryS. K. LahiriJohn M. BakerMasanori MurakamiAlexander Warnecke
- Topics
- Copper Interconnects and Reliability (4 papers)Electronic Packaging and Soldering Technologies (4 papers)Physics of Superconductivity and Magnetism (3 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsCondensed Matter PhysicsAtomic and Molecular Physics, and Optics
- Partner nations
- United StatesBrazil
In The Last Decade
I. Ames
15 papers receiving 576 citations
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 421
- Electronic, Optical and Magnetic Materials 294
- Atomic and Molecular Physics, and Optics 273
- Condensed Matter Physics 123
- Materials Chemistry 83
Countries citing papers authored by I. Ames
This map shows the geographic impact of I. Ames's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I. Ames with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I. Ames more than expected).
Fields of papers citing papers by I. Ames
This network shows the impact of papers produced by I. Ames. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I. Ames. The network helps show where I. Ames may publish in the future.
Co-authorship network of co-authors of I. Ames
This figure shows the co-authorship network connecting the top 25 collaborators of I. Ames. A scholar is included among the top collaborators of I. Ames based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with I. Ames. I. Ames is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 7 | |
| 3 | 155 | |
| 4 | 11 | |
| 5 | 58 | |
| 6 | 14 | |
| 7 | 2 | |
| 8 | 71 | |
| 9 | 232 | |
| 10 | 32 | |
| 11 | 3 | |
| 12 | 20 | |
| 13 | 1 | |
| 14 | 5 | |
| 15 | 9 | |
| 16 | 6 |
About I. Ames
I. Ames is a scholar working on Surfaces, Coatings and Films, Condensed Matter Physics and Atomic and Molecular Physics, and Optics, having authored 16 papers that have together received 628 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (4 papers), Electronic Packaging and Soldering Technologies (4 papers) and Physics of Superconductivity and Magnetism (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (294 citations), Condensed Matter Physics (123 citations) and Atomic and Molecular Physics, and Optics (273 citations). I. Ames has collaborated with scholars based in United States and Brazil. Frequent co-authors include F. M. d’Heurle, S. Basavaiah, J. H. Greiner, B. S. Berry, S. K. Lahiri, John M. Baker, Masanori Murakami, Alexander Warnecke, C. J. Kircher and S. P. Klepner. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Review of Scientific Instruments.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.