J.A. Croon

1.3k citations

44 papers · 915 indexed · h-index 17

Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials 16
Electrical and Electronic Engineering top 5%
- Advancements in Semiconductor Devices and Circuit Design 21
- Semiconductor materials and devices 19
- Radio Frequency Integrated Circuit Design 7
- Integrated Circuits and Semiconductor Failure Analysis 7
- Low-power high-performance VLSI design 6
Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing 7
Electronic, Optical and Magnetic Materials
- Ga2O3 and related materials 6
Atomic and Molecular Physics, and Optics

Co-authors: Willy Sansen Jan Šonský Stefaan Decoutere H.E. Maes G.A.M. Hurkx M. Rosmeulen Michael J. Uren Martin Kuball
Cited by: Condensed Matter Physics Electrical and Electronic Engineering Hardware and Architecture
Journals: IEEE Transactions on Electron Devices (7 papers)IEEE Electron Device Letters (2 papers)IEEE Journal of Solid-State Circuits (2 papers)
Partner nations: Netherlands Belgium United Kingdom

In The Last Decade

J.A. Croon

43 papers receiving 861 citations

Peers

Countries citing papers authored by J.A. Croon

Since Specialization

Citations

This map shows the geographic impact of J.A. Croon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.A. Croon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.A. Croon more than expected).

Fields of papers citing papers by J.A. Croon

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.A. Croon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.A. Croon. The network helps show where J.A. Croon may publish in the future.

Co-authorship network

The 25 scholars most cited alongside J.A. Croon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.A. Croon Line = papers co-authored together J.A. Croon links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	2DEG Retraction and Potential Distribution of GaN–on–Si HEMTs Investigated Through a Floating Gate Terminal IEEE Transactions on Electron Devices ·Isabella Rossetto,Matteo Meneghini,Carlo De Santi,洪新发,Razia Sultana,G.A.M. Hurkx,J.A. Croon,Jan Šonský,Gaudenzio Meneghesso,Enrico Zanoni	2018	11
2	Ring-oscillator test-structures for sub-0.1% accuracy wafer-level characterization of active- and standby current consumption, variability, and fast aging of oscillation frequencies M. Vertregt,Hans Tuinhout,حسین عباسی,F. J. Riester,J.A. Croon	2017	0
3	Field-Related Failure of GaN-on-Si HEMTs: Dependence on Device Geometry and Passivation IEEE Transactions on Electron Devices ·Isabella Rossetto,Matteo Meneghini,洪新发,Razia Sultana,G.A.M. Hurkx,J.A. Croon,Jan Šonský,Gaudenzio Meneghesso,Enrico Zanoni	2016	18
4	Impact of Donor Traps on the 2DEG and Electrical Behavior of AlGaN/GaN MISFETs IEEE Electron Device Letters ·Giorgia Longobardi,Florin Udrea,S. J. Sque,G.A.M. Hurkx,J.A. Croon,Ettore Napoli,Jan Šonský	2014	44
5	The effect of the surface fixed charge and donor traps on the C(V) and transfer characteristics of a GaN MISFET — Experiment and TCAD simulations Giorgia Longobardi,Florin Udrea,S. J. Sque,J.A. Croon,Насибуллин Марат Хабирович,Jan Šonský	2014	7
6	The dynamics of surface donor traps in AlGaN/GaN MISFETs using transient measurements and TCAD modelling Giorgia Longobardi,Florin Udrea,S. J. Sque,J.A. Croon,Насибуллин Марат Хабирович,Jan Šonský	2014	11
7	OFF-State Degradation of AlGaN/GaN Power HEMTs: Experimental Demonstration of Time-Dependent Drain-Source Breakdown IEEE Transactions on Electron Devices ·Matteo Meneghini,Gabriela Nandi,Gianluca Betti Miller,G.A.M. Hurkx,Christian Prommesberger,Jan Šonský,J.A. Croon,Gaudenzio Meneghesso,Enrico Zanoni	2014	38
8	Modelling 2DEG charges in AlGaN/GaN heterostructures Giorgia Longobardi,Florin Udrea,S. J. Sque,J.A. Croon,Насибуллин Марат Хабирович,Ettore Napoli,Jan Šonský	2012	6
9	Importance sampling for high speed statistical Monte- Carlo simulations TU/e Research Portal (Eindhoven University of Technology) ·E. Jan W. ter Maten,Аноприева Ирина Леонидовна,J.A. Croon,Alexei Efros,A. Di Bucchianico,Olaf Wittich	2009	2
10	A yield centric statistical design method for optimization of the SRAM active column TU/e Research Portal ·Аноприева Ирина Леонидовна,J.A. Croon,E. Jan W. ter Maten,A. Di Bucchianico	2009	4
11	The New CMC Standard Compact MOS Model PSP: Advantages for RF Applications IEEE Journal of Solid-State Circuits ·A.J. Scholten,G.D.J. Smit,Héctor D. Inurreta Aguirre,L.F. Tiemeijer,J.A. Croon,D.B.M. Klaassen,R. van Langevelde,Xin Li,Weimin Wu,G. Gildenblat	2009	20
12	RF circuit block modeling via Kriging surrogates Ghent University Academic Bibliography (Ghent University) ·Dirk Gorissen,Luciano De Tommasi,Caseres,J.A. Croon,Tom Dhaene	2008	13
13	A general weak nonlinearity model for LNAs University of Twente Research Information ·Wei Cheng,Anne-Johan Annema,J.A. Croon,D.B.M. Klaassen,Bram Nauta	2008	10
14	Matching Properties of Deep Sub-Micron MOS Transistors Digital Access to Libraries (Université catholique de Louvain (UCL), l'Université de Namur (UNamur) and the Université Saint-Louis (USL-B)) ·J.A. Croon,Willy Sansen,H.E. Maes	2005	48
15	A yield-aware modeling methodology for nano-scaled SRAM designs E. Grossar,J.A. Croon,Michele Stucchi,Karen Maex,Wim Dehaene	2005	4
16	Physical modeling and prediction of the matching properties of MOSFETs J.A. Croon,Stefaan Decoutere,Willy Sansen,H.E. Maes	2004	24
17	A comparison of extraction techniques for threshold voltage mismatch J.A. Croon,Hans Tuinhout,Santamaría Rodríguez,Wai Ki Yiu,Dedeh Kurniawati,Stefaan Decoutere,H.E. Maes,Willy Sansen	2003	30
18	A simple characterization method for MOS transistor matching in deep submicron technologies J.A. Croon,M. Rosmeulen,Stefaan Decoutere,Willy Sansen,H.E. Maes	2002	6
19	An easy-to-use mismatch model for the MOS transistor IEEE Journal of Solid-State Circuits ·J.A. Croon,M. Rosmeulen,Stefaan Decoutere,Willy Sansen,H.E. Maes	2002	115
20	A General Model for MOS Transistor Matching European Solid-State Device Research Conference ·J.A. Croon,M. Rosmeulen,Stefaan Van Huylenbroeck,Stefaan Decoutere	1999	1

About J.A. Croon

J.A. Croon is a scholar working on Condensed Matter Physics, Hardware and Architecture, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Computational Theory and Mathematics, having authored 44 papers that have together received 915 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (21 papers), Semiconductor materials and devices (19 papers), GaN-based semiconductor devices and materials (16 papers), Radio Frequency Integrated Circuit Design (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), VLSI and Analog Circuit Testing (7 papers), Ga2O3 and related materials (6 papers) and Low-power high-performance VLSI design (6 papers). The work is most often cited by research in Condensed Matter Physics (373 citations), Electrical and Electronic Engineering (818 citations), Hardware and Architecture (81 citations), Electronic, Optical and Magnetic Materials (143 citations) and Atomic and Molecular Physics, and Optics (92 citations). J.A. Croon has collaborated with scholars based in Netherlands, Belgium and United Kingdom. Frequent co-authors include Willy Sansen, Jan Šonský, Stefaan Decoutere, H.E. Maes, G.A.M. Hurkx, H.E. Maes, M. Rosmeulen, Michael J. Uren, Martin Kuball and Marco Silvestri. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, IEEE Journal of Solid-State Circuits, IEEE Transactions on Circuits and Systems I Regular Papers and IET Power Electronics.

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