Tino Heijmen
- Electrical and Electronic Engineering
- Hardware and Architecture top 5%
- Safety, Risk, Reliability and Quality
- Nuclear and High Energy Physics
- Computer Networks and Communications
- Topics
- Radiation Effects in Electronics (10 papers)VLSI and Analog Circuit Testing (7 papers)Semiconductor materials and devices (5 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringSafety, Risk, Reliability and Quality
- Partner nations
- NetherlandsFranceFinland
In The Last Decade
Tino Heijmen
10 papers receiving 295 citations
Peers
Comparison fields: 5 of 14
- Electrical and Electronic Engineering 305
- Hardware and Architecture 163
- Safety, Risk, Reliability and Quality 13
- Nuclear and High Energy Physics 5
- Computer Networks and Communications 4
Countries citing papers authored by Tino Heijmen
This map shows the geographic impact of Tino Heijmen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tino Heijmen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tino Heijmen more than expected).
Fields of papers citing papers by Tino Heijmen
This network shows the impact of papers produced by Tino Heijmen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tino Heijmen. The network helps show where Tino Heijmen may publish in the future.
Co-authorship network of co-authors of Tino Heijmen
This figure shows the co-authorship network connecting the top 25 collaborators of Tino Heijmen. A scholar is included among the top collaborators of Tino Heijmen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tino Heijmen. Tino Heijmen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 18 | |
| 3 | 9 | |
| 4 | 51 | |
| 5 | 19 | |
| 6 | 21 | |
| 7 | 110 | |
| 8 | 21 | |
| 9 | 36 | |
| 10 | 14 |
About Tino Heijmen
Tino Heijmen is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Infectious Diseases, having authored 10 papers that have together received 306 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (10 papers), VLSI and Analog Circuit Testing (7 papers) and Semiconductor materials and devices (5 papers). The work is most often cited by research in Hardware and Architecture (163 citations), Electrical and Electronic Engineering (305 citations) and Safety, Risk, Reliability and Quality (13 citations). Tino Heijmen has collaborated with scholars based in Netherlands, France and Finland. Frequent co-authors include D. Giot, P. Roche, Gilles Gasiot, B. Kruseman, Philippe Roché and Maurice Meijer. Their work appears in journals such as Solid-State Electronics and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.