A. Virazel

2.6k total citations
229 papers, 1.7k citations indexed

About

A. Virazel is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, A. Virazel has authored 229 papers receiving a total of 1.7k indexed citations (citations by other indexed papers that have themselves been cited), including 221 papers in Electrical and Electronic Engineering, 167 papers in Hardware and Architecture and 8 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in A. Virazel's work include VLSI and Analog Circuit Testing (163 papers), Integrated Circuits and Semiconductor Failure Analysis (130 papers) and Semiconductor materials and devices (62 papers). A. Virazel is often cited by papers focused on VLSI and Analog Circuit Testing (163 papers), Integrated Circuits and Semiconductor Failure Analysis (130 papers) and Semiconductor materials and devices (62 papers). A. Virazel collaborates with scholars based in France, Italy and Germany. A. Virazel's co-authors include Patrick Girard, S. Pravossoudovitch, Alberto Bosio, Luigi Dilillo, C. Landrault, Simone Borri, Aida Todri‐Sanial, Marcello Traiola, Mario Barbareschi and F. Wrobel and has published in prestigious journals such as Proceedings of the IEEE, IEEE Transactions on Electron Devices and IEEE Transactions on Computers.

In The Last Decade

A. Virazel

215 papers receiving 1.7k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Virazel France 20 1.6k 1.2k 82 67 49 229 1.7k
Luigi Dilillo France 19 1.3k 0.8× 738 0.6× 142 1.7× 27 0.4× 63 1.3× 212 1.4k
Liyi Xiao China 18 1.1k 0.7× 467 0.4× 137 1.7× 14 0.2× 46 0.9× 114 1.1k
M. Nicolaidis France 21 2.3k 1.4× 1.6k 1.4× 343 4.2× 35 0.5× 111 2.3× 64 2.5k
S. Pravossoudovitch France 26 2.0k 1.2× 1.8k 1.6× 52 0.6× 184 2.7× 23 0.5× 165 2.1k
Anne Gattiker United States 20 1.5k 0.9× 1.0k 0.9× 84 1.0× 53 0.8× 34 0.7× 51 1.6k
Shuming Chen China 19 974 0.6× 576 0.5× 183 2.2× 9 0.1× 49 1.0× 164 1.2k
T. D. Loveless United States 24 1.5k 1.0× 743 0.6× 93 1.1× 31 0.5× 148 3.0× 86 1.7k
A.J. van de Goor Netherlands 29 2.9k 1.8× 2.8k 2.4× 202 2.5× 270 4.0× 46 0.9× 134 3.1k
M. Renovell France 27 2.0k 1.2× 1.8k 1.6× 71 0.9× 104 1.6× 76 1.6× 179 2.1k
Premkishore Shivakumar United States 10 1.4k 0.9× 1.3k 1.1× 723 8.8× 14 0.2× 69 1.4× 10 1.8k

Countries citing papers authored by A. Virazel

Since Specialization
Citations

This map shows the geographic impact of A. Virazel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Virazel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Virazel more than expected).

Fields of papers citing papers by A. Virazel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Virazel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Virazel. The network helps show where A. Virazel may publish in the future.

Co-authorship network of co-authors of A. Virazel

This figure shows the co-authorship network connecting the top 25 collaborators of A. Virazel. A scholar is included among the top collaborators of A. Virazel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Virazel. A. Virazel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Virazel, A., et al.. (2024). A Graph-Based Methodology for Speeding up Cell-Aware Model Generation. SPIRE - Sciences Po Institutional REpository. 1–6.
2.
Girard, Patrick, et al.. (2021). Improving TID Radiation Robustness of a CMOS OxRAM-Based Neuron Circuit by Using Enclosed Layout Transistors. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29(6). 1122–1131. 9 indexed citations
3.
Girard, Patrick, Yuanqing Cheng, A. Virazel, et al.. (2020). A Survey of Test and Reliability Solutions for Magnetic Random Access Memories. Proceedings of the IEEE. 109(2). 149–169. 33 indexed citations
4.
Dilillo, Luigi, et al.. (2020). New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAMs. Journal of Integrated Circuits and Systems. 3(1). 7–12. 1 indexed citations
5.
Traiola, Marcello, A. Virazel, Patrick Girard, Mario Barbareschi, & Alberto Bosio. (2020). A Survey of Testing Techniques for Approximate Integrated Circuits. Proceedings of the IEEE. 108(12). 2178–2194. 15 indexed citations
6.
Virazel, A., et al.. (2019). Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. HAL (Le Centre pour la Communication Scientifique Directe). 21–26. 4 indexed citations
7.
Traiola, Marcello, et al.. (2018). Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits. HAL (Le Centre pour la Communication Scientifique Directe). 1–6. 7 indexed citations
8.
Bosio, Alberto, Patrick Girard, & A. Virazel. (2016). Test of low power circuits: Issues and industrial practices. 524–527. 4 indexed citations
9.
Virazel, A., et al.. (2016). A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing Cores. Journal of Electronic Testing. 32(2). 147–161. 8 indexed citations
10.
Azevedo, João, A. Virazel, Alberto Bosio, et al.. (2012). Impact of resistive-open defects on the heat current of TAS-MRAM architectures. Design, Automation, and Test in Europe. 532–537. 3 indexed citations
11.
Bosio, Alberto, et al.. (2012). Why and How Controlling Power Consumption during Test: A Survey. HAL (Le Centre pour la Communication Scientifique Directe). 221–226. 9 indexed citations
12.
Bosio, Alberto, et al.. (2010). A Comprehensive System-on-Chip Logic Diagnosis. 237–242. 4 indexed citations
13.
Virazel, A., et al.. (2009). NAND flash testing: A preliminary study on actual defects. HAL (Le Centre pour la Communication Scientifique Directe). 1–1. 5 indexed citations
14.
Girard, Patrick, et al.. (2006). Power-Aware Test Data Compression for Embedded IP Core. HAL (Le Centre pour la Communication Scientifique Directe). 8 indexed citations
15.
Girard, Patrick, et al.. (2006). Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. HAL (Le Centre pour la Communication Scientifique Directe). 403–408. 12 indexed citations
16.
Bonhomme, Yannick, Patrick Girard, L. Guiller, et al.. (2006). A Gated Clock Scheme for Low Power Testing of Logic Cores. Journal of Electronic Testing. 22(1). 89–99. 4 indexed citations
17.
Dilillo, Luigi, et al.. (2005). Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. HAL (Le Centre pour la Communication Scientifique Directe). 183–188. 29 indexed citations
18.
Bonhomme, Yannick, Patrick Girard, L. Guiller, et al.. (2004). Design of routing-constrained low power scan chains. Design, Automation, and Test in Europe. 1. 10062. 38 indexed citations
19.
Girard, Patrick, et al.. (2002). A BIST structure to test delay faults in a scan environment. 435–439. 3 indexed citations
20.
Virazel, A.. (2001). Delay fault testing : Effectiveness of random SIC and random MIC test sequence. Journal of Electronic Testing. 17(34). 233–241. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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