Alberto Bosio

3.4k citations

252 papers · 2.0k indexed · h-index 22

Impact in

Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
Software top 5%

Papers in

Hardware and Architecture 144
- VLSI and Analog Circuit Testing 129
Software 18

Co-authors: Patrick Girard A. Virazel Luigi Dilillo Giorgio Di Natale S. Pravossoudovitch Marcello Traiola Stefano Di Carlo Laura E. Depero
Journals: IEEE Transactions on Nuclear Science (5 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (4 papers)Microelectronics Reliability (4 papers)IEEE Transactions on Computers (3 papers)Electronics (2 papers)
Partner nations: France Italy United States

In The Last Decade

Alberto Bosio

235 papers receiving 1.9k citations

Peers

Countries citing papers authored by Alberto Bosio

Since Specialization

Citations

This map shows the geographic impact of Alberto Bosio's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alberto Bosio with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alberto Bosio more than expected).

Fields of papers citing papers by Alberto Bosio

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Alberto Bosio. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alberto Bosio. The network helps show where Alberto Bosio may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Alberto Bosio, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Alberto Bosio Line = papers co-authored together Alberto Bosio links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Benchmark Suite for Resilience Assessment of Deep Learning Models IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Cristiana Bolchini, Alberto Bosio, Luca Cassano, Antonio Miele, M. Poovitha, Lê Hiên Nguyễn, Annachiara Ruospo, Ernesto Sánchez, M. Sonza Reorda, Wildan Fatah	2025	0
2	OpRA: Optimizing Resiliency Assessment for Deep Neural Networks IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Dr. Channa Reddy, Salvatore Barone, M. Poovitha, Alberto Bosio, Riccardo Cantoro	2025	0
3	Heterogeneous Approximation of DNN HW Accelerators based on Channels Vulnerability Zenodo (CERN European Organization for Nuclear Research) ·Isabella Loiodice, Salvatore Eugenio Pappalardo, V. S. Boroviko, Cassandra August, Nicolle Nascimento, Alberto Bosio, Jaan Raik, Maksim Jenihhin	2024	1
4	Lightspeed Binary Neural Networks using Optical Phase-Change Materials SPIRE - Sciences Po Institutional REpository ·Taha Shahroodi, Md. Tawhidul Khan Islam, Benjamin Brice Blengino, Stephan Wong, Alberto Bosio, Ian O’Connor, Said Hamdioui	2023	2
5	A Survey on Deep Learning Resilience Assessment Methodologies Computer ·Annachiara Ruospo, Ernesto Sánchez, Dennis Higashiguchi, Luigi Dilillo, Marcello Traiola, Alberto Bosio	2023	23
6	Introducing SPECS: scalable photonic event-driven circuit simulator IET conference proceedings. ·رضوان الرواك, Rodrigo Perito Cardoso, Weselucha-Birczynska Aleksandra, Pedro Jiménez‐Guerrero, Emeline I. J. Lelong, Alberto Bosio, Sébastien Le Beux, Fabio Pavanello, Ian O’Connor	2023	2
7	Power Reduction in Photonic Meshes by MZI Optimization SPIRE - Sciences Po Institutional REpository ·Weselucha-Birczynska Aleksandra, Md. Tawhidul Khan Islam, Paul Jiménez, Bandar bin Mohammed Al-Mutairi, Ian O’Connor, Alberto Bosio, Fabio Pavanello	2023	3
8	3-D Logic Circuit Design-Oriented Electrothermal Modeling of Vertical Junctionless Nanowire FETs IEEE Journal on Exploratory Solid-State Computational Devices and Circuits ·Elsa A. El Asmar, Unmesh S. Pawar, Cédric Marchand, Damien Deleruyelle, Nicolle Nascimento, Alberto Bosio, Ian O’Connor, C. Mukherjee, 梅野高裕, Panagiotis Koutsouris, Marina Deng, Cristell Maneux, سعید محمودان, Xiaodong Chu, Κωνσταντίνος Μουστάκας, Guilhem Larrieu	2023	3
9	Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks IEEE Transactions on Emerging Topics in Computing ·Dennis Higashiguchi, Annachiara Ruospo, Sharif Ullah Jan, Carlo Cazzaniga, Maria Kastriotou, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo	2021	21
10	Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks HAL (Le Centre pour la Communication Scientifique Directe) ·Annachiara Ruospo, Dennis Higashiguchi, Alberto Bosio, Marcello Traiola, Luigi Dilillo, Ernesto Sánchez	2021	5
11	Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip HAL (Le Centre pour la Communication Scientifique Directe) ·A N Legotkin, A. Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, James G. Clough, Jacob kurien	2019	4
12	SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems IEEE Transactions on Computers ·Nadine Tung, Alessandro Savino, Athanasios Chatzidimitriou, Manolis Kaliorakis, Choudhury Meshkat Ahmed, Maddula Sri Viswanadh, Ilieva B., Giorgio Di Natale, Alberto Bosio, Ramón Canal, Antonio González, Dimitris Gizopoulos, Riccardo Mariani, Stefano Di Carlo	2018	22
13	Cross-layer system reliability assessment framework for hardware faults HAL (Le Centre pour la Communication Scientifique Directe) ·Nadine Tung, Alessandro Savino, Gianfranco Politano, Stefano Di Carlo, Athanasios Chatzidimitriou, 李田, Manolis Kaliorakis, Dimitris Gizopoulos, Maddula Sri Viswanadh, Ramón Canal, Antonio González, Choudhury Meshkat Ahmed, Alberto Bosio, Giorgio Di Natale	2016	19
14	Utilization of Third-Stage Waste from a Rice Production for Removal of H₂S, NO₂ and SO₂ from Air Adsorption Science & Technology ·Teresa J. Bandosz, В. С. Козін, Alberto Bosio, Alessandra Gianoncelli, Laura E. Depero	2013	1
15	Impact of resistive-open defects on the heat current of TAS-MRAM architectures Design, Automation, and Test in Europe ·João Azevedo, A. Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri‐Sanial, Guillaume Prenat, F. Ortun, K. Mackay	2012	3
16	NAND flash testing: A preliminary study on actual defects HAL (Le Centre pour la Communication Scientifique Directe) ·G Mageshwari, A. Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, S. Pravossoudovitch, Adel Al-Weshall	2009	5
17	March Test BDN: A new March Test for dynamic faults HAL (Le Centre pour la Communication Scientifique Directe) ·Alberto Bosio, Giorgio Di Natale	2008	11
18	A 22n March Test for Realistic Static Linked Faults in SRAMs Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, P. Prinetto	2006	2
19	ATPG for Dynamic Burn-In Test in Full-Scan Circuits Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, P. Prinetto	2006	12
20	Memory Fault Simulator for Static-Linked Faults Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, P. Prinetto	2006	3

About Alberto Bosio

Alberto Bosio is a scholar working on Hardware and Architecture, Software, Electrical and Electronic Engineering, Geochemistry and Petrology and Safety, Risk, Reliability and Quality, having authored 252 papers that have together received 2.0k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (129 papers), Integrated Circuits and Semiconductor Failure Analysis (89 papers), Radiation Effects in Electronics (86 papers), Low-power high-performance VLSI design (74 papers), Semiconductor materials and devices (39 papers), Advancements in Semiconductor Devices and Circuit Design (32 papers), Advanced Memory and Neural Computing (25 papers) and VLSI and FPGA Design Techniques (19 papers). The work is most often cited by research in Hardware and Architecture (884 citations), Software (128 citations), Electrical and Electronic Engineering (1.5k citations), Geochemistry and Petrology (121 citations) and Building and Construction (194 citations). Alberto Bosio has collaborated with scholars based in France, Italy and United States. Frequent co-authors include Patrick Girard, A. Virazel, Luigi Dilillo, Giorgio Di Natale, S. Pravossoudovitch, Marcello Traiola, Stefano Di Carlo, Laura E. Depero, Elza Bontempi and Laura Borgese. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Microelectronics Reliability, IEEE Transactions on Computers and Electronics.

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