D. Giot
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing 6
- Physical Unclonable Functions (PUFs) and Hardware Security 1
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- Radiation Effects in Electronics 10
- Integrated Circuits and Semiconductor Failure Analysis 7
- Semiconductor materials and devices 4
- Advancements in Semiconductor Devices and Circuit Design 2
D. Giot
10 papers receiving 473 citations
Peers
Comparison fields: 5 of 17
- Hardware and Architecture 269
- Electrical and Electronic Engineering 497
- Radiation 13
- Safety, Risk, Reliability and Quality 13
- Nuclear and High Energy Physics 12
Countries citing papers authored by D. Giot
This map shows the geographic impact of D. Giot's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Giot with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Giot more than expected).
Fields of papers citing papers by D. Giot
This network shows the impact of papers produced by D. Giot. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Giot. The network helps show where D. Giot may publish in the future.
Co-authorship network
The 11 scholars most cited alongside D. Giot, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 14 | |
| 2 | 2008 | 55 | |
| 3 | 2007 | 117 | |
| 4 | 2007 | 22 | |
| 5 | 2007 | 28 | |
| 6 | 2007 | 3 | |
| 7 | 2007 | 50 | |
| 8 | 2007 | 51 | |
| 9 | 2006 | 51 | |
| 10 | 2006 | 110 |
About D. Giot
D. Giot is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Infectious Diseases, Organic Chemistry and Surgery, having authored 10 papers that have together received 501 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), VLSI and Analog Circuit Testing (6 papers), Semiconductor materials and devices (4 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (1 paper). The work is most often cited by research in Hardware and Architecture (269 citations), Electrical and Electronic Engineering (497 citations), Radiation (13 citations), Safety, Risk, Reliability and Quality (13 citations) and Nuclear and High Energy Physics (12 citations). D. Giot has collaborated with scholars based in France, Netherlands and India. Frequent co-authors include Gilles Gasiot, P. Roche, Tino Heijmen, R. Harboe-Sørensen, Philippe Roché, Jean‐Luc Autran, J. Boch, Frédéric Saigné, J.L. Autran and B. Sagnes. Their work appears in journals such as IEEE Transactions on Nuclear Science and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.