Nicola Modolo

414 total citations
24 papers, 320 citations indexed

About

Nicola Modolo is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Nicola Modolo has authored 24 papers receiving a total of 320 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Condensed Matter Physics, 22 papers in Electrical and Electronic Engineering and 8 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Nicola Modolo's work include GaN-based semiconductor devices and materials (23 papers), Semiconductor materials and devices (15 papers) and Silicon Carbide Semiconductor Technologies (11 papers). Nicola Modolo is often cited by papers focused on GaN-based semiconductor devices and materials (23 papers), Semiconductor materials and devices (15 papers) and Silicon Carbide Semiconductor Technologies (11 papers). Nicola Modolo collaborates with scholars based in Italy, Austria and Taiwan. Nicola Modolo's co-authors include Matteo Meneghini, Enrico Zanoni, Carlo De Santi, Gaudenzio Meneghesso, Luca Sayadi, G. Prechtl, Sébastien Sicre, Tian‐Li Wu, Bernd Deutschmann and Oliver D. Häberlen and has published in prestigious journals such as SHILAP Revista de lepidopterología, Scientific Reports and IEEE Transactions on Power Electronics.

In The Last Decade

Nicola Modolo

22 papers receiving 308 citations

Peers

Countries citing papers authored by Nicola Modolo

Since Specialization

Citations

This map shows the geographic impact of Nicola Modolo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nicola Modolo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nicola Modolo more than expected).

Fields of papers citing papers by Nicola Modolo

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nicola Modolo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nicola Modolo. The network helps show where Nicola Modolo may publish in the future.

Co-authorship network of co-authors of Nicola Modolo

This figure shows the co-authorship network connecting the top 25 collaborators of Nicola Modolo. A scholar is included among the top collaborators of Nicola Modolo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nicola Modolo. Nicola Modolo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Ultra-fast recovery transients in GaN MIS-HEMT submitted to OFF-state stress 2025 ·Microelectronics Reliability ·Anna Franca Cavaliere, Nicola Modolo, Carlo De Santi, (unknown), Enrico Zanoni, Matteo Meneghini	0
2	Revised CV characterization technique for interface state evaluation in SiN/n-GaN MIS capacitors: Effects of extraction time, temperature and UV illumination 2025 ·Microelectronics Reliability ·Aldebaran M. Hofer, (unknown), Nicola Modolo, D. Pogány, Clemens Ostermaier	0
3	Positive V_TH Shift in Schottky p-GaN Gate Power HEMTs: Dependence on Temperature, Bias and Gate Leakage 2024 ·IEEE Transactions on Power Electronics ·Nicola Modolo, Carlo De Santi, Sébastien Sicre, (unknown), Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	1
4	On the CET-Map Ill-Posed Inversion Problem: Theory and Application to GaN HEMTs 2023 ·IEEE Transactions on Electron Devices ·Nicola Modolo, Carlo De Santi, (unknown), (unknown), Luca Sayadi, Sébastien Sicre, G. Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	2
5	Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices 2022 ·IEEE Transactions on Electron Devices ·Nicola Modolo, Carlo De Santi, (unknown), (unknown), Matteo Borga, Niels Posthuma, Benoit Bakeroot, Shuzhen You, Stefaan Decoutere, Andrea Bevilacqua, A. Neviani, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	4
6	Trap-state mapping to model GaN transistors dynamic performance 2022 ·Scientific Reports ·Nicola Modolo, Carlo De Santi, (unknown), Luca Sayadi, G. Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	19
7	Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs 2022 ·Microelectronics Reliability ·Nicola Modolo, (unknown), (unknown), (unknown), (unknown), Matteo Buffolo, Carlo De Santi, Matteo Borga, Niels Posthuma, Benoit Bakeroot, Stefaan Decoutere, (unknown), A. Neviani, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	12
8	Failure Physics and Reliability of GaN‐Based HEMTs for Microwave and Millimeter‐Wave Applications: A Review of Consolidated Data and Recent Results 2022 ·physica status solidi (a) ·Enrico Zanoni, Fabiana Rampazzo, Carlo De Santi, (unknown), Chandan Sharma, Nicola Modolo, G. Verzellesi, Alessandro Chini, Gaudenzio Meneghesso, Matteo Meneghini	16
9	A Physics-Based Approach to Model Hot-Electron Trapping Kinetics in p-GaN HEMTs 2021 ·IEEE Electron Device Letters ·Nicola Modolo, Carlo De Santi, (unknown), Luca Sayadi, Sébastien Sicre, G. Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	37
10	Cumulative Hot-Electron Trapping in GaN-Based Power HEMTs Observed by an Ultrafast (10 V/Ns) On-Wafer Methodology 2021 ·IEEE Journal of Emerging and Selected Topics in Power Electronics ·Nicola Modolo, Carlo De Santi, (unknown), Luca Sayadi, Sébastien Sicre, G. Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	27
11	Drain Field Plate Impact on the Hard-Switching Performance of AlGaN/GaN HEMTs 2021 ·IEEE Transactions on Electron Devices ·(unknown), Nicola Modolo, Luca Sayadi, (unknown), Clemens Ostermaier, Matteo Meneghini, Enrico Zanoni, G. Prechtl, Sébastien Sicre, Bernd Deutschmann, Oliver D. Häberlen	16
12	Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN HEMTs during step stress 2021 ·Microelectronics Reliability ·(unknown), Fabiana Rampazzo, Matteo Meneghini, Nicola Modolo, Carlo De Santi, H. Blanck, (unknown), (unknown), (unknown), Olof Kordina, Jr‐Tai Chen, (unknown), C. Lacam, S. Piotrowicz, Gaudenzio Meneghesso, Enrico Zanoni	4
13	A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level 2021 ·Research Padua Archive (University of Padua) ·Nicola Modolo, (unknown), Carlo De Santi, Luca Sayadi, Sébastien Sicre, G. Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	3
14	Charge Trapping in GaN Power Transistors: Challenges and Perspectives 2021 ·Research Padua Archive (University of Padua) ·Matteo Meneghini, Nicola Modolo, (unknown), Carlo De Santi, (unknown), Luca Sayadi, (unknown), Sébastien Sicre, G. Prechtl, Gaudenzio Meneghesso, Enrico Zanoni	4
15	Hot electron effects in AlGaN/GaN HEMTs during hard-switching events 2021 ·Microelectronics Reliability ·(unknown), Nicola Modolo, Matteo Meneghini, Enrico Zanoni, Luca Sayadi, Sébastien Sicre, Bernd Deutschmann, Oliver D. Häberlen	6
16	Understanding the effects of off-state and hard-switching stress in gallium nitride-based power transistors 2020 ·Semiconductor Science and Technology ·Nicola Modolo, Carlo De Santi, (unknown), Luca Sayadi, Sébastien Sicre, G. Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	18
17	Hot-Electron Effects in AlGaN/GaN HEMTs Under Semi-ON DC Stress 2020 ·IEEE Transactions on Electron Devices ·(unknown), Bernd Deutschmann, Nicola Modolo, (unknown), Matteo Meneghini, Enrico Zanoni, Luca Sayadi, G. Prechtl, Sébastien Sicre, Oliver D. Häberlen	51
18	Understanding $\gamma$ -Ray Induced Instability in AlGaN/GaN HEMTs Using a Physics-Based Compact Model 2020 ·IEEE Transactions on Electron Devices ·Chandan Sharma, Nicola Modolo, Tian‐Li Wu, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, (unknown), Seema Vinayak, Rajendra Singh	16
19	A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects 2020 ·Microelectronics Reliability ·Nicola Modolo, Matteo Meneghini, Alessandro Barbato, (unknown), Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni, Sébastien Sicre, G. Prechtl, G. Curatola	10
20	A Comprehensive Kinetical Modeling of Polymorphic Phase Distribution of Ferroelectric-Dielectrics and Interfacial Energy Effects on Negative Capacitance FETs 2019 ·(unknown), Ching-Lin Fan, (unknown), Nicola Modolo, (unknown), Tian‐Li Wu, Kuo-Hsing Kao, (unknown), (unknown), (unknown), Pin Su, Wen-Fa Wu, Guo‐Wei Huang, Jia‐Min Shieh, W.-K. Yeh, (unknown)	13

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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