W.-K. Yeh

442 total citations
21 papers, 192 citations indexed

About

W.-K. Yeh is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, W.-K. Yeh has authored 21 papers receiving a total of 192 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 3 papers in Biomedical Engineering and 3 papers in Materials Chemistry. Recurrent topics in W.-K. Yeh's work include Semiconductor materials and devices (17 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers) and Radio Frequency Integrated Circuit Design (7 papers). W.-K. Yeh is often cited by papers focused on Semiconductor materials and devices (17 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers) and Radio Frequency Integrated Circuit Design (7 papers). W.-K. Yeh collaborates with scholars based in Taiwan, United States and Japan. W.-K. Yeh's co-authors include Sheng‐Lyang Jang, Wen-Fa Wu, Jia‐Min Shieh, Tzu‐Chin Wu, Kuo-Hsing Kao, Yi‐Pin Chou, Ming‐Chang Hsieh, Guo‐Wei Huang, J.S. Yuan and Chi‐Hau Chen and has published in prestigious journals such as IEEE Transactions on Electron Devices, World Journal of Surgery and IEEE Microwave and Wireless Components Letters.

In The Last Decade

W.-K. Yeh

21 papers receiving 183 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
W.-K. Yeh Taiwan 9 171 26 26 21 17 21 192
Joseph A. Marino United States 5 66 0.4× 40 1.5× 42 1.6× 40 1.9× 2 0.1× 7 118
M. Bidaud France 6 89 0.5× 6 0.2× 10 0.4× 5 0.2× 5 0.3× 19 96
K. R. A. Sasaki Brazil 9 244 1.4× 77 3.0× 43 1.7× 2 0.1× 4 0.2× 51 280
K. Fischer United States 8 172 1.0× 43 1.7× 10 0.4× 1 0.0× 14 0.8× 16 203
Lucio Pereira Neves Brazil 9 25 0.1× 48 1.8× 72 2.8× 5 0.2× 62 3.6× 52 236
S. Furkay United States 10 255 1.5× 24 0.9× 20 0.8× 5 0.2× 21 269
Indra Müller Germany 4 574 3.4× 43 1.7× 464 17.8× 29 1.4× 4 0.2× 7 616
Xiaowei Zhao China 10 238 1.4× 66 2.5× 22 0.8× 17 0.8× 1 0.1× 27 316
Kristján Jónsson Sweden 5 7 0.0× 8 0.3× 25 1.0× 15 0.7× 7 0.4× 11 91
F. Fienga Italy 9 115 0.7× 21 0.8× 13 0.5× 38 2.2× 24 187

Countries citing papers authored by W.-K. Yeh

Since Specialization
Citations

This map shows the geographic impact of W.-K. Yeh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W.-K. Yeh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W.-K. Yeh more than expected).

Fields of papers citing papers by W.-K. Yeh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W.-K. Yeh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W.-K. Yeh. The network helps show where W.-K. Yeh may publish in the future.

Co-authorship network of co-authors of W.-K. Yeh

This figure shows the co-authorship network connecting the top 25 collaborators of W.-K. Yeh. A scholar is included among the top collaborators of W.-K. Yeh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W.-K. Yeh. W.-K. Yeh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Su, Chang, Hwan‐You Chang, Guang-Li Luo, et al.. (2021). Sub-60 mV/dec Germanium Nanowire Field-Effect Transistors with 2-nm-thick Ferroelectric Hf0.5Zr0.5O2. 1–2. 1 indexed citations
2.
Yeh, W.-K., et al.. (2021). CMOS-MEMS multi-sensor single chip with high heat dissipation and low-temperature hermetic sealing. 2021 IEEE International Electron Devices Meeting (IEDM). 23.5.1–23.5.4. 1 indexed citations
3.
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Luo, Guang-Li, Fu-Ju Hou, C. T. Wu, et al.. (2018). Ge FinFET CMOS Inverters With Improved Channel Surface Roughness by Using In-Situ ALD Digital O3 Treatment. IEEE Journal of the Electron Devices Society. 6. 1227–1232. 16 indexed citations
5.
Yeh, W.-K., et al.. (2018). Early Management of Retained Hemothorax in Blunt Head and Chest Trauma. World Journal of Surgery. 42(7). 2061–2066. 20 indexed citations
6.
7.
Yuan, J.S., et al.. (2016). Reliability Performance of a 70-GHz Mixer in 65-nm Technology. IEEE Transactions on Device and Materials Reliability. 16(1). 101–104. 3 indexed citations
8.
Hou, Fu-Ju, Yiming Li, Seiji Samukawa, et al.. (2016). High performance silicon N-channel gate-all-around junctionless field effect transistors by strain technology. 174–175. 2 indexed citations
9.
Li, Kai‐Shin, Min‐Cheng Chen, Jian-Ming Lü, et al.. (2015). Study of sub-5 nm RRAM, tunneling selector and selector less device. 385–388. 11 indexed citations
10.
Yuan, J.S., et al.. (2014). Hot Electron Effect on FinFET RF Circuit Reliability. 2(1). 1 indexed citations
11.
Yuan, J.S., et al.. (2013). Reliability analysis of pHEMT power amplifier with an on-chip linearizer. Microelectronics Reliability. 53(6). 878–884. 4 indexed citations
12.
Yuan, J.S., et al.. (2012). RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments. Microelectronics Reliability. 52(11). 2655–2659. 4 indexed citations
13.
Yuan, J.S., Jun Ma, W.-K. Yeh, & Chia Wei Hsu. (2010). Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances. Microelectronics Reliability. 50(6). 807–812. 3 indexed citations
14.
Yuan, J.S., Jianguo Ma, Chia‐Wei Hsu, & W.-K. Yeh. (2009). Hot electron stress effect on dual-band power amplifier and integrated mixer-lna design for reliability. 178–181. 1 indexed citations
15.
Jang, Sheng‐Lyang, et al.. (2008). A Divide-by-3 Injection Locked Frequency Divider With Single-Ended Input. IEEE Microwave and Wireless Components Letters. 18(2). 142–144. 38 indexed citations
16.
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Yeh, W.-K., et al.. (2005). Effect of Extrinsic Impedance and Parasitic Capacitance on Figure of Merit of RF MOSFET. IEEE Transactions on Electron Devices. 52(9). 2054–2060. 10 indexed citations
19.
Yeh, W.-K., et al.. (2004). The Effect of Thermal Treatment on Device Characteristic and Reliability for Sub-100-nm CMOSFETs. IEEE Transactions on Device and Materials Reliability. 4(2). 256–262. 1 indexed citations
20.
Hsieh, Ming‐Chang, et al.. (2004). Design and Fabrication of Deep Submicron CMOS Technology Compatible Suspended High-Q Spiral Inductors. IEEE Transactions on Electron Devices. 51(3). 324–331. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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