Mi-Chang Chang

444 total citations
26 papers, 335 citations indexed

About

Mi-Chang Chang is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Computer Networks and Communications. According to data from OpenAlex, Mi-Chang Chang has authored 26 papers receiving a total of 335 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 4 papers in Electronic, Optical and Magnetic Materials and 2 papers in Computer Networks and Communications. Recurrent topics in Mi-Chang Chang's work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). Mi-Chang Chang is often cited by papers focused on Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). Mi-Chang Chang collaborates with scholars based in United States, Taiwan and Canada. Mi-Chang Chang's co-authors include S. Ramaswamy, C. Duvvury, A. Amerasekera, Shin-Puu Jeng, Robert Havemann, C.H. Diaz, Ken Harvey, Hal Edwards, W. Liu and Vladimir A. Ukraintsev and has published in prestigious journals such as Journal of Applied Physics, IEEE Journal of Solid-State Circuits and IEEE Transactions on Electron Devices.

In The Last Decade

Mi-Chang Chang

23 papers receiving 314 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Mi-Chang Chang United States	8	301	45	38	34	31	26	335
Jeffrey B. Johnson United States	12	415 1.4×	41 0.9×	41 1.1×	21 0.6×	18 0.6×	49	431
Jenn-Gang Chern United States	7	420 1.4×	45 1.0×	66 1.7×	30 0.9×	14 0.5×	13	436
N. Shigyo Japan	12	494 1.6×	76 1.7×	52 1.4×	34 1.0×	15 0.5×	54	523
L.R. Hite United States	10	488 1.6×	35 0.8×	36 0.9×	86 2.5×	16 0.5×	20	507
M. Togo Japan	14	599 2.0×	62 1.4×	69 1.8×	66 1.9×	24 0.8×	68	619
H. Katto Japan	10	255 0.8×	36 0.8×	19 0.5×	19 0.6×	16 0.5×	34	262
Gaspard Hiblot Belgium	10	259 0.9×	42 0.9×	34 0.9×	25 0.7×	12 0.4×	51	291
Yungseon Eo South Korea	12	330 1.1×	36 0.8×	28 0.7×	16 0.5×	11 0.4×	46	349
C. Caillat Belgium	11	359 1.2×	47 1.0×	18 0.5×	68 2.0×	20 0.6×	33	368
Aloke K. Dutta India	11	296 1.0×	28 0.6×	64 1.7×	23 0.7×	19 0.6×	37	321

Countries citing papers authored by Mi-Chang Chang

Since Specialization

Citations

This map shows the geographic impact of Mi-Chang Chang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mi-Chang Chang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mi-Chang Chang more than expected).

Fields of papers citing papers by Mi-Chang Chang

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mi-Chang Chang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mi-Chang Chang. The network helps show where Mi-Chang Chang may publish in the future.

Co-authorship network of co-authors of Mi-Chang Chang

This figure shows the co-authorship network connecting the top 25 collaborators of Mi-Chang Chang. A scholar is included among the top collaborators of Mi-Chang Chang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mi-Chang Chang. Mi-Chang Chang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Huang, Shao-Chang, et al.. (2018). Improving ESD protection of 5 V NMOSFET large array device in 0.4 μm BCD process. Microelectronics Reliability. 84. 48–54.

Chen, Hung-Wei & Mi-Chang Chang. (2017). Improving the ESD self-protection capability of 60 V HV p-channel LDMOS large array device in 0.25 μm BCD process. Microelectronics Reliability. 74. 110–117. 2 indexed citations

Chen, Hung-Wei, et al.. (2017). ESD protection and driving capability switch control circuits for large array NMOSFET driving devices. 1–2.

Chang, Mi-Chang, et al.. (2008). Transistor-and Circuit-Design Optimization for Low-Power CMOS. IEEE Transactions on Electron Devices. 55(1). 84–95. 25 indexed citations

Chang, Mi-Chang, et al.. (2006). Low-Leakage Diode String Design without Extra Circuits for ESD Applications. 35. 1–4. 3 indexed citations

Chang, Mi-Chang, et al.. (2005). An automatic layout generator for I/O cells. 295–300. 1 indexed citations

Diaz, C.H., Yuet‐Kin Leung, Ming-Hsien Tsai, et al.. (2004). Device properties in 90 nm and beyond and implications on circuit design. 2.6.1–2.6.4. 4 indexed citations

Chih, Y.D., et al.. (2004). Characterization of split gate flash memory endurance degradation mechanism. 115–117. 7 indexed citations

Fang, Yean-Kuen, et al.. (2003). High voltage tolerant ESD design for analog applications in deep submicron CMOS technologies. 89–92. 2 indexed citations

10.

Diaz, C.H., Mi-Chang Chang, T.C. Ong, & J.Y.-C. Sun. (2003). Application-dependent scaling tradeoffs and optimization in the SoC era. 475–478. 1 indexed citations

11.

Chang, Mi-Chang & I.N. Hajj. (2003). iPRIDE: a parallel integrated circuit simulator using direct method. 304–307. 6 indexed citations

12.

Fang, Yean-Kuen, et al.. (2003). Using diode-stacked NMOS as high voltage tolerant ESD protection device for analog applications in deep submicron CMOS technologies. Solid-State Electronics. 47(5). 865–871. 1 indexed citations

13.

Jeng, Shin-Puu, et al.. (2002). A planarized multilevel interconnect scheme with embedded low-dielectric-constant polymers for sub-quarter-micron applications. 73–74. 2 indexed citations

14.

Edwards, Hal, et al.. (2000). pn -junction delineation in Si devices using scanning capacitance spectroscopy. Journal of Applied Physics. 87(3). 1485–1495. 49 indexed citations

15.

Chang, Mi-Chang, et al.. (2000). OPC methodology and implementation to prototyping of small SRAM cells of 0.18-μm node logic gate levels. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4000. 90–90. 2 indexed citations

16.

Ukraintsev, Vladimir A., R. S. List, Mi-Chang Chang, et al.. (1998). Dopant characterization round-robin study performed on two-dimensional test structures fabricated at Texas Instruments. 741–745. 1 indexed citations

17.

Amerasekera, A., Mi-Chang Chang, C. Duvvury, & S. Ramaswamy. (1997). Modeling MOS snapback and parasitic bipolar action for circuit-level ESD and high-current simulations. IEEE Circuits and Devices Magazine. 13(2). 7–10. 20 indexed citations

18.

Jeng, Shin-Puu, Kelly Taylor, Mi-Chang Chang, et al.. (1995). Process Integration Of Low-Dielectric-Constant Materials. MRS Proceedings. 381. 10 indexed citations

19.

Jeng, Shin-Puu, Robert Havemann, & Mi-Chang Chang. (1994). Process Integration and Manufacturasility Issues for High Performance Multilevel Interconnect. MRS Proceedings. 337. 35 indexed citations

20.

Chang, Mi-Chang, et al.. (1993). An accurate grid local truncation error for device simulation. International Conference on Computer Aided Design. 275–282. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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