C. Duvvury
Impact in
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- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Electromagnetic Compatibility and Noise Suppression
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- Hardware and Architecture top 5%
- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in
-
- Electrostatic Discharge in Electronics 71
- Semiconductor materials and devices 56
- Integrated Circuits and Semiconductor Failure Analysis 51
- Advancements in Semiconductor Devices and Circuit Design 32
- Electromagnetic Compatibility and Noise Suppression 21
- Silicon Carbide Semiconductor Technologies 7
- Advanced Semiconductor Detectors and Materials 1
-
- Physical Unclonable Functions (PUFs) and Hardware Security 4
- Co-authors
- A. AmerasekeraC.H. DiazS. RamaswamyR.N. RountreeMi-Chang ChangV. ReddyR.W. DuttonGianluca Boselli
- Journals
- IEEE Transactions on Electron Devices (6 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IEEE Electron Device Letters (3 papers)Microelectronics Reliability (3 papers)IEEE Circuits and Devices Magazine (2 papers)
- Partner nations
- United StatesGermanyFrance
In The Last Decade
C. Duvvury
84 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 34
- Electrical and Electronic Engineering 1.7k
- Hardware and Architecture 82
- Atomic and Molecular Physics, and Optics 66
- Materials Chemistry 59
- Electronic, Optical and Magnetic Materials 23
Countries citing papers authored by C. Duvvury
This map shows the geographic impact of C. Duvvury's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Duvvury with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Duvvury more than expected).
Fields of papers citing papers by C. Duvvury
This network shows the impact of papers produced by C. Duvvury. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Duvvury. The network helps show where C. Duvvury may publish in the future.
Co-authorship network
The 25 scholars most cited alongside C. Duvvury, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Single pulse CDM testing and its relevance to IC reliability | 2008 | 3 |
| 2 | Statistical pin pair combinations — a new proposal for device level HBM tests | 2008 | 4 |
| 3 | HBM stress of no-connect IC pins and subsequent arc-over events that lead to human-metal-discharge-like events into unstressed neighbor pins | 2006 | 6 |
| 4 | High voltage ESD protection strategies for USB and PCI applications for 180nm/130nm/90nm CMOS technologies | 2006 | 3 |
| 5 | Analysis of ESD protection components in 65nm CMOS technology: Scaling perspective and impact on ESD design window | 2005 | 33 |
| 6 | 2004 | 3 | |
| 7 | 2002 | 4 | |
| 8 | 2002 | 66 | |
| 9 | 2002 | 70 | |
| 10 | 2002 | 1 | |
| 11 | 2002 | 2 | |
| 12 | Integration of TLP analysis for ESD troubleshooting | 2001 | 7 |
| 13 | Development of substrate-pumped nMOS protection for a 0.13∝m technology | 2001 | 1 |
| 14 | 5-V tolerant fail-safe ESD solutions for 0.18µm logic CMOS process | 2001 | 4 |
| 15 | 2001 | 9 | |
| 16 | Esd in Silicon Integrated Circuits [Book Reviews] | 1997 | 0 |
| 17 | 1997 | 30 | |
| 18 | 1988 | 58 | |
| 19 | 1987 | 35 | |
| 20 | 1984 | 3 |
About C. Duvvury
C. Duvvury is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Numerical Analysis, Atomic and Molecular Physics, and Optics and Computational Mechanics, having authored 87 papers that have together received 1.8k indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (71 papers), Semiconductor materials and devices (56 papers), Integrated Circuits and Semiconductor Failure Analysis (51 papers), Advancements in Semiconductor Devices and Circuit Design (32 papers), Electromagnetic Compatibility and Noise Suppression (21 papers), Silicon Carbide Semiconductor Technologies (7 papers), Physical Unclonable Functions (PUFs) and Hardware Security (4 papers) and Advanced Semiconductor Detectors and Materials (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (1.7k citations), Hardware and Architecture (82 citations), Atomic and Molecular Physics, and Optics (66 citations), Materials Chemistry (59 citations) and Electronic, Optical and Magnetic Materials (23 citations). C. Duvvury has collaborated with scholars based in United States, Germany and France. Frequent co-authors include A. Amerasekera, C.H. Diaz, S. Ramaswamy, R.N. Rountree, Mi-Chang Chang, V. Reddy, R.W. Dutton, Gianluca Boselli, Sung-Mo Kang and Kaustav Banerjee. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Device and Materials Reliability, IEEE Electron Device Letters, Microelectronics Reliability and IEEE Circuits and Devices Magazine.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.