D. Venables
- Structural Biology top 5%
- Surfaces, Coatings and Films top 5%
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- Silicon and Solar Cell Technologies 19
- Integrated Circuits and Semiconductor Failure Analysis 15
- Semiconductor materials and devices 14
- Semiconductor Lasers and Optical Devices 7
- Photonic and Optical Devices 5
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- Semiconductor materials and interfaces 12
- Semiconductor Quantum Structures and Devices 6
- Computational Mechanics top 10%
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- Advanced Surface Polishing Techniques 5
D. Venables
39 papers receiving 523 citations
Peers
Comparison fields: 5 of 29
- Structural Biology 47
- Surfaces, Coatings and Films 97
- Electrical and Electronic Engineering 492
- Atomic and Molecular Physics, and Optics 171
- Computational Mechanics 99
Countries citing papers authored by D. Venables
This map shows the geographic impact of D. Venables's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Venables with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Venables more than expected).
Fields of papers citing papers by D. Venables
This network shows the impact of papers produced by D. Venables. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Venables. The network helps show where D. Venables may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Venables, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 3 | |
| 2 | 2015 | 3 | |
| 3 | 2007 | 1 | |
| 4 | 1999 | 1 | |
| 5 | 1998 | 68 | |
| 6 | 1998 | 5 | |
| 7 | 1998 | 0 | |
| 8 | 1998 | 19 | |
| 9 | 1997 | 1 | |
| 10 | 1997 | 3 | |
| 11 | 1996 | 29 | |
| 12 | 1995 | 3 | |
| 13 | 1994 | 0 | |
| 14 | 1993 | 5 | |
| 15 | 1993 | 14 | |
| 16 | 1991 | 12 | |
| 17 | 1988 | 3 | |
| 18 | 1988 | 5 | |
| 19 | The Delayed Fracture of Aluminum Alloys. | 1985 | 2 |
| 20 | 1983 | 7 |
About D. Venables
D. Venables is a scholar working on Structural Biology, Metals and Alloys and Electrical and Electronic Engineering, having authored 44 papers that have together received 549 indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (19 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Semiconductor materials and devices (14 papers), Semiconductor materials and interfaces (12 papers), Semiconductor Lasers and Optical Devices (7 papers), Semiconductor Quantum Structures and Devices (6 papers), Photonic and Optical Devices (5 papers) and Advanced Surface Polishing Techniques (5 papers). The work is most often cited by research in Structural Biology (47 citations), Surfaces, Coatings and Films (97 citations) and Electrical and Electronic Engineering (492 citations). D. Venables has collaborated with scholars based in United States, Germany and Belgium. Frequent co-authors include K. S. Jones, D. M. Maher, David C. Collins, Khaled Ahmed, John R. Hauser, J. J. Wortman, Mingzhen Xu, Ranju Venables, W.K. Henson and Eric M. Vogel. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Microscopy and Microanalysis, Journal of The Electrochemical Society and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.