Joseph J. Kopanski
- Electrical and Electronic Engineering top 5%
- Atomic and Molecular Physics, and Optics top 5%
- Biomedical Engineering top 10%
- Materials Chemistry
- Ceramics and Composites top 10%
- Co-authors
- J. F. MarchiandoJeremiah R. LowneyC.D. FungCurt A. RichterLin YouYaw S. ObengDavid G. SeilerAlain C. Diebold
- Topics
- Force Microscopy Techniques and Applications (36 papers)Integrated Circuits and Semiconductor Failure Analysis (36 papers)Semiconductor materials and devices (25 papers)
- Cited by
- Atomic and Molecular Physics, and OpticsStructural BiologyElectrical and Electronic Engineering
- Partner nations
- United StatesEgyptSouth Korea
In The Last Decade
Joseph J. Kopanski
64 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 54
- Electrical and Electronic Engineering 836
- Atomic and Molecular Physics, and Optics 578
- Biomedical Engineering 355
- Materials Chemistry 217
- Ceramics and Composites 50
Countries citing papers authored by Joseph J. Kopanski
This map shows the geographic impact of Joseph J. Kopanski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Joseph J. Kopanski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Joseph J. Kopanski more than expected).
Fields of papers citing papers by Joseph J. Kopanski
This network shows the impact of papers produced by Joseph J. Kopanski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Joseph J. Kopanski. The network helps show where Joseph J. Kopanski may publish in the future.
Co-authorship network of co-authors of Joseph J. Kopanski
This figure shows the co-authorship network connecting the top 25 collaborators of Joseph J. Kopanski. A scholar is included among the top collaborators of Joseph J. Kopanski based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Joseph J. Kopanski. Joseph J. Kopanski is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Characterization of Buried Interfaces with Scanning Probe Microscopes | 2 |
| 2 | 7 | |
| 3 | Subsurface Imaging with the Scanning Microwave Microscope | 1 |
| 4 | 15 | |
| 5 | 2 | |
| 6 | Influence of Metal¿MoS2 Interface on MoS2 Transistor Performance: Comparison of Ag and Ti Contacts | 1 |
| 7 | 6 | |
| 8 | 11 | |
| 9 | 2 | |
| 10 | 2 | |
| 11 | 34 | |
| 12 | 2 | |
| 13 | 3 | |
| 14 | 28 | |
| 15 | MODELS FOR INTERPRETING SCANNING CAPACITANCE MICROSCOPE MEASUREMENTS | 0 |
| 16 | Scanning Capacitance Microscopy Measurement of 2-D Dopant Profiles across Junctions | 2 |
| 17 | 25 | |
| 18 | Characterization of Two-Dimensional Dopant Profiles: Status and Review | 1 |
| 19 | Scanned Probe Techniques for the Electrical Characterization of Semiconductor Devices | NIST | 1 |
| 20 | Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon | 2 |
About Joseph J. Kopanski
Joseph J. Kopanski is a scholar working on Atomic and Molecular Physics, and Optics, Structural Biology and Electrical and Electronic Engineering, having authored 70 papers that have together received 1.1k indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (36 papers), Integrated Circuits and Semiconductor Failure Analysis (36 papers) and Semiconductor materials and devices (25 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (578 citations), Structural Biology (21 citations) and Electrical and Electronic Engineering (836 citations). Joseph J. Kopanski has collaborated with scholars based in United States, Egypt and South Korea. Frequent co-authors include J. F. Marchiando, Jeremiah R. Lowney, C.D. Fung, Curt A. Richter, Lin You, Yaw S. Obeng, David G. Seiler, Alain C. Diebold, D. Adderton and Ricardo E. Ávila. Their work appears in journals such as ACS Nano, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.