C. C. Williams

4.5k citations

84 papers · 3.3k indexed · 1 hit paper · h-index 29

Atomic and Molecular Physics, and Optics top 0.5%
Electrical and Electronic Engineering top 2%
Biomedical Engineering top 2%
Materials Chemistry top 10%
Mechanics of Materials top 5%

Co-authors: H. K. Wickramasinghe Y. Martin J. S. McMurray J. Slinkman Ezra Bussmann Vladimir V. Zavyalov S. A. Rishton Levente J. Klein
Topics: Force Microscopy Techniques and Applications (63 papers)Integrated Circuits and Semiconductor Failure Analysis (32 papers)Near-Field Optical Microscopy (22 papers)
Cited by: Atomic and Molecular Physics, and Optics Structural Biology Electrical and Electronic Engineering
Journals: Nature Nano Letters Physical review. B, Condensed matter
Partner nations: United States South Korea Belgium

In The Last Decade

C. C. Williams

83 papers receiving 3.1k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Atomic force microscope–force mapping and profiling on a sub 100-Å scale

1987 983 citations C. C. Williams, H. K. Wickramasinghe et al. Journal of Applied Physics profile →

Peers

Countries citing papers authored by C. C. Williams

Since Specialization

Citations

This map shows the geographic impact of C. C. Williams's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. C. Williams with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. C. Williams more than expected).

Fields of papers citing papers by C. C. Williams

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. C. Williams. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. C. Williams. The network helps show where C. C. Williams may publish in the future.

Co-authorship network of co-authors of C. C. Williams

This figure shows the co-authorship network connecting the top 25 collaborators of C. C. Williams. A scholar is included among the top collaborators of C. C. Williams based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. C. Williams. C. C. Williams is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Imaging of Bandtail States in Silicon Heterojunction Solar Cells 2022 ·Refubium (Universitätsbibliothek der Freien Universität Berlin) ·(unknown),H. Malissa,Anna Belen Morales‐Vilches,(unknown),Lars Korte,Bernd Stannowski,C. C. Williams,Christoph Boehme,K. Lips	4
2	Electrical current through individual pairs of phosphorus donor atoms and silicon dangling bonds 2016 ·Scientific Reports ·(unknown),Philipp Rahe,Allison Payne,J. Slinkman,C. C. Williams,Christoph Boehme	9
3	Atomic-resolution single-spin magnetic resonance detection concept based on tunneling force microscopy 2015 ·Physical Review B ·Allison Payne,(unknown),Christoph Boehme,C. C. Williams	5
4	Atomic scale trap state characterization by dynamic tunneling force microscopy 2014 ·Applied Physics Letters ·(unknown),Sean W. King,C. C. Williams	7
5	Electronic characterization of individual monolayer protected Au clusters by single electron tunneling force spectroscopy 2010 ·Nanotechnology ·Ning Zheng,(unknown),C. C. Williams,Gangli Wang	7
6	Atomic scale imaging and spectroscopy of individual electron trap states using force detected dynamic tunnelling 2009 ·Nanotechnology ·(unknown),Ning Zheng,C. C. Williams	14
7	Single-electron tunneling force spectroscopy of an individual electronic state in a nonconducting surface 2006 ·Applied Physics Letters ·Ezra Bussmann,C. C. Williams	28
8	Modeling and experimental investigation of cantilever dynamics in force detected single electron tunneling 2004 ·Journal of Applied Physics ·Levente J. Klein,C. C. Williams	7
9	Sub-10 nm lateral spatial resolution in scanning capacitance microscopy achieved with solid platinum probes 2004 ·Review of Scientific Instruments ·Ezra Bussmann,C. C. Williams	37
10	Single-electron tunneling to insulator surfaces detected by electrostatic force 2002 ·Applied Physics Letters ·Levente J. Klein,C. C. Williams	25
11	Optical dipole model for photodetection in the near field 2001 ·Journal of the Optical Society of America A ·Robert C. Davis,C. C. Williams	6
12	Advances in experimental technique for quantitative two-dimensional dopant profiling by scanning capacitance microscopy 1999 ·Review of Scientific Instruments ·Vladimir V. Zavyalov,J. S. McMurray,C. C. Williams	72
13	Quantitative measurement of two-dimensional dopant profile by cross-sectional scanning capacitance microscopy 1997 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·J. S. McMurray,(unknown),C. C. Williams	32
14	Evidence of internal electric fields inGaInP2by scanning capacitance and near-field scanning optical microscopy 1997 ·Physical review. B, Condensed matter ·(unknown),C. C. Williams,J. M. Olson	8
15	Quantitative two-dimensional dopant profiling of abrupt dopant profiles by cross-sectional scanning capacitance microscopy 1996 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·(unknown),C. C. Williams,Mark A. Wendman	34
16	Micromachined submicrometer photodiode for scanning probe microscopy 1995 ·Applied Physics Letters ·Robert C. Davis,C. C. Williams,Pavel Neužil	46
17	Microscopy of chemical-potential variations on an atomic scale 1990 ·Nature ·C. C. Williams,H. K. Wickramasinghe	64
18	Lateral dopant profiling on a 100 nm scale by scanning capacitance microscopy 1990 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·C. C. Williams,J. Slinkman,(unknown),H. K. Wickramasinghe	28
19	Scanning capacitance microscopy on a 25 nm scale 1989 ·Applied Physics Letters ·C. C. Williams,(unknown),S. A. Rishton	156
20	Tip-Techniques for Microcharacterization of Materials 1987 ·Scanning microscopy ·Yves Martin,C. C. Williams,H. K. Wickramasinghe	4

About C. C. Williams

C. C. Williams is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Structural Biology, having authored 84 papers that have together received 3.3k indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (63 papers), Integrated Circuits and Semiconductor Failure Analysis (32 papers) and Near-Field Optical Microscopy (22 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (2.6k citations), Structural Biology (82 citations) and Electrical and Electronic Engineering (1.8k citations). C. C. Williams has collaborated with scholars based in United States, South Korea and Belgium. Frequent co-authors include H. K. Wickramasinghe, Y. Martin, J. S. McMurray, J. Slinkman, Ezra Bussmann, Vladimir V. Zavyalov, S. A. Rishton, Levente J. Klein, David W. Abraham and Robert C. Davis. Their work appears in journals such as Nature, Nano Letters and Physical review. B, Condensed matter.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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