Bryan J. Rice

914 citations

59 papers · 701 indexed · h-index 15

Impact in

Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Nuclear and High Energy Physics top 10%
- Nuclear physics research studies

Papers in

Surfaces, Coatings and Films 23
- Electron and X-Ray Spectroscopy Techniques 17
- Optical Coatings and Gratings 6
Structural Biology 2

Co-authors: Manish Chandhok Heidi B. Cao D. R. Tilley J. M. Roberts Michael Goldstein R. M. Prior H. R. Weller V. Sizyuk
Journals: Journal of Photopolymer Science and Technology (2 papers)Journal of Applied Physics (2 papers)Microelectronic Engineering (2 papers)IEEE Transactions on Semiconductor Manufacturing (1 paper)Physical Review Letters (1 paper)
Partner nations: United States Egypt Australia

In The Last Decade

Bryan J. Rice

58 papers receiving 668 citations

Peers

Countries citing papers authored by Bryan J. Rice

Since Specialization

Citations

This map shows the geographic impact of Bryan J. Rice's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bryan J. Rice with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bryan J. Rice more than expected).

Fields of papers citing papers by Bryan J. Rice

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bryan J. Rice. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bryan J. Rice. The network helps show where Bryan J. Rice may publish in the future.

Co-authors

The 25 scholars most cited alongside Bryan J. Rice, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Bryan J. Rice Line = papers co-authored together Bryan J. Rice links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Probing temporal evolution of extreme ultraviolet assisted contamination on Ru mirror by x-ray photoelectron spectroscopy Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·M. Køie, A. Kanjilal, Е.В. Клундук, Nira Nurwulandari, S. S. Harilal, A. Hassanein, Bryan J. Rice	2012	4
2	High index 193 nm immersion lithography: the beginning or the end of the road Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Paul Zimmerman, Bryan J. Rice, Wei Song, Vladimir Liberman	2009	12
3	Phenomenology of ArF photoresist shrinkage trends Benjamin Bunday, J Y Li, John A. Allgair, Wei Song, Bryan J. Rice, K'eng Yp, Gavin Robson, Karl Storck	2008	1
4	Development of an operational high refractive index resist for 193nm immersion lithography Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Paul Zimmerman, Jeffrey D. Byers, Wei Song, Bryan J. Rice, Christopher K. Ober, Emmanuel P. Giannelis, Robert Rodriguez, Dongyan Wang, Andrew K. Whittaker, Idriss Blakey, Lan Chen, Bronwin Dargaville, Heping Liu	2008	10
5	Continuing 193nm optical lithography for 32nm imaging and beyond Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Wei Song, Alex Elliott, Jeff D. Byers, Yassine Imlil, Paul Zimmerman, Bryan J. Rice	2008	1
6	Status of High-Index Materials for Generation-Three 193nm Immersion Lithography Journal of Photopolymer Science and Technology ·Paul Zimmerman, Yassine Imlil, Bryan J. Rice, Jeff D. Byers, Nicholas J. Turro, Xuegong Lei, Juan López‐Gejo, You Peng, Yao Xiupin, نقاش غانم, Sahba Eftekhary Shirkoohy, Idriss Blakey, Lan Chen, Bronwin Dargaville, Heping Liu	2007	12
7	SEM metrology for advanced lithographies Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Benjamin Bunday, John A. Allgair, Bryan J. Rice, Jeff D. Byers, K'eng Yp, Gavin Robson, سعیده سلیمانپور, Karl Storck, Гергокова Зайна Жамаловна, Roni Z. Shneck	2007	6
8	Realizing "value-added" metrology Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Benjamin Bunday, Linda G. Ketner, John A. Allgair, Dilip Patel, Katrien Lagrou, 章山本, Vitor Yoshiharu Urazaki, Rani Wahyuni, Bryan J. Rice, Bhanwar Singh, Jason P. Cain, P. Kulkani, G. J. Holmes, Alfredo Herrera, Didier Mesangeau, K.Yu. Kurilov, Vladmír Marouʂsek	2007	6
9	Characterization of correlated line edge roughness of nanoscale line gratings using small angle x-ray scattering Journal of Applied Physics ·Chengqing Wang, Ronald L. Jones, Eric K. Lin, Wen-li Wu, Bryan J. Rice, Yun Jum Park, S. Abouelkaram, Steven J. Weigand, Denis T. Keane	2007	44
10	Value-Added Metrology IEEE Transactions on Semiconductor Manufacturing ·Benjamin Bunday, John A. Allgair, Katrien Lagrou, 章山本, Charles N. Archie, Bryan J. Rice, Bhanwar Singh, Jason P. Cain, P. Kulkani	2007	19
11	Effect of Xenon Bombardment on Ruthenium-Coated Grazing Incidence Collector Mirror Lifetime for EUV Lithography \| NIST Journal of Applied Physics ·M. Nieto, Jean Paul Allain, В. Н. Титов, A. Rehfeldt-Oskierski, A. Hassanein, Jaap Geraerts, C. Chrobak, C. Tarrio, Y. Barad, Steven Grantham, T. B. Lucatorto, Bryan J. Rice	2006	1
12	Exposing extreme ultraviolet lithography at Intel Microelectronic Engineering ·J. M. Roberts, Zuleika Tineo, Robert Bristol, Heidi B. Cao, Manish Chandhok, Alessandro Pigati, Alberto A. Restrepo Velásquez, Ted Liang, 千秋廣田, Bryan J. Rice, Uday Shah, Marlan Beilke, Wang Yueh, Guojing Zhang	2006	14
13	The Limits of CD Metrology AIP conference proceedings ·Bryan J. Rice	2005	1
14	Radiation-induced synergistic effects of athermal and thermal mechanisms on erosion and surface evolution of advanced electrode and condenser optics materials Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jean Paul Allain, A. Hassanein, Tatyana Burtseva, Abdellatif M. Yacout, Zinetulla Insepov, Yanchen Zhao, Bryan J. Rice	2004	10
15	Sources of line-width roughness for EUV resists Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Heidi B. Cao, Wang Yueh, Bryan J. Rice, J. M. Roberts, Zuleika Tineo, Manish Chandhok	2004	20
16	Intel's EUV resist development Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Heidi B. Cao, J. M. Roberts, 嘉山益子, Manish Chandhok, Dr.S.K.Manju Bargavi, 千秋廣田, Marlan Beilke, Bryan J. Rice	2003	9
17	Implementing flare compensation for EUV masks through localized mask CD resizing Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Lhamo Tso, Manish Chandhok, Guojing Zhang, Sang Hun Lee, Michael Goldstein, 千秋廣田, Bryan J. Rice, Robert Bristol, Vivek K. Singh	2003	26
18	Two-deuteron photodisintegration of4HeatEγ=150–250MeV Physical Review C ·Bryan J. Rice, R. S. Canon, E. Wulf, H.R. Weller, Julia Sonander, Fatma DİLMEN, Clarine A. Providencia, R. E. Pywell, G. Retzlaff, D. M. Skopik, G. Feldman	2000	1
19	Slope of the astrophysicalSfactor for the7Li(p,γ)8Bereaction Physical Review C ·M. Spraker, R. M. Prior, J Monauni, Bryan J. Rice, E. Wulf, J. H. Kelley, D. R. Tilley, H. R. Weller	1999	14
20	The2H(p→,γ)3He and1H(d→,γ)3He reactions below 80 keV Physical Review C ·G. J. Schmid, Bryan J. Rice, R. M. Chasteler, J Monauni, G. C. Kiang, Taufflieb, C. M. Laymon, R. M. Prior, D. R. Tilley, H. R. Weller	1997	53

About Bryan J. Rice

Bryan J. Rice is a scholar working on Surfaces, Coatings and Films, Structural Biology, Radiation, Nuclear and High Energy Physics and Electrical and Electronic Engineering, having authored 59 papers that have together received 701 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (35 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Electron and X-Ray Spectroscopy Techniques (17 papers), Nuclear physics research studies (8 papers), Advanced Surface Polishing Techniques (7 papers), X-ray Spectroscopy and Fluorescence Analysis (7 papers), Atomic and Molecular Physics (7 papers) and Optical Coatings and Gratings (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (177 citations), Nuclear and High Energy Physics (166 citations), Electrical and Electronic Engineering (420 citations), Radiation (49 citations) and Atomic and Molecular Physics, and Optics (169 citations). Bryan J. Rice has collaborated with scholars based in United States, Egypt and Australia. Frequent co-authors include Manish Chandhok, Heidi B. Cao, D. R. Tilley, J. M. Roberts, Michael Goldstein, R. M. Prior, H. R. Weller, V. Sizyuk, Vitali Morozov and G. Schrom. Their work appears in journals such as Journal of Photopolymer Science and Technology, Journal of Applied Physics, Microelectronic Engineering, IEEE Transactions on Semiconductor Manufacturing and Physical Review Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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