M. Tuominen
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Electronic, Optical and Magnetic Materials top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Mechanics of Materials top 10%
- Co-authors
- Suvi HaukkaErik JanzénMichel HoussaA. StesmansM. M. HeynsV. V. Afanas’evM. NailiWilfried Vandervorst
- Topics
- Semiconductor materials and devices (39 papers)Silicon Carbide Semiconductor Technologies (20 papers)Copper Interconnects and Reliability (14 papers)
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryElectronic, Optical and Magnetic Materials
- Partner nations
- SwedenFinlandUnited States
In The Last Decade
M. Tuominen
59 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 82
- Electrical and Electronic Engineering 1.4k
- Materials Chemistry 722
- Electronic, Optical and Magnetic Materials 271
- Atomic and Molecular Physics, and Optics 247
- Mechanics of Materials 121
Countries citing papers authored by M. Tuominen
This map shows the geographic impact of M. Tuominen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Tuominen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Tuominen more than expected).
Fields of papers citing papers by M. Tuominen
This network shows the impact of papers produced by M. Tuominen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Tuominen. The network helps show where M. Tuominen may publish in the future.
Co-authorship network of co-authors of M. Tuominen
This figure shows the co-authorship network connecting the top 25 collaborators of M. Tuominen. A scholar is included among the top collaborators of M. Tuominen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Tuominen. M. Tuominen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 28 | |
| 3 | 2 | |
| 4 | 31 | |
| 5 | 6 | |
| 6 | 8 | |
| 7 | 7 | |
| 8 | Ratatietojen kuvaaminen - ratatietokanta ja verkkoselostus | 1 |
| 9 | 12 | |
| 10 | 4 | |
| 11 | 127 | |
| 12 | 22 | |
| 13 | 77 | |
| 14 | 15 | |
| 15 | 16 | |
| 16 | 16 | |
| 17 | 1 | |
| 18 | 34 | |
| 19 | 10 | |
| 20 | 25 |
About M. Tuominen
M. Tuominen is a scholar working on Ceramics and Composites, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 60 papers that have together received 1.7k indexed citations. Recurring topics across this work include Semiconductor materials and devices (39 papers), Silicon Carbide Semiconductor Technologies (20 papers) and Copper Interconnects and Reliability (14 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Materials Chemistry (722 citations) and Electronic, Optical and Magnetic Materials (271 citations). M. Tuominen has collaborated with scholars based in Sweden, Finland and United States. Frequent co-authors include Suvi Haukka, Erik Janzén, Michel Houssa, A. Stesmans, M. M. Heyns, V. V. Afanas’ev, M. Naili, Wilfried Vandervorst, Thierry Conard and Marc Heyns. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Chemistry of Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.