D. Coolbaugh
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- Semiconductor materials and devices 9
- Advancements in Semiconductor Devices and Circuit Design 6
- Radio Frequency Integrated Circuit Design 3
- 3D IC and TSV technologies 2
- Integrated Circuits and Semiconductor Failure Analysis 2
- Thin-Film Transistor Technologies 1
- Advancements in PLL and VCO Technologies 1
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- Copper Interconnects and Reliability 2
- Cited by
- Electrical and Electronic EngineeringHardware and ArchitectureElectronic, Optical and Magnetic Materials
- Journals
- IEEE Transactions on Electron Devices (1 paper)IEEE Journal of Solid-State Circuits (1 paper)Electrical Overstress/Electrostatic Discharge Symposium (1 paper)
- Partner nations
- United StatesSouth KoreaGermany
In The Last Decade
D. Coolbaugh
12 papers receiving 110 citations
Peers
Comparison fields: 5 of 12
- Electrical and Electronic Engineering 117
- Hardware and Architecture 6
- Electronic, Optical and Magnetic Materials 13
- Atomic and Molecular Physics, and Optics 11
- Condensed Matter Physics 3
Countries citing papers authored by D. Coolbaugh
This map shows the geographic impact of D. Coolbaugh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Coolbaugh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Coolbaugh more than expected).
Fields of papers citing papers by D. Coolbaugh
This network shows the impact of papers produced by D. Coolbaugh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Coolbaugh. The network helps show where D. Coolbaugh may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Coolbaugh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 8 | |
| 2 | 2008 | 2 | |
| 3 | 2007 | 2 | |
| 4 | 2007 | 4 | |
| 5 | 2006 | 13 | |
| 6 | 2006 | 9 | |
| 7 | The influence of high resistivity substrates on CMOS latchup robustness | 2005 | 1 |
| 8 | 2005 | 2 | |
| 9 | Electrical Characteristics and Reliability of UV Transparent Si N Metal-Insulator-Metal (MIM) Capacitors | 2003 | 1 |
| 10 | 2003 | 34 | |
| 11 | 2003 | 31 | |
| 12 | 2003 | 10 |
About D. Coolbaugh
D. Coolbaugh is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Condensed Matter Physics, having authored 12 papers that have together received 117 indexed citations. Recurring topics across this work include Semiconductor materials and devices (9 papers), Advancements in Semiconductor Devices and Circuit Design (6 papers), Radio Frequency Integrated Circuit Design (3 papers), Copper Interconnects and Reliability (2 papers), 3D IC and TSV technologies (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Thin-Film Transistor Technologies (1 paper) and Advancements in PLL and VCO Technologies (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (117 citations), Hardware and Architecture (6 citations) and Electronic, Optical and Magnetic Materials (13 citations). D. Coolbaugh has collaborated with scholars based in United States, South Korea and Germany. Frequent co-authors include V. Ramachandran, R. Groves, K. Watson, S. Subbanna, D.L. Harame, R. Volant, R. Bolam, Zhenyu He, Dan Wang and K. Stein. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits and Electrical Overstress/Electrostatic Discharge Symposium.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.