Jeffrey L. Titus

455 citations
13 papers · 374 indexed · h-index 9
Topics
Radiation Effects in Electronics (9 papers)Semiconductor materials and devices (9 papers)Integrated Circuits and Semiconductor Failure Analysis (7 papers)
Journals
IEEE Transactions on Nuclear ScienceNASA Technical Reports Server (NASA)Proceedings - International Symposium for Testing and Failure Analysis

In The Last Decade

Jeffrey L. Titus

12 papers receiving 357 citations

Peers

Jeffrey L. Titus
Comparison fields: 5 of 18
  • Electrical and Electronic Engineering 371
  • Hardware and Architecture 42
  • Materials Chemistry 10
  • Nuclear and High Energy Physics 9
  • Automotive Engineering 7
Replace M. Allenspach with:
M. Allenspach United States
N. Fel France
Gianluca Boselli United States
R. Nagai Japan
E. Worley United States
Lucio Rodoni Switzerland
G. Borghello Switzerland
W.E. Ansley United States
P. Austin France
R. Williams United States
Jeffrey L. Titus relative to M. Allenspach United States M. Allenspach's profile →
Citations per field
00.5×
M. Allenspach · 1×
Citations per year

Countries citing papers authored by Jeffrey L. Titus

Since Specialization
Citations

This map shows the geographic impact of Jeffrey L. Titus's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeffrey L. Titus with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeffrey L. Titus more than expected).

Fields of papers citing papers by Jeffrey L. Titus

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeffrey L. Titus. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeffrey L. Titus. The network helps show where Jeffrey L. Titus may publish in the future.

Co-authorship network of co-authors of Jeffrey L. Titus

This figure shows the co-authorship network connecting the top 25 collaborators of Jeffrey L. Titus. A scholar is included among the top collaborators of Jeffrey L. Titus based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeffrey L. Titus. Jeffrey L. Titus is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

13 of 13 papers shown
#WorkIndexed citations
1 0
2 111
3 11
4 20
5
Probing the SEB Sensitive Depth of a Power MOSFET Using a Two-Photon Absorption Laser Method
3
6 3
7 27
8 19
9 60
10 79
11 20
12
A Study of Ion Energy and Its Effects Upon an SEGR-Hardened Stripe-Cell MOSFET Technology
7
13 14

About Jeffrey L. Titus

Jeffrey L. Titus is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 13 papers that have together received 374 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (9 papers), Semiconductor materials and devices (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (371 citations), Hardware and Architecture (42 citations) and Nuclear and High Energy Physics (9 citations). Jeffrey L. Titus has collaborated with scholars based in United States, Netherlands and France. Frequent co-authors include Sandra Liu, D Platteter, Martin Bliss, C.F. Wheatley, Raymond L. Ladbury, Hak Kim, Neil Goldsman, Jean‐Marie Lauenstein, Kenneth A. LaBel and Anthony M. Phan. Their work appears in journals such as IEEE Transactions on Nuclear Science, NASA Technical Reports Server (NASA) and Proceedings - International Symposium for Testing and Failure Analysis.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Rankless by CCL
2026