A. I. Chumakov

960 total citations
91 papers, 715 citations indexed

About

A. I. Chumakov is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computational Mechanics. According to data from OpenAlex, A. I. Chumakov has authored 91 papers receiving a total of 715 indexed citations (citations by other indexed papers that have themselves been cited), including 82 papers in Electrical and Electronic Engineering, 22 papers in Hardware and Architecture and 13 papers in Computational Mechanics. Recurrent topics in A. I. Chumakov's work include Radiation Effects in Electronics (62 papers), Integrated Circuits and Semiconductor Failure Analysis (53 papers) and Semiconductor materials and devices (23 papers). A. I. Chumakov is often cited by papers focused on Radiation Effects in Electronics (62 papers), Integrated Circuits and Semiconductor Failure Analysis (53 papers) and Semiconductor materials and devices (23 papers). A. I. Chumakov collaborates with scholars based in Russia, India and Israel. A. I. Chumakov's co-authors include Andrey V. Yanenko, Alexander Pechenkin, Armen V. Sogoyan, A.Y. Nikiforov, Alexander Y. Nikiforov, В.С. Першенков, Dmitry V. Boychenko, V.V. Belyakov, Maxim S. Gorbunov and Gennady I. Zebrev and has published in prestigious journals such as SHILAP Revista de lepidopterología, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and IEEE Transactions on Nuclear Science.

In The Last Decade

A. I. Chumakov

81 papers receiving 662 citations

Peers

Countries citing papers authored by A. I. Chumakov

Since Specialization

Citations

This map shows the geographic impact of A. I. Chumakov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. I. Chumakov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. I. Chumakov more than expected).

Fields of papers citing papers by A. I. Chumakov

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. I. Chumakov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. I. Chumakov. The network helps show where A. I. Chumakov may publish in the future.

Co-authorship network of co-authors of A. I. Chumakov

This figure shows the co-authorship network connecting the top 25 collaborators of A. I. Chumakov. A scholar is included among the top collaborators of A. I. Chumakov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. I. Chumakov. A. I. Chumakov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	SINGLE EVENT EFFECTS RADIATION TESTING REQUIREMENTS: A BAYESIN AN APPROACH 2025 ·SHILAP Revista de lepidopterología ·Armen V. Sogoyan, (unknown), (unknown), A. I. Chumakov, Andrey V. Yanenko, Dmitry V. Boychenko	0
2	The influence of an impulsed ion radiation on the sensitivity parameters of integrated circuits to single event effects 2024 ·SHILAP Revista de lepidopterología ·A. I. Chumakov, (unknown), (unknown)	0
3	Some aspects of IC radiation hardness evaluation when exposed to neutrons 2021 ·SHILAP Revista de lepidopterología ·A. I. Chumakov, Armen V. Sogoyan, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown)	1
4	Hardness assurance levels and requirements for single event effects testing of integrated circuits 2020 ·SHILAP Revista de lepidopterología ·A. I. Chumakov, Armen V. Sogoyan, (unknown), (unknown), (unknown), Dmitry V. Boychenko, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Andrey V. Yanenko	2
5	Single event effects qualificatoin of integrated circuits 2020 ·SHILAP Revista de lepidopterología ·Armen V. Sogoyan, (unknown), A. I. Chumakov	3
6	Estimation of single event effect sensitivity in VLSI to neutron irradiation 2020 ·Problems of advanced micro- and nanoelectronic systems development ·A. I. Chumakov	2
7	Single Event Rate Evaluation for Modern ICs 2018 ·Problems of advanced micro- and nanoelectronic systems development ·Armen V. Sogoyan, A. I. Chumakov, (unknown)	1
8	The laser-only single-event effects test method for space electronics based on ultrashort-pulsed-laser 'local irradiation' 2018 ·(unknown), (unknown), Alexander Pechenkin, A. I. Chumakov, (unknown)	1
9	Circuit Engineering Modeling of Single Event Effects under Impact of Heavy-Charged Particles in SUB-100 NM CMOS ICs 2017 ·(unknown), (unknown), (unknown), (unknown), (unknown), Andrey V. Yanenko, (unknown), Armen V. Sogoyan, (unknown), (unknown), A. I. Chumakov, (unknown), (unknown)	0
10	A simple analytical model of single-event upsets in bulk CMOS 2017 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Armen V. Sogoyan, A. I. Chumakov, (unknown), (unknown), (unknown)	9
11	Compendium of TID influence on SEE sensitivity investigation 2017 ·Alexander Novikov, Alexander Pechenkin, A. I. Chumakov, (unknown), (unknown)	2
12	The Effectiveness of Specialized IC Packages: Experimental and Monte-Carlo Simulation for Basic Orbits and Spacecraft Shielding 2015 ·(unknown), (unknown), (unknown), Dmitry V. Boychenko, Alexander Y. Nikiforov, A. I. Chumakov, J. C. Thomas, (unknown), (unknown)	3
13	Flash memory cells data loss caused by total ionizing dose and heavy ions 2014 ·Open Physics ·(unknown), (unknown), (unknown), A. I. Chumakov, Alexander Y. Nikiforov	25
14	Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods 2012 ·IEEE Transactions on Nuclear Science ·Maxim S. Gorbunov, (unknown), (unknown), (unknown), Gennady I. Zebrev, Vasily S. Anashin, (unknown), (unknown), (unknown), A. I. Chumakov, Alexander Pechenkin, Andrey V. Yanenko	17
15	The Influence of Electrical Impulse on IC Transient Radiation-Induced Effects 2003 ·ESA Special Publication ·A. I. Chumakov, (unknown), (unknown), (unknown)	4
16	Methods for the Prediction of Total-Dose Effects on Modern Integrated Semiconductor Devices in Space: A Review 2003 ·Russian Microelectronics ·V.V. Belyakov, В.С. Першенков, Gennady I. Zebrev, Armen V. Sogoyan, A. I. Chumakov, A.Y. Nikiforov, (unknown)	19
17	Prediction of Local and Global Ionization Effects on ICs: The Synergy between Numerical and Physical Simulation 2003 ·Russian Microelectronics ·V.V. Belyakov, A. I. Chumakov, A.Y. Nikiforov, В.С. Першенков, (unknown), Armen V. Sogoyan	9
18	CMOS IC transient radiation effects investigations, model verification and parameter extraction with the test structures laser simulation tests 2002 ·A.Y. Nikiforov, A. I. Chumakov, (unknown)	9
19	Simplified estimation of proton-induced SEU 2002 ·A. I. Chumakov, Н. В. Кузнецов	3
20	Laser technique of single event latchup threshold estimation 1998 ·A. I. Chumakov, (unknown), (unknown), (unknown), (unknown), Andrey V. Yanenko	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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