D. Ney
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Hardware and Architecture
- Mechanics of Materials
- Co-authors
- X. FederspielPatrice GergaudLaurent DoyenΟ. ThomasL. ArnaudY. WoutersE. PetitprezF. Cacho
- Topics
- Semiconductor materials and devices (25 papers)Copper Interconnects and Reliability (23 papers)Electronic Packaging and Soldering Technologies (17 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringHardware and Architecture
- Journals
- The American Journal of Emergency MedicineMicroelectronics ReliabilityMicroelectronic Engineering
- Partner nations
- FranceSwitzerlandNetherlands
In The Last Decade
D. Ney
31 papers receiving 151 citations
Peers
Comparison fields: 5 of 27
- Electrical and Electronic Engineering 145
- Electronic, Optical and Magnetic Materials 84
- Atomic and Molecular Physics, and Optics 20
- Hardware and Architecture 14
- Mechanics of Materials 12
Countries citing papers authored by D. Ney
This map shows the geographic impact of D. Ney's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Ney with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Ney more than expected).
Fields of papers citing papers by D. Ney
This network shows the impact of papers produced by D. Ney. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Ney. The network helps show where D. Ney may publish in the future.
Co-authorship network of co-authors of D. Ney
This figure shows the co-authorship network connecting the top 25 collaborators of D. Ney. A scholar is included among the top collaborators of D. Ney based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Ney. D. Ney is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 0 | |
| 3 | 4 | |
| 4 | 1 | |
| 5 | 3 | |
| 6 | 1 | |
| 7 | 1 | |
| 8 | 1 | |
| 9 | 3 | |
| 10 | 6 | |
| 11 | 28 | |
| 12 | 6 | |
| 13 | 2 | |
| 14 | 3 | |
| 15 | 2 | |
| 16 | 1 | |
| 17 | 3 | |
| 18 | 19 | |
| 19 | 6 | |
| 20 | 4 |
About D. Ney
D. Ney is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Geriatrics and Gerontology, having authored 34 papers that have together received 156 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Copper Interconnects and Reliability (23 papers) and Electronic Packaging and Soldering Technologies (17 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (84 citations), Electrical and Electronic Engineering (145 citations) and Hardware and Architecture (14 citations). D. Ney has collaborated with scholars based in France, Switzerland and Netherlands. Frequent co-authors include X. Federspiel, Patrice Gergaud, Laurent Doyen, Ο. Thomas, L. Arnaud, Y. Wouters, E. Petitprez, F. Cacho, Brice Gautier and J. Torrès. Their work appears in journals such as The American Journal of Emergency Medicine, Microelectronics Reliability and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.