Ο. Thomas

5.3k total citations · 1 hit paper
298 papers, 4.3k citations indexed

About

Ο. Thomas is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Materials Chemistry. According to data from OpenAlex, Ο. Thomas has authored 298 papers receiving a total of 4.3k indexed citations (citations by other indexed papers that have themselves been cited), including 143 papers in Atomic and Molecular Physics, and Optics, 118 papers in Electrical and Electronic Engineering and 101 papers in Materials Chemistry. Recurrent topics in Ο. Thomas's work include Semiconductor materials and interfaces (91 papers), Metal and Thin Film Mechanics (50 papers) and Semiconductor materials and devices (44 papers). Ο. Thomas is often cited by papers focused on Semiconductor materials and interfaces (91 papers), Metal and Thin Film Mechanics (50 papers) and Semiconductor materials and devices (44 papers). Ο. Thomas collaborates with scholars based in France, United States and Germany. Ο. Thomas's co-authors include Damien Connétable, S. Labat, Patrice Gergaud, F. M. d’Heurle, R. Madar, J.P. Sénateur, Marie‐Ingrid Richard, Thomas W. Cornelius, O. Laborde and S.L. Delage and has published in prestigious journals such as Physical Review Letters, Advanced Materials and Nature Communications.

In The Last Decade

Ο. Thomas

292 papers receiving 4.2k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Continuous scanning for Bragg coherent X-ray imaging

2020 298 citations Ni Li, Maxime Dupraz et al. profile →

Peers

Countries citing papers authored by Ο. Thomas

Since Specialization

Citations

This map shows the geographic impact of Ο. Thomas's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ο. Thomas with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ο. Thomas more than expected).

Fields of papers citing papers by Ο. Thomas

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ο. Thomas. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ο. Thomas. The network helps show where Ο. Thomas may publish in the future.

Co-authorship network of co-authors of Ο. Thomas

This figure shows the co-authorship network connecting the top 25 collaborators of Ο. Thomas. A scholar is included among the top collaborators of Ο. Thomas based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ο. Thomas. Ο. Thomas is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Influence of an underlayer on the crystallization of thin Ge-rich Ge–Sb–Te films 2025 ·Journal of Applied Physics ·(unknown), (unknown), Cristian Mocuta, (unknown), M. Texier, G. Navarro, Y. Le Friec, S. Jeannot, Ο. Thomas	0
2	Influence of Ion Size on Structure and Redox Chemistry in Na‐Rich and Li‐Rich Disordered Rocksalt Battery Cathodes 2025 ·Advanced Materials ·Neil C. Mitchell, Ο. Thomas, Benjamin Meyer, Mirian García‐Fernández, Ke‐Jin Zhou, Patrick S. Grant, (unknown), Richard Heap, Ruth Sayers, Robert A. House	0
3	Laser‐Induced Crystallization and Amorphization of Ge‐Rich GST Thin Films Monitored In Situ with Synchrotron X‐Ray Diffraction 2025 ·physica status solidi (RRL) - Rapid Research Letters ·(unknown), (unknown), M. Texier, (unknown), (unknown), (unknown), S. Jeannot, Y. Le Friec, (unknown), Ο. Thomas	1
4	Influence of surface roughness on the deformation of gold nanoparticles under compression 2024 ·Acta Materialia ·(unknown), Thomas W. Cornelius, Ο. Thomas, Jonathan Amodeo	5
5	Investigation of Phase Segregation Dynamics in Ge‐Rich GST Thin Films by In Situ X‐Ray Fluorescence Mapping 2024 ·physica status solidi (RRL) - Rapid Research Letters ·(unknown), M. Texier, (unknown), Cristian Mocuta, (unknown), G. Navarro, S. Jeannot, Thomas W. Cornelius, (unknown), Jaime Segura‐Ruiz, Martin Rosenthal, Y. Le Friec, (unknown), Ο. Thomas	1
6	Pyrough: A tool to build 3D samples with rough surfaces for atomistic and finite-element simulations 2023 ·Computer Physics Communications ·(unknown), (unknown), Christophe Le Bourlot, Thomas W. Cornelius, Ο. Thomas, Jonathan Amodeo	5
7	Crystallization kinetics from Ge-rich Ge–Sb–Te thin films: Influence of thickness 2023 ·Journal of Applied Physics ·(unknown), Cristian Mocuta, Y. Le Friec, (unknown), (unknown), Ο. Thomas	2
8	Understanding crystallization in undoped and nitrogen doped GeTe thin films using substrate curvature measurements 2023 ·Materialia ·(unknown), (unknown), (unknown), Pierre Noé, Cristian Mocuta, Ο. Thomas	2
9	Time-resolved piezoelectric response in relaxor ferroelectric (Pb0.88La0.12)(Zr0.52Ti0.48)O3 thin films 2022 ·Journal of Applied Physics ·Matthias Rössle, Ο. Thomas, Cristian Mocuta, (unknown), M. Texier, S. Escoubas, Catherine Dubourdieu, E. B. Araújo, Thomas W. Cornelius	1
10	Imaging the facet surface strain state of supported multi-faceted Pt nanoparticles during reaction 2022 ·Nature Communications ·Maxime Dupraz, Ni Li, Jérôme Carnis, Longfei Wu, S. Labat, (unknown), (unknown), Jan P. Hofmann, Ehud Almog, Steven Leake, Yves Watier, Sergey Lazarev, Fabian Westermeier, Michael Sprung, Emiel J. M. Hensen, Ο. Thomas, Eugen Rabkin, Marie‐Ingrid Richard	30
11	Load versus displacement-controlled nanocompression: Insights from atomistic simulations 2022 ·Scripta Materialia ·(unknown), Thomas W. Cornelius, Ο. Thomas, Jonathan Amodeo	7
12	Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling 2020 ·Nanomaterials ·(unknown), (unknown), (unknown), (unknown), S. Escoubas, Magali Putero, Cristian Mocuta, Marie‐Ingrid Richard, (unknown), C. Sabbione, M. Bernard, (unknown), Pierre Noé, Ο. Thomas	4
13	Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching 2020 ·Materials ·(unknown), (unknown), S. Escoubas, Jörg Ackermann, Dominique Thiaudière, Cristian Mocuta, (unknown), David Duché, Ο. Thomas, Souren Grigorian	2
14	In situ measurements of the structure and strain of a π-conjugated semiconducting polymer under mechanical load 2020 ·Journal of Applied Physics ·(unknown), S. Escoubas, (unknown), (unknown), David Duché, Evangéline Bènevent, Christine Videlot‐Ackermann, Jörg Ackermann, Ο. Thomas, Souren Grigorian	10
15	Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction 2020 ·Materials ·Thomas W. Cornelius, Cristian Mocuta, S. Escoubas, (unknown), E. B. Araújo, Andréi L. Kholkin, Ο. Thomas	3
16	In depth characterization of Ge-Si core-shell nanowires using X-ray coherent diffraction and time resolved pump-probe spectroscopy 2019 ·Journal of Applied Physics ·Sara Fernández, (unknown), Éric Charron, P. Gentile, Marie‐Ingrid Richard, Ο. Thomas, Bernard Perrin, Laurent Belliard	2
17	In situstructural evolution of single particle model catalysts under ambient pressure reaction conditions 2018 ·Nanoscale ·Sara Fernández, Lu Gao, Jan P. Hofmann, Jérôme Carnis, S. Labat, Gilbert Chahine, Arno J. F. van Hoof, M. W. G. M. Verhoeven, Tobias U. Schülli, Emiel J. M. Hensen, Ο. Thomas, Marie‐Ingrid Richard	14
18	A Complex Interrelationship between Temperature-Dependent Polyquaterthiophene (PQT) Structural and Electrical Properties 2017 ·The Journal of Physical Chemistry C ·Souren Grigorian, S. Escoubas, (unknown), David Duché, (unknown), J.J. Simon, (unknown), Sybille Allard, Ullrich Scherf, U. Pietsch, Ο. Thomas	4
19	Synchrotron Laue micro-diffraction: a new beam line project at SOLEIL for phase identification and mechanics of materials 2007 ·Acta Crystallographica Section A Foundations of Crystallography ·P. Goudeau, Ο. Thomas	1
20	Determination of stress in Au/Ni multilayers by symmetric and asymmetric X-ray diffraction 2002 ·Optica Applicata ·Dariusz Chocyk, (unknown), G. Gładyszewski, S. Labat, Patrice Gergaud, Ο. Thomas	3

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact