B. Woolery

533 total citations
6 papers, 142 citations indexed

About

B. Woolery is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Biomedical Engineering. According to data from OpenAlex, B. Woolery has authored 6 papers receiving a total of 142 indexed citations (citations by other indexed papers that have themselves been cited), including 4 papers in Electrical and Electronic Engineering, 2 papers in Mechanics of Materials and 2 papers in Biomedical Engineering. Recurrent topics in B. Woolery's work include Advancements in Semiconductor Devices and Circuit Design (4 papers), Semiconductor materials and devices (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). B. Woolery is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (4 papers), Semiconductor materials and devices (4 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). B. Woolery collaborates with scholars based in United States and United Kingdom. B. Woolery's co-authors include Sangwoo Pae, C. Prasad, J. Maiz, Ryan Lu, A. St. Amour, Seok‐Hee Lee, T. Ghani, Jun He, Ashwin Ashok and Mark Liu and has published in prestigious journals such as IEEE Transactions on Device and Materials Reliability, MRS Proceedings and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

In The Last Decade

B. Woolery

5 papers receiving 133 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
B. Woolery United States	5	142	12	10	5	3	6	142
S. Mittl United States	12	285 2.0×	22 1.8×	8 0.8×	16 3.2×	4 1.3×	28	292
D. Coolbaugh United States	6	117 0.8×	13 1.1×	6 0.6×	5 1.0×	1 0.3×	12	117
S. Mehta United States	5	79 0.6×	16 1.3×	3 0.3×	11 2.2×	3 1.0×	26	83
C. Weintraub United States	6	101 0.7×	4 0.3×	6 0.6×	7 1.4×	1 0.3×	13	107
C. W. Chang Taiwan	5	56 0.4×	4 0.3×	6 0.6×	6 1.2×		6	64
C. Tsai United States	5	87 0.6×	3 0.3×	4 0.4×	5 1.0×		6	89
P. Hopper United States	12	377 2.7×	2 0.2×	11 1.1×	4 0.8×	3 1.0×	46	380
Jizhi Liu China	11	306 2.2×	3 0.3×	6 0.6×	5 1.0×		50	310
R. Tu United States	8	309 2.2×	18 1.5×	32 3.2×	10 2.0×	1 0.3×	15	319
N. Nidhi United States	4	63 0.4×	6 0.5×	2 0.2×	2 0.4×		8	70

Countries citing papers authored by B. Woolery

Since Specialization

Citations

This map shows the geographic impact of B. Woolery's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Woolery with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Woolery more than expected).

Fields of papers citing papers by B. Woolery

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Woolery. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Woolery. The network helps show where B. Woolery may publish in the future.

Co-authorship network of co-authors of B. Woolery

This figure shows the co-authorship network connecting the top 25 collaborators of B. Woolery. A scholar is included among the top collaborators of B. Woolery based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Woolery. B. Woolery is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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6 of 6 papers shown

1.

Rahman, Anisur, Peng Bai, G. Curello, et al.. (2013). Reliability studies of a 22nm SoC platform technology featuring 3-D tri-gate, optimized for ultra low power, high performance and high density application. PI.2.1–PI.2.6. 14 indexed citations

2.

Pae, Sangwoo, C. Prasad, S. Ramey, et al.. (2012). Gate dielectric TDDB characterizations of advanced High-k and metal-gate CMOS logic transistor technology. 5C.1.1–5C.1.5. 15 indexed citations

3.

Pae, Sangwoo, Ashwin Ashok, T. Ghani, et al.. (2010). Reliability characterization of 32nm high-K and Metal-Gate logic transistor technology. 287–292. 46 indexed citations

4.

Pae, Sangwoo, J. Maiz, C. Prasad, & B. Woolery. (2008). Effect of BTI Degradation on Transistor Variability in Advanced Semiconductor Technologies. IEEE Transactions on Device and Materials Reliability. 8(3). 519–525. 62 indexed citations

5.

Lee, Jin, Qing Ma, T. Marieb, et al.. (1995). Measurement and Modeling of Intrinsic Stresses in CVD W Lines. MRS Proceedings. 391. 5 indexed citations

6.

Woolery, B., et al.. (1990). Characterization of an asymmetric nonlinear component of process-induced distortion in thermally stressed silicon wafers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1264. 54–54.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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