C. Weintraub

431 citations

13 papers · 107 indexed · h-index 6

Impact in

Electrical and Electronic Engineering
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Advanced Memory and Neural Computing
- Ferroelectric and Negative Capacitance Devices
Hardware and Architecture

Papers in

Electrical and Electronic Engineering 13
- Semiconductor materials and devices 12
- Advancements in Semiconductor Devices and Circuit Design 9
- Integrated Circuits and Semiconductor Failure Analysis 5
- Low-power high-performance VLSI design 2
- Advanced Memory and Neural Computing 2
- Advancements in PLL and VCO Technologies 1
- Ferroelectric and Negative Capacitance Devices 1
- Radio Frequency Integrated Circuit Design 1
Condensed Matter Physics 1

Co-authors: Eric M. Vogel John S. Suehle J.B. Bernstein Bin Wang P. Roitman John F. Conley Allan H. Johnston Pascal Le Masson
Journals: Materials Science in Semiconductor Processing (2 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (2 papers)IEEE Transactions on Electron Devices (1 paper)Applied Physics Letters (1 paper)MRS Proceedings (1 paper)
Partner nations: United States France Germany

In The Last Decade

C. Weintraub

12 papers receiving 103 citations

Peers

Countries citing papers authored by C. Weintraub

Since Specialization

Citations

This map shows the geographic impact of C. Weintraub's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Weintraub with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Weintraub more than expected).

Fields of papers citing papers by C. Weintraub

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Weintraub. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Weintraub. The network helps show where C. Weintraub may publish in the future.

Co-authors

The 25 scholars most cited alongside C. Weintraub, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. Weintraub Line = papers co-authored together C. Weintraub links everyone, so they are left out of the graph.

All Works

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13 of 13 papers shown

#	Work
1	Array Termination Impacts in Advanced SRAM IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·R. Mann, Aulia Kasmawati Suaib, Sheng Quan Xie, Alberto Rafols, 他谷康, สุญาณี จิตตะยโศธร, M. Gribelyuk, Andrés Pacheco Rodríguez, Xiaoqiang Zhang, Fred Walker, C. Weintraub	2017	4
2	Low-variation SRAM bitcells in 22nm FDSOI technology Vivek Joshi, Joohyun Ryu, Sriram Balasubramanian, Soon‐Cheon Seo, Sunitha Adepu, マリノフスキセルゲイ, Gozalvez Javier, MedhatA Halimb, R. Bullens, Jacqueline Seaver, Jingwen Zhang, Sílvia Jorge, W. Hater, C. Weintraub	2017	12
3	Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·R. Mann, William E. McMahon, Anan Bao, Md Mostafa Hosain, Siraz D. A. A. Khan, Sheng Quan Xie, 原武也, 他谷康, Margit Bartfeld-Feller, C. Weintraub	2016	2
4	Near-threshold circuit variability in 14nm FinFETs for ultra-low power applications Sriram Balasubramanian, N. Pimparkar, Neha Daharwal, K. Abacar, Michele Tepedino, Shoib Allan Myint, Vivek Joshi, Kun Qian, Jose Antonio Lazarini, K. Chandrasekaran, C. Weintraub, Herm. Thiersch	2016	5
5	SRAM Vmax stability considerations David C. Burnett, Sriram Balasubramanian, Vivek Joshi, Fatimzohra Tmimi, J.M. Higman, C. Weintraub	2015	3
6	HTOL SRAM Vmin shift considerations in scaled HKMG technologies Sriram Balasubramanian, Vivek Joshi, R. Bullens, R. Mann, 他谷康, L. McMillan, C. Weintraub, Gerhard Kurz, Gerhard Krause, A. Kerber, Margit Bartfeld-Feller, T. Nigam	2014	3
7	Impacts of process induced interfacial defects on gate oxide integrity Anna Fleischer, A. Haggag, Hong Kong, Mohamed Solih, C. Weintraub, Yuan Jinshe, G. G. Campbell, Anshuman Srivastava, Lin Shi-quan, Jared M. Porter, I. Richter-Heine, Utkarsh Khandelwal, Rui-Ling Gou	2008	0
8	Latent reliability degradation of ultra-thin oxides after heavy ion and γ-ray irradiation B. Wang, John S. Suehle, Eric M. Vogel, Masanori Oyama, C. Weintraub, A.H. Johnston, J.B. Bernstein	2003	5
9	Observation of latent reliability degradation in ultrathin oxides after heavy-ion irradiation Applied Physics Letters ·John S. Suehle, Eric M. Vogel, P. Roitman, John F. Conley, Allan H. Johnston, Bin Wang, J.B. Bernstein, C. Weintraub	2002	41
10	Characterization and Production Metrology of Gate Dielectric Films: Optical Models for Oxynitrides and High Dielectric Constant Films Materials Science in Semiconductor Processing ·Alain C. Diebold, Jesse D. Canterbury, Kira Jones, Curt A. Richter, Nhan V. Nguyen, James R. Ehrstein, C. Weintraub	2001	2
11	Study of low-frequency charge pumping on thin stacked dielectrics IEEE Transactions on Electron Devices ·C. Weintraub, Eric M. Vogel, John R. Hauser, Nian Yang, Veena Misra, J. J. Wortman, 小川喜代枝, Pascal Le Masson	2001	20
12	Characterization and production metrology of gate dielectric films Materials Science in Semiconductor Processing ·Alain C. Diebold, Jesse D. Canterbury, Kira Jones, Curt A. Richter, Nhan V. Nguyen, Ojha Himanshu, C. Weintraub	2001	7
13	Selective TiSi₂ Formation Using TiCl₄(g), Si(s) and H₂(g): A study of the Mask Loading Phenomena MRS Proceedings ·George D. Dimacopoulos, C. Weintraub, Aldo R. Boccaccini	1995	3

About C. Weintraub

C. Weintraub is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Inorganic Chemistry, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 13 papers that have together received 107 indexed citations. Recurring topics across this work include Semiconductor materials and devices (12 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Low-power high-performance VLSI design (2 papers), Advanced Memory and Neural Computing (2 papers), Advancements in PLL and VCO Technologies (1 paper), Ferroelectric and Negative Capacitance Devices (1 paper) and Radio Frequency Integrated Circuit Design (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (101 citations), Hardware and Architecture (6 citations), Computational Mechanics (12 citations), Atomic and Molecular Physics, and Optics (11 citations) and Surfaces, Coatings and Films (2 citations). C. Weintraub has collaborated with scholars based in United States, France and Germany. Frequent co-authors include Eric M. Vogel, John S. Suehle, J.B. Bernstein, Bin Wang, P. Roitman, John F. Conley, Allan H. Johnston, Pascal Le Masson, Nian Yang and John R. Hauser. Their work appears in journals such as Materials Science in Semiconductor Processing, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Transactions on Electron Devices, Applied Physics Letters and MRS Proceedings.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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