Uma Sharma

444 citations

26 papers · 325 indexed · h-index 11

Impact in

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
- Advanced Memory and Neural Computing
- Electrostatic Discharge in Electronics
- Radiation Effects in Electronics
Hardware and Architecture

Papers in

Electrical and Electronic Engineering 26
- Semiconductor materials and devices 25
- Advancements in Semiconductor Devices and Circuit Design 24
- Ferroelectric and Negative Capacitance Devices 12
- Integrated Circuits and Semiconductor Failure Analysis 6
- Silicon Carbide Semiconductor Technologies 4
- Radiation Effects in Electronics 1
- Low-power high-performance VLSI design 1
- Microwave Engineering and Waveguides 1
Hardware and Architecture 2

Co-authors: Souvik Mahapatra Narendra Parihar Miaomiao Wang Richard G. Southwick J. H. Stathis Subhadeep Mukhopadhyay Nilesh Goel Nilotpal Choudhury
Journals: IEEE Transactions on Electron Devices (8 papers)IEEE Transactions on Nuclear Science (1 paper)Microwave and Optical Technology Letters (1 paper)IEEE Journal of the Electron Devices Society (1 paper)Solid-State Electronics (1 paper)
Partner nations: India United States Germany

In The Last Decade

Uma Sharma

25 papers receiving 323 citations

Peers

Countries citing papers authored by Uma Sharma

Since Specialization

Citations

This map shows the geographic impact of Uma Sharma's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Uma Sharma with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Uma Sharma more than expected).

Fields of papers citing papers by Uma Sharma

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Uma Sharma. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Uma Sharma. The network helps show where Uma Sharma may publish in the future.

Co-authors

The 25 scholars most cited alongside Uma Sharma, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Uma Sharma Line = papers co-authored together Uma Sharma links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Modeling BTI Reliability in CMOS DRAM Periphery Device: A Review of BTI Analysis Tool (BAT) A. Subirats, М. О. Данилюк, Giovanni Ferrari, Uma Sharma, Mbali Mkhabela, Daniel Guifarro Rivera, Saket Srivastava, Karine Florent, 裕二郎岩男, PetalasP., Souvik Mahapatra	2025	0
2	CARAT – A reliability analysis framework for BTI-HCD aging in circuits Solid-State Electronics ·A. Imomkulov, Roberto. Treviño, Marie VOŽDOVÁ, Hussam Amrouch, E Liu, Shouvik Das, Uma Sharma, Victor M. van Santen, Souvik Mahapatra	2023	7
3	A Generic Framework for MOSFET Reliability—Part II: Gate and Drain Stress—HCD IEEE Transactions on Electron Devices ·Souvik Mahapatra, Miroslav Filip, B Kamstra, Nilotpal Choudhury, Roberto. Treviño, Matthew L. Kleinjan, Sergio Peña Fierro, Uma Sharma	2023	6
4	Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs Matthew L. Kleinjan, P.V.P. Moorthi, B Kamstra, Uma Sharma, Souvik Mahapatra	2021	3
5	Cool-CMOS Technology for Next Generation High Performance Computing Wriddhi Chakraborty, W. A. L. Blyth, Uma Sharma, Delia Sampebua, Souvik Mahapatra, Arijit Raychowdhury, Suman Datta	2021	2
6	Modeling of HCD Kinetics Under Full V_G – V_D Space, Different Experimental Conditions and Across Different Device Architectures IEEE Journal of the Electron Devices Society ·Uma Sharma, Souvik Mahapatra	2020	4
7	TCAD Framework for HCD Kinetics in Low V_D Devices Spanning Full V_G/V_D Space IEEE Transactions on Electron Devices ·Uma Sharma, Meng Duan, Miroslav Filip, B Kamstra, Hiu Yung Wong, Fengxu Ma, Ch. R. Tolbert, Souvik Mahapatra	2020	15
8	A Review of Hot Carrier Degradation in n-Channel MOSFETs—Part II: Technology Scaling IEEE Transactions on Electron Devices ·Souvik Mahapatra, Uma Sharma	2020	19
9	A Review of Hot Carrier Degradation in n-Channel MOSFETs—Part I: Physical Mechanism IEEE Transactions on Electron Devices ·Souvik Mahapatra, Uma Sharma	2020	46
10	A TCAD Framework for Assessing NBTI Impact Under Drain Bias and Self-Heating Effects in Replacement Metal Gate (RMG) p-FinFETs Uma Sharma, Souvik Mahapatra	2020	5
11	A Cycle-by-Cycle HCD and BTI Compact Model to Calculate FinFET Based RO Ageing Using SPICE Uma Sharma, Marie VOŽDOVÁ, E Liu, Alden Netto, Souvik Mahapatra	2020	7
12	BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity Victor M. van Santen, Simon Thomann, Marie VOŽDOVÁ, Tonia Dafné González Álvarez, E Liu, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch	2020	15
13	Analysis of BTI, SHE Induced BTI and HCD Under Full V_G/V_D Space in GAA Nano-Sheet N and P FETs Nilotpal Choudhury, Uma Sharma, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra	2020	20
14	Modeling of HCD Kinetics for Full ${V}_{{G}}$ /${V}_{{D}}$ Span in the Presence of NBTI, Electron Trapping, and Self Heating in RMG SiGe p-FinFETs IEEE Transactions on Electron Devices ·Uma Sharma, Narendra Parihar, Souvik Mahapatra	2019	21
15	A SPICE Compatible Compact Model for Process and Bias Dependence of HCD in HKMG FDSOI MOSFETs DSpace (IIT Bombay) ·Uma Sharma, Souvik Mahapatra	2019	3
16	A SPICE Compatible Compact Model for Hot-Carrier Degradation in MOSFETs Under Different Experimental Conditions IEEE Transactions on Electron Devices ·Uma Sharma, Souvik Mahapatra	2018	20
17	Ultrafast Measurements and Physical Modeling of NBTI Stress and Recovery in RMG FinFETs Under Diverse DC–AC Experimental Conditions IEEE Transactions on Electron Devices ·Narendra Parihar, Uma Sharma, Richard G. Southwick, Miaomiao Wang, J. H. Stathis, Souvik Mahapatra	2017	51
18	Resolution of disputes concerning the physical mechanism and DC/AC stress/recovery modeling of Negative Bias Temperature Instability (NBTI) in p-MOSFETs Narendra Parihar, Uma Sharma, Subhadeep Mukhopadhyay, Nilesh Goel, Harto Harto, A.S. Awku, Souvik Mahapatra	2017	25
19	Improved performance and reliability of split gate source-side injected flash memory cells (unknown), K. Van Houdt, Kenneth Fox, Philip K. Chan, E. Worley, Uma Sharma, M Diani, G.P. Li	2002	7
20	Ionization radiation induced degradation of MOSFET channel frequency response IEEE Transactions on Nuclear Science ·Uma Sharma, M.H. White	1989	1

About Uma Sharma

Uma Sharma is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Aerospace Engineering, Infectious Diseases and Organic Chemistry, having authored 26 papers that have together received 325 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (24 papers), Ferroelectric and Negative Capacitance Devices (12 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Silicon Carbide Semiconductor Technologies (4 papers), Radiation Effects in Electronics (1 paper), Low-power high-performance VLSI design (1 paper) and Microwave Engineering and Waveguides (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (317 citations), Hardware and Architecture (8 citations), Materials Chemistry (23 citations), Atomic and Molecular Physics, and Optics (13 citations) and Electronic, Optical and Magnetic Materials (6 citations). Uma Sharma has collaborated with scholars based in India, United States and Germany. Frequent co-authors include Souvik Mahapatra, Narendra Parihar, Miaomiao Wang, Richard G. Southwick, J. H. Stathis, Subhadeep Mukhopadhyay, Nilesh Goel, Nilotpal Choudhury, M.H. White and Suman Datta. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Nuclear Science, Microwave and Optical Technology Letters, IEEE Journal of the Electron Devices Society and Solid-State Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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