Charles J. Vath
- Electrical and Electronic Engineering top 10%
- Mechanical Engineering top 10%
- Mechanics of Materials top 10%
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Co-authors
- Narasimalu SrikanthS. MuraliY.M. WongEric BeynePetar RatchevE.B. LiaoShiguo LiuJohn H. Lau
- Topics
- Electronic Packaging and Soldering Technologies (22 papers)3D IC and TSV technologies (18 papers)Advanced Welding Techniques Analysis (6 papers)
- Cited by
- Electrical and Electronic EngineeringMechanical EngineeringElectronic, Optical and Magnetic Materials
- Partner nations
- United StatesBelgiumSingapore
In The Last Decade
Charles J. Vath
28 papers receiving 647 citations
Peers
Comparison fields: 5 of 33
- Electrical and Electronic Engineering 624
- Mechanical Engineering 300
- Mechanics of Materials 119
- Electronic, Optical and Magnetic Materials 98
- Materials Chemistry 67
Countries citing papers authored by Charles J. Vath
This map shows the geographic impact of Charles J. Vath's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Charles J. Vath with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Charles J. Vath more than expected).
Fields of papers citing papers by Charles J. Vath
This network shows the impact of papers produced by Charles J. Vath. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Charles J. Vath. The network helps show where Charles J. Vath may publish in the future.
Co-authorship network of co-authors of Charles J. Vath
This figure shows the co-authorship network connecting the top 25 collaborators of Charles J. Vath. A scholar is included among the top collaborators of Charles J. Vath based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Charles J. Vath. Charles J. Vath is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 35 | |
| 2 | 2 | |
| 3 | 4 | |
| 4 | 16 | |
| 5 | 9 | |
| 6 | 90 | |
| 7 | 2 | |
| 8 | 8 | |
| 9 | 28 | |
| 10 | 35 | |
| 11 | 24 | |
| 12 | 67 | |
| 13 | 34 | |
| 14 | 10 | |
| 15 | 7 | |
| 16 | 102 | |
| 17 | 73 | |
| 18 | 8 | |
| 19 | 2 | |
| 20 | 9 |
About Charles J. Vath
Charles J. Vath is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering and Electronic, Optical and Magnetic Materials, having authored 28 papers that have together received 711 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (22 papers), 3D IC and TSV technologies (18 papers) and Advanced Welding Techniques Analysis (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (624 citations), Mechanical Engineering (300 citations) and Electronic, Optical and Magnetic Materials (98 citations). Charles J. Vath has collaborated with scholars based in United States, Belgium and Singapore. Frequent co-authors include Narasimalu Srikanth, S. Murali, Y.M. Wong, Eric Beyne, Petar Ratchev, E.B. Liao, Shiguo Liu, John H. Lau, Serguei Stoukatch and N. Ranganathan. Their work appears in journals such as Journal of Materials Science, Thin Solid Films and Materials Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.