V. Kripesh

2.2k citations
104 papers · 1.7k indexed · h-index 23

V. Kripesh

100 papers receiving 1.6k citations

Peers

V. Kripesh
Comparison fields: 5 of 55
  • Electrical and Electronic Engineering 1.6k
  • Automotive Engineering 234
  • Mechanical Engineering 388
  • Electronic, Optical and Magnetic Materials 178
  • General Materials Science 21
Replace Seung Wook Yoon with:
Seung Wook Yoon Singapore
Andreas Ostmann Germany
Riet Labie Belgium
P. Markondeya Raj United States
Pradeep Dixit India
Douglas C. Hopkins United States
Daquan Yu China
Venky Sundaram United States
H. Walter Germany
Cornelia Tsang United States
V. Kripesh relative to Seung Wook Yoon Singapore Seung Wook Yoon's profile →
Citations per field
00.5×1.7×
Seung Wook Yoon · 1×
Citations per year

Countries citing papers authored by V. Kripesh

Since Specialization
Citations

This map shows the geographic impact of V. Kripesh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Kripesh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Kripesh more than expected).

Fields of papers citing papers by V. Kripesh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Kripesh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Kripesh. The network helps show where V. Kripesh may publish in the future.

Co-authorship network

The 25 scholars most cited alongside V. Kripesh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with V. Kripesh Line = papers co-authored together V. Kripesh links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 201340
2 201112
3 201010
4 201020
5 20095
6 200915
7 200935
8 20081
9 20076
10 200621
11 20068
12 200612
13 20062
14 20061
15 20052
16 20050
17 20058
18 200516
19 20041
20 200210

About V. Kripesh

V. Kripesh is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Automotive Engineering, Mechanical Engineering and Biomedical Engineering, having authored 104 papers that have together received 1.7k indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (78 papers), 3D IC and TSV technologies (73 papers), Copper Interconnects and Reliability (18 papers), Advanced MEMS and NEMS Technologies (9 papers), Nanofabrication and Lithography Techniques (8 papers), Additive Manufacturing and 3D Printing Technologies (8 papers), Electromagnetic Compatibility and Noise Suppression (7 papers) and Advanced Surface Polishing Techniques (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.6k citations), Automotive Engineering (234 citations), Mechanical Engineering (388 citations), Electronic, Optical and Magnetic Materials (178 citations) and General Materials Science (21 citations). V. Kripesh has collaborated with scholars based in Singapore, United States and Taiwan. Frequent co-authors include John H. Lau, A.A.O. Tay, Seung Wook Yoon, Mohan Kumar Kesarla, Navas Khan, Soon Wee Ho, D. Pinjala, Xiaowu Zhang, Aditya Kumar and T.C. Chai. Their work appears in journals such as IEEE Transactions on Components Packaging and Manufacturing Technology, IEEE Transactions on Advanced Packaging, IEEE Transactions on Components and Packaging Technologies, Sensors and Actuators A Physical and Nanotechnology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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