Saman Adham

505 citations

22 papers · 312 indexed · h-index 8

Impact in

Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
- Parallel Computing and Optimization Techniques
Electrical and Electronic Engineering
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
- Ferroelectric and Negative Capacitance Devices
- Semiconductor materials and devices
- 3D IC and TSV technologies
- Radiation Effects in Electronics

Papers in

Hardware and Architecture 17
- VLSI and Analog Circuit Testing 16
Electrical and Electronic Engineering 20
- Integrated Circuits and Semiconductor Failure Analysis 14
- Advancements in PLL and VCO Technologies 4
- 3D IC and TSV technologies 4
- Semiconductor materials and devices 4
- Radio Frequency Integrated Circuit Design 2

Co-authors: Yuejian Wu Benoit Nadeau-Dostie Kerem Akarvardar Mei‐Chen Chuang Tsung-Yung Jonathan Chang H. Mori Hidehiro Fujiwara Yu-Der Chih
Journals: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1 paper)IEEE Journal of Solid-State Circuits (1 paper)IEEE Communications Magazine (1 paper)2022 IEEE International Solid- State Circuits Conference (ISSCC) (1 paper)IEEE Design & Test of Computers (1 paper)
Partner nations: Canada Taiwan United States

In The Last Decade

Saman Adham

19 papers receiving 304 citations

Peers

Countries citing papers authored by Saman Adham

Since Specialization

Citations

This map shows the geographic impact of Saman Adham's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Saman Adham with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Saman Adham more than expected).

Fields of papers citing papers by Saman Adham

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Saman Adham. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Saman Adham. The network helps show where Saman Adham may publish in the future.

Co-authors

The 25 scholars most cited alongside Saman Adham, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Saman Adham Line = papers co-authored together Saman Adham links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	A 5-nm 254-TOPS/W 221-TOPS/mm² Fully-Digital Computing-in-Memory Macro Supporting Wide-Range Dynamic-Voltage-Frequency Scaling and Simultaneous MAC and Write Operations 2022 IEEE International Solid- State Circuits Conference (ISSCC) ·Hidehiro Fujiwara, H. Mori, Meshal Fawaz Aldhamen, Mei‐Chen Chuang, Rawan Naous, Yirong Yin, 陳里菜, Dar Sun, Chia-Fu Lee, Kerem Akarvardar, Saman Adham, Tan‐Li Chou, Mahmut E. Sinangil, Yuxiao Wang, Yu-Der Chih, Yen-Huei Chen, Hung-Jen Liao, Tsung-Yung Jonathan Chang	2022	134
2	A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering Shih‐Lien Lu, Julien Deborde, M. Carmen Millón, Saman Adham, Ted Wong, Jonathan Chang	2019	2
3	A novel DFT architecture for 3DIC test, diagnosis and repair Haya Ghannouma, Saman Adham, Anthony P. Opatz, Zhaleh Sadeghian, Hung‐Chih Lin, Yige Li, Hao Chen	2014	2
4	Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoS<sup>TM</sup>/3D ICs Sandeep Goel, Stefan Paetzold, Saman Adham, Ashok Mehta, Frank Lee	2014	1
5	The importance of DFX, a foundry perspective Saman Adham, Jonathan Chang, SEVİM ALIŞIR HAMAMCI, 雅子永本, 胡盛娟	2014	0
6	A 1 Tbit/s Bandwidth 1024 b PLL/DLL-Less eDRAM PHY Using 0.3 V 0.105 mW/Gbps Low-Swing IO for CoWoS Application IEEE Journal of Solid-State Circuits ·Patricia Van Vlaenderen, 寺島哲郎, N Nanvayat, Wen-Hung Huang, Mahmoud Shams-Shargh, 趙書珣, N MYUNG-SANGMOO, Yuexin Jiang, 處直村上, Dekumyoy, Jamison M. Kinnane, Saman Adham, Anthony P. Opatz, Esteban Quiros, Ashok Mehta	2014	9
7	An extra low-power 1Tbit/s bandwidth PLL/DLL-less eDRAM PHY using 0.3V low-swing IO for 2.5D CoWoS application Patricia Van Vlaenderen, 寺島哲郎, N Nanvayat, Wen-Hung Huang, Mahmoud Shams-Shargh, 趙書珣, N MYUNG-SANGMOO, Yuexin Jiang, 處直村上, Dekumyoy, Jamison M. Kinnane, Saman Adham, Anthony P. Opatz, Esteban Quiros, Ashok Mehta	2013	6
8	Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case study Sandeep Goel, Saman Adham, Anthony P. Opatz, C. E. U. Moncada, Jamison M. Kinnane, Ashok Mehta, Frank Lee, Vivek Chickermane, Brion Keller, Robert R. Shenk, U. R. Acharya, Hillel Kargupta, Jeongho Cho, Dao Hong Thi Le, 张鼎杰, 俊也道幸	2013	24
9	Improved Core Isolation and Access for Hierarchical Embedded Test IEEE Design & Test of Computers ·Benoit Nadeau-Dostie, Saman Adham, Russell J. Abbott	2009	8
10	Preliminary Outline of the IEEE PI 500 Scalable Architecture for Testing Embedded Cores Saman Adham, Guilherme Campos de Castro, Yeni Afni Fajrin, Michelle Collins, Ricardo A. Palmquist, A.J Buitrago, Erik Jan Marinissen, Teresa McLaurin, Rosemary Morrow, Tuğba Alibaş, F.D. Queiroz, R. Rajsuman, Daniel Migwi, Morad Jafarzadehkhoushroudi, Darcy S Jenkins-Holick, P. Varma, L. Whetsel, Shan Cheng-nan, Y. Zorian	2005	0
11	A BIST algorithm for bit/group write enable faults in SRAMs Saman Adham, Benoit Nadeau-Dostie	2004	4
12	BIST fault diagnosis in scan-based VLSI environments Yuejian Wu, Saman Adham	2002	33
13	Linking diagnostic software to hardware self test in telecom systems Juliana de Lima Paschoal, Sami A. Fam, Saman Adham	2002	7
14	Arithmetic built-in self-test for digital signal processing architectures Saman Adham, Mark Kassab, Nilanjan Mukherjee, Katarzyna Radecka, Janusz Rajski, Jerzy Tyszer	2002	7
15	A 5 Gb/s 9-port application specific SRAM with built-in self test Jordi Corona Colldeforn, Charalampos L. Kandilakis, Saman Adham, Benoit Nadeau-Dostie	2002	13
16	A new hardware fault insertion scheme for system diagnostics verification Benoit Nadeau-Dostie, Juliana de Lima Paschoal, Saman Adham	2002	6
17	Linking diagnostic software to hardware self test in telecom systems IEEE Communications Magazine ·Saman Adham, 徐国艳, Tomoko Iwaeda, M. Bugas, Sami A. Fam	1999	4
18	Design for testability method for CML digital circuits Rekha Tulsan, Yvon Savaria, Saman Adham, CORNET	1999	0
19	Scan-based BIST fault diagnosis IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Yuejian Wu, Saman Adham	1999	47
20	Built-in self test of digital decimators IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ·Saman Adham, Mark Kassab, J. Rajski, Jerzy Tyszer	1995	1

About Saman Adham

Saman Adham is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Software, Control and Systems Engineering and Automotive Engineering, having authored 22 papers that have together received 312 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (16 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Engineering and Test Systems (5 papers), Advancements in PLL and VCO Technologies (4 papers), 3D IC and TSV technologies (4 papers), Semiconductor materials and devices (4 papers), Radio Frequency Integrated Circuit Design (2 papers) and Nanofabrication and Lithography Techniques (2 papers). The work is most often cited by research in Hardware and Architecture (198 citations), Electrical and Electronic Engineering (277 citations), Control and Systems Engineering (33 citations), Software (5 citations) and Computer Networks and Communications (29 citations). Saman Adham has collaborated with scholars based in Canada, Taiwan and United States. Frequent co-authors include Yuejian Wu, Benoit Nadeau-Dostie, Kerem Akarvardar, Mei‐Chen Chuang, Tsung-Yung Jonathan Chang, H. Mori, Hidehiro Fujiwara, Yu-Der Chih, Tan‐Li Chou and Dar Sun. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Journal of Solid-State Circuits, IEEE Communications Magazine, 2022 IEEE International Solid- State Circuits Conference (ISSCC) and IEEE Design & Test of Computers.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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