Benoit Nadeau-Dostie

927 total citations
36 papers, 678 citations indexed

About

Benoit Nadeau-Dostie is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering. According to data from OpenAlex, Benoit Nadeau-Dostie has authored 36 papers receiving a total of 678 indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 33 papers in Hardware and Architecture and 12 papers in Control and Systems Engineering. Recurrent topics in Benoit Nadeau-Dostie's work include VLSI and Analog Circuit Testing (32 papers), Integrated Circuits and Semiconductor Failure Analysis (25 papers) and Engineering and Test Systems (12 papers). Benoit Nadeau-Dostie is often cited by papers focused on VLSI and Analog Circuit Testing (32 papers), Integrated Circuits and Semiconductor Failure Analysis (25 papers) and Engineering and Test Systems (12 papers). Benoit Nadeau-Dostie collaborates with scholars based in United States, Canada and France. Benoit Nadeau-Dostie's co-authors include V.K. Agarwal, A.S.M. Hassan, J. Rajski, Nur A. Touba, Joon-Sung Yang, Jerzy Tyszer, Saman Adham, Grzegorz Mrugalski, Nilanjan Mukherjee and Janusz Rajski and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, Computer and IEEE Transactions on Computers.

In The Last Decade

Benoit Nadeau-Dostie

33 papers receiving 621 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Benoit Nadeau-Dostie United States 14 633 621 86 38 29 36 678
Chi-Feng Wu Taiwan 12 572 0.9× 541 0.9× 63 0.7× 135 3.6× 29 1.0× 31 658
Kee Sup Kim United States 11 770 1.2× 572 0.9× 41 0.5× 56 1.5× 19 0.7× 25 799
I. Bayraktaroglu United States 13 681 1.1× 676 1.1× 134 1.6× 32 0.8× 22 0.8× 36 721
H. Guzmán-Miranda Spain 12 439 0.7× 295 0.5× 40 0.5× 62 1.6× 49 1.7× 50 472
Martin Keim United States 11 529 0.8× 486 0.8× 32 0.4× 7 0.2× 20 0.7× 48 584
S. Cherubal United States 13 598 0.9× 540 0.9× 71 0.8× 23 0.6× 4 0.1× 22 651
Vikram Iyengar United States 10 482 0.8× 495 0.8× 50 0.6× 73 1.9× 15 0.5× 20 526
Yuejian Wu Canada 10 289 0.5× 263 0.4× 25 0.3× 23 0.6× 6 0.2× 28 318
Yiorgos Tsiatouhas Greece 11 603 1.0× 323 0.5× 15 0.2× 26 0.7× 6 0.2× 113 631
P.N. Variyam United States 9 397 0.6× 373 0.6× 53 0.6× 12 0.3× 4 0.1× 16 440

Countries citing papers authored by Benoit Nadeau-Dostie

Since Specialization
Citations

This map shows the geographic impact of Benoit Nadeau-Dostie's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Benoit Nadeau-Dostie with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Benoit Nadeau-Dostie more than expected).

Fields of papers citing papers by Benoit Nadeau-Dostie

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Benoit Nadeau-Dostie. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Benoit Nadeau-Dostie. The network helps show where Benoit Nadeau-Dostie may publish in the future.

Co-authorship network of co-authors of Benoit Nadeau-Dostie

This figure shows the co-authorship network connecting the top 25 collaborators of Benoit Nadeau-Dostie. A scholar is included among the top collaborators of Benoit Nadeau-Dostie based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Benoit Nadeau-Dostie. Benoit Nadeau-Dostie is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Nadeau-Dostie, Benoit, et al.. (2023). Transitioning eMRAM from Pilot Project to Volume Production. 82–86. 1 indexed citations
2.
Yun, Jongsin, et al.. (2020). MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. 1–5. 5 indexed citations
3.
Nadeau-Dostie, Benoit, et al.. (2018). Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. 43–48. 2 indexed citations
4.
Garg, Uttam, et al.. (2017). Adapting an industrial memory BIST solution for testing CAMs. 3. 112–117. 1 indexed citations
5.
Lin, Xijiang, et al.. (2011). Power Aware Embedded Test. 511–516. 5 indexed citations
6.
Yang, Joon-Sung, Nur A. Touba, & Benoit Nadeau-Dostie. (2011). Test Point Insertion with Control Points Driven by Existing Functional Flip-Flops. IEEE Transactions on Computers. 61(10). 1473–1483. 27 indexed citations
7.
Yang, Joon-Sung, Benoit Nadeau-Dostie, & Nur A. Touba. (2009). Test point insertion using functional flip-flops to drive control points. 1–10. 11 indexed citations
8.
Nadeau-Dostie, Benoit, et al.. (2008). Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks. 1–10. 24 indexed citations
9.
Nadeau-Dostie, Benoit, et al.. (2005). ScanBist A Multi-frequency Scan-Based BIST Method. 3. 506–506.
10.
Nadeau-Dostie, Benoit, et al.. (2005). Structural test with functional characteristics. 45–48. 4 indexed citations
11.
Adham, Saman & Benoit Nadeau-Dostie. (2004). A BIST algorithm for bit/group write enable faults in SRAMs. 98–101. 4 indexed citations
12.
Nadeau-Dostie, Benoit, et al.. (2003). An embedded technique for at-speed interconnect testing. 431–438. 28 indexed citations
13.
Agarwal, V.K., et al.. (2002). A new procedure for weighted random built-in self-test. 660–669. 111 indexed citations
14.
Nadeau-Dostie, Benoit. (2002). Design for AT-Speed Test, Diagnosis and Measurement. Kluwer Academic Publishers eBooks. 48 indexed citations
15.
Adham, Saman, et al.. (2002). A 5 Gb/s 9-port application specific SRAM with built-in self test. 68–73. 13 indexed citations
16.
Nadeau-Dostie, Benoit, et al.. (2002). A new hardware fault insertion scheme for system diagnostics verification. 994–1002. 6 indexed citations
17.
Nadeau-Dostie, Benoit, et al.. (2002). A high speed embedded cache design with non-intrusive BIST. 40–45. 12 indexed citations
18.
Jarwala, N., et al.. (1996). Built-in self-test: assuring system integrity. Computer. 29(11). 39–45. 11 indexed citations
19.
Nadeau-Dostie, Benoit, et al.. (1994). ScanBist: a multifrequency scan-based BIST method. IEEE Design & Test of Computers. 11(1). 7–17. 39 indexed citations
20.
Phillips, Ryan S., et al.. (1993). A 180 MHz 0.8 mu m BiCMOS modular memory family of DRAM and multiport SRAM. IEEE Journal of Solid-State Circuits. 28(3). 222–232. 20 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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