Yuejian Wu

703 citations

28 papers · 318 indexed · h-index 10

Co-authors: Saman Adham A. Ivanov Sandeep K. S. Gupta Han Sun Kuang-Tsan Wu Baosheng Wang Jiwen Lu Haibin Yan
Topics: VLSI and Analog Circuit Testing (21 papers)Integrated Circuits and Semiconductor Failure Analysis (12 papers)Low-power high-performance VLSI design (9 papers)
Cited by: Hardware and Architecture Electrical and Electronic Engineering Industrial and Manufacturing Engineering
Journals: IEEE Transactions on Computers IEEE Transactions on Circuits and Systems for Video Technology IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Partner nations: Canada United States China

In The Last Decade

Yuejian Wu

26 papers receiving 301 citations

Peers

Countries citing papers authored by Yuejian Wu

Since Specialization

Citations

This map shows the geographic impact of Yuejian Wu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yuejian Wu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yuejian Wu more than expected).

Fields of papers citing papers by Yuejian Wu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yuejian Wu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yuejian Wu. The network helps show where Yuejian Wu may publish in the future.

Co-authorship network of co-authors of Yuejian Wu

This figure shows the co-authorship network connecting the top 25 collaborators of Yuejian Wu. A scholar is included among the top collaborators of Yuejian Wu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yuejian Wu. Yuejian Wu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Promising DSP Techniques to Increase Long Haul Transmission Capacity 2023 ·Domaniç Lavery,(unknown),Carlo Condo,Mohamed Morsy-Osman,Mehdi Torbatian,(unknown),Yuejian Wu,Robert Maher,Han Sun	2
2	Novel 16QAM carrier recovery based on blind phase search 2014 ·Han Sun,Kuang-Tsan Wu,(unknown),Yuejian Wu	16
3	Free Razor: A Novel Voltage Scaling Low-Power Technique for Large SoC Designs 2014 ·IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·Yuejian Wu,(unknown),Han Sun,David Krause,(unknown),(unknown)	4
4	Effect of Shrinkage-Reducing on Early-Age Concrete Poured with Controlled Permeability Formwork 2012 ·Zhenghong Tian,Hongxia Liu,Yuejian Wu	1
5	On multiple intermediate signature analysis for built-in self-test 2009 ·Open Collections ·Yuejian Wu	1
6	Built-In Functional Tests for Silicon Validation and System Integration of Telecom SoC Designs 2009 ·IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·Yuejian Wu,(unknown),(unknown),(unknown)	8
7	Low power clocking strategies in deep submicron technologies 2008 ·(unknown),Yuejian Wu	14
8	Built-in functional tests for fast validation of a 40Gbps coherent optical receiver SoC ASIC 2008 ·Yuejian Wu,(unknown),Han Sun,Chandra S. Bontu,(unknown)	2
9	Low Power SoC Memory BIST 2006 ·Yuejian Wu,A. Ivanov	7
10	Fast detection of data retention faults and other SRAM cell open defects 2005 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·(unknown),Baosheng Wang,Yuejian Wu,A. Ivanov	13
11	A retention-aware test power model for embedded SRAM 2005 ·Baosheng Wang,(unknown),Yuejian Wu,A. Ivanov	3
12	A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs 2005 ·Design, Automation, and Test in Europe ·Baosheng Wang,Yuejian Wu,A. Ivanov	5
13	Design and test of a 9-port SRAM for a 100 Gb/s STS-1 switch 2003 ·(unknown),(unknown),(unknown),(unknown),Yuejian Wu	1
14	Testing asics with multiple identical cores 2003 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Yuejian Wu,(unknown)	20
15	BIST fault diagnosis in scan-based VLSI environments 2002 ·Yuejian Wu,Saman Adham	33
16	Shadow write and read for at-speed BIST of TDM SRAMs 2002 ·Yuejian Wu,(unknown)	1
17	Diagnosis of scan chain failures 2002 ·Yuejian Wu	77
18	Scan-based BIST fault diagnosis 1999 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Yuejian Wu,Saman Adham	47
19	Interconnect delay fault testing with IEEE 1149.1 1999 ·Yuejian Wu,(unknown)	2
20	Single-reference multiple intermediate signature (SREMIS) analysis for BIST 1995 ·IEEE Transactions on Computers ·Yuejian Wu,A. Ivanov	10

About Yuejian Wu

Yuejian Wu is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Computer Networks and Communications, having authored 28 papers that have together received 318 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Low-power high-performance VLSI design (9 papers). The work is most often cited by research in Hardware and Architecture (263 citations), Electrical and Electronic Engineering (289 citations) and Industrial and Manufacturing Engineering (21 citations). Yuejian Wu has collaborated with scholars based in Canada, United States and China. Frequent co-authors include Saman Adham, A. Ivanov, Sandeep K. S. Gupta, Han Sun, Kuang-Tsan Wu, Baosheng Wang, Jiwen Lu, Baosheng Wang, Haibin Yan and David Krause. Their work appears in journals such as IEEE Transactions on Computers, IEEE Transactions on Circuits and Systems for Video Technology and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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