Yuejian Wu

703 total citations
28 papers, 318 citations indexed

About

Yuejian Wu is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, Yuejian Wu has authored 28 papers receiving a total of 318 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 22 papers in Hardware and Architecture and 4 papers in Computer Networks and Communications. Recurrent topics in Yuejian Wu's work include VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Low-power high-performance VLSI design (9 papers). Yuejian Wu is often cited by papers focused on VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Low-power high-performance VLSI design (9 papers). Yuejian Wu collaborates with scholars based in Canada, United States and China. Yuejian Wu's co-authors include Saman Adham, A. Ivanov, Sandeep K. S. Gupta, Han Sun, Kuang-Tsan Wu, Baosheng Wang, Baosheng Wang, Haibin Yan, Jiwen Lu and David Krause and has published in prestigious journals such as IEEE Transactions on Computers, IEEE Transactions on Circuits and Systems for Video Technology and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

In The Last Decade

Yuejian Wu

26 papers receiving 301 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Yuejian Wu Canada 10 289 263 25 23 21 28 318
T.W. Williams United States 7 294 1.0× 260 1.0× 25 1.0× 22 1.0× 11 0.5× 15 336
Ilgweon Kang United States 7 224 0.8× 148 0.6× 10 0.4× 36 1.6× 23 1.1× 21 273
Saman Adham Canada 8 277 1.0× 198 0.8× 33 1.3× 29 1.3× 4 0.2× 22 312
L.M. Huisman United States 12 472 1.6× 494 1.9× 60 2.4× 30 1.3× 38 1.8× 30 543
K. Baker Netherlands 11 321 1.1× 311 1.2× 27 1.1× 32 1.4× 5 0.2× 30 371
C. Hora Netherlands 13 482 1.7× 447 1.7× 36 1.4× 7 0.3× 29 1.4× 27 507
Sreejit Chakravarty United States 13 507 1.8× 485 1.8× 55 2.2× 19 0.8× 17 0.8× 57 538
P.N. Variyam United States 9 397 1.4× 373 1.4× 53 2.1× 12 0.5× 11 0.5× 16 440
Yiorgos Tsiatouhas Greece 11 603 2.1× 323 1.2× 15 0.6× 26 1.1× 6 0.3× 113 631
H. Hashempour United States 12 392 1.4× 278 1.1× 28 1.1× 15 0.7× 11 0.5× 32 412

Countries citing papers authored by Yuejian Wu

Since Specialization
Citations

This map shows the geographic impact of Yuejian Wu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yuejian Wu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yuejian Wu more than expected).

Fields of papers citing papers by Yuejian Wu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yuejian Wu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yuejian Wu. The network helps show where Yuejian Wu may publish in the future.

Co-authorship network of co-authors of Yuejian Wu

This figure shows the co-authorship network connecting the top 25 collaborators of Yuejian Wu. A scholar is included among the top collaborators of Yuejian Wu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yuejian Wu. Yuejian Wu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wu, Yuejian, et al.. (2014). Free Razor: A Novel Voltage Scaling Low-Power Technique for Large SoC Designs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23(11). 2431–2437. 4 indexed citations
2.
Sun, Han, et al.. (2014). Novel 16QAM carrier recovery based on blind phase search. 1–3. 16 indexed citations
3.
Tian, Zhenghong, Hongxia Liu, & Yuejian Wu. (2012). Effect of Shrinkage-Reducing on Early-Age Concrete Poured with Controlled Permeability Formwork. 33. 647–654. 1 indexed citations
5.
Wu, Yuejian, et al.. (2008). Low power clocking strategies in deep submicron technologies. 143–146. 14 indexed citations
6.
Wu, Yuejian, et al.. (2008). Built-in functional tests for fast validation of a 40Gbps coherent optical receiver SoC ASIC. 18. 55–58. 2 indexed citations
7.
Wu, Yuejian & A. Ivanov. (2006). Low Power SoC Memory BIST. 197–205. 7 indexed citations
8.
Wang, Baosheng, et al.. (2005). Fast detection of data retention faults and other SRAM cell open defects. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25(1). 167–180. 13 indexed citations
9.
Wang, Baosheng, et al.. (2005). A retention-aware test power model for embedded SRAM. 1180–1180. 3 indexed citations
10.
Wang, Baosheng, Yuejian Wu, & A. Ivanov. (2005). A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs. Design, Automation, and Test in Europe. 852–857. 5 indexed citations
11.
Wu, Yuejian, et al.. (2003). Design and test of a 9-port SRAM for a 100 Gb/s STS-1 switch. 83–87. 1 indexed citations
12.
Wu, Yuejian, et al.. (2003). Testing asics with multiple identical cores. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 22(3). 327–336. 20 indexed citations
13.
Wu, Yuejian & A. Ivanov. (2003). Accelerated path delay fault simulation. 1–6. 4 indexed citations
14.
Wu, Yuejian & Saman Adham. (2002). BIST fault diagnosis in scan-based VLSI environments. 48–57. 33 indexed citations
15.
Wu, Yuejian, et al.. (2002). Shadow write and read for at-speed BIST of TDM SRAMs. 985–994. 1 indexed citations
16.
Wu, Yuejian. (2002). Diagnosis of scan chain failures. 217–222. 77 indexed citations
17.
Wu, Yuejian & A. Ivanov. (2002). Minimal hardware multiple signature analysis for BIST. 17–20. 1 indexed citations
18.
Wu, Yuejian & Saman Adham. (1999). Scan-based BIST fault diagnosis. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 18(2). 203–211. 47 indexed citations
19.
Wu, Yuejian, et al.. (1999). Interconnect delay fault testing with IEEE 1149.1. 34. 449–457. 2 indexed citations
20.
Wu, Yuejian & A. Ivanov. (1995). Single-reference multiple intermediate signature (SREMIS) analysis for BIST. IEEE Transactions on Computers. 44(6). 817–825. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Rankless by CCL
2026