C. Barillot
Impact in
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
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- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
Papers in
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- VLSI and Analog Circuit Testing 4
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- Radiation Detection and Scintillator Technologies 3
- Co-authors
- P. CalvelR. EcoffetS. DuzellierR. MarecD. FalguèreC. ChatryPhilippe C. AdellRonald D. Schrimpf
- Partner nations
- FranceUnited StatesNetherlands
In The Last Decade
C. Barillot
18 papers receiving 323 citations
Peers
Comparison fields: 5 of 34
- Hardware and Architecture 78
- Electrical and Electronic Engineering 316
- Radiation 44
- Nuclear and High Energy Physics 43
- Safety, Risk, Reliability and Quality 15
Countries citing papers authored by C. Barillot
This map shows the geographic impact of C. Barillot's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Barillot with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Barillot more than expected).
Fields of papers citing papers by C. Barillot
This network shows the impact of papers produced by C. Barillot. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Barillot. The network helps show where C. Barillot may publish in the future.
Co-authorship network
The 25 scholars most cited alongside C. Barillot, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 1 | |
| 2 | 2019 | 5 | |
| 3 | 2016 | 5 | |
| 4 | 2013 | 2 | |
| 5 | 2013 | 4 | |
| 6 | 2008 | 11 | |
| 7 | 2005 | 6 | |
| 8 | Updating the X-dose enhancement factor in recent technologies | 2003 | 2 |
| 9 | 2002 | 2 | |
| 10 | 2002 | 0 | |
| 11 | 2002 | 12 | |
| 12 | 2002 | 4 | |
| 13 | 2002 | 0 | |
| 14 | 2002 | 24 | |
| 15 | 2000 | 119 | |
| 16 | 1998 | 10 | |
| 17 | 1996 | 7 | |
| 18 | 1996 | 99 | |
| 19 | 1994 | 31 | |
| 20 | 1992 | 1 |
About C. Barillot
C. Barillot is a scholar working on Hardware and Architecture, Radiation, Electrical and Electronic Engineering, Aerospace Engineering and Nuclear and High Energy Physics, having authored 20 papers that have together received 345 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (16 papers), Semiconductor materials and devices (8 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), VLSI and Analog Circuit Testing (4 papers), Electrostatic Discharge in Electronics (3 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Radiation Detection and Scintillator Technologies (3 papers) and Radiation Shielding Materials Analysis (2 papers). The work is most often cited by research in Hardware and Architecture (78 citations), Electrical and Electronic Engineering (316 citations), Radiation (44 citations), Nuclear and High Energy Physics (43 citations) and Safety, Risk, Reliability and Quality (15 citations). C. Barillot has collaborated with scholars based in France, United States and Netherlands. Frequent co-authors include P. Calvel, R. Ecoffet, S. Duzellier, R. Marec, D. Falguère, C. Chatry, Philippe C. Adell, Ronald D. Schrimpf, Hugh Barnaby and E. G. Stassinopoulos. Their work appears in journals such as IEEE Transactions on Nuclear Science and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.