D.C. Mayer

1.1k total citations
41 papers, 884 citations indexed

About

D.C. Mayer is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, D.C. Mayer has authored 41 papers receiving a total of 884 indexed citations (citations by other indexed papers that have themselves been cited), including 40 papers in Electrical and Electronic Engineering, 4 papers in Atomic and Molecular Physics, and Optics and 2 papers in Computational Mechanics. Recurrent topics in D.C. Mayer's work include Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Radiation Effects in Electronics (12 papers). D.C. Mayer is often cited by papers focused on Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Radiation Effects in Electronics (12 papers). D.C. Mayer collaborates with scholars based in United States and Canada. D.C. Mayer's co-authors include R.C. Lacoe, J.V. Osborn, S.C. Witczak, Ronald D. Schrimpf, Daniel M. Fleetwood, K.F. Galloway, R. Koga, Stephanie Brown, R.L. Pease and S. D. LaLumondiere and has published in prestigious journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

D.C. Mayer

37 papers receiving 823 citations

Peers

Countries citing papers authored by D.C. Mayer

Since Specialization

Citations

This map shows the geographic impact of D.C. Mayer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.C. Mayer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.C. Mayer more than expected).

Fields of papers citing papers by D.C. Mayer

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.C. Mayer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.C. Mayer. The network helps show where D.C. Mayer may publish in the future.

Co-authorship network of co-authors of D.C. Mayer

This figure shows the co-authorship network connecting the top 25 collaborators of D.C. Mayer. A scholar is included among the top collaborators of D.C. Mayer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D.C. Mayer. D.C. Mayer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	The Impact of Radiation-Induced Failure Mechanisms in Electronic Components on System Reliability 2007 ·IEEE Transactions on Nuclear Science ·D.C. Mayer, (unknown), (unknown)	6
2	Total-dose tolerance of the commercial American Microsystems Inc. (AMI) 0.35-μm CMOS process 2005 ·R.C. Lacoe, J.V. Osborn, D.C. Mayer, Stephanie Brown	3
3	Reliability enhancement in high-performance MOSFETs by annular transistor design 2004 ·IEEE Transactions on Nuclear Science ·D.C. Mayer, R.C. Lacoe, E. E. King, J.V. Osborn	28
4	Total-dose tolerance of a chartered semiconductor 0.35-μm CMOS process 2003 ·R.C. Lacoe, J.V. Osborn, D.C. Mayer, S.C. Witczak, Stephanie Brown, (unknown), (unknown)	14
5	Native silicon oxide agglomeration prior to solid-phase epitaxy using rapid thermal processing 2002 ·D. Leung, (unknown), (unknown), (unknown), D.C. Mayer	0
6	Single ion induced multiple-bit upset in IDT 256K SRAMs 2002 ·R. Koga, K.B. Crawford, (unknown), W. A. Kolasinski, D. Leung, (unknown), D.C. Mayer, S.D. Pinkerton, (unknown)	13
7	Microtechnology for space systems 2002 ·Siegfried Janson, Henry Helvajian, (unknown), (unknown), D.C. Mayer, (unknown)	20
8	Wavelength dependence of transient laser-induced latchup in epi-CMOS test structures 2002 ·IEEE Transactions on Nuclear Science ·S. D. LaLumondiere, R. Koga, J.V. Osborn, D.C. Mayer, R.C. Lacoe, Steven C. Moss	10
9	Formation of a bonded SOI interface using a spin-on dielectric 2002 ·(unknown), (unknown), (unknown), D.C. Mayer	1
10	Total-dose tolerance of the commercial Taiwan Semiconductor Manufacturing Company (TSMC) 0.35-μm CMOS process 2002 ·R.C. Lacoe, J.V. Osborn, D.C. Mayer, Stephanie Brown, (unknown)	23
11	Report of the Odyssey FPGA Independent Assessment Team 2001 ·D.C. Mayer, Richard B. Katz, J.V. Osborn, J.M. Soden, (unknown), John H. Day	1
12	Charge separation technique for metal–oxide–silicon capacitors in the presence of hydrogen deactivated dopants 2000 ·Journal of Applied Physics ·S.C. Witczak, P.S. Winokur, R.C. Lacoe, D.C. Mayer	8
13	Space charge limited degradation of bipolar oxides at low electric fields 1998 ·IEEE Transactions on Nuclear Science ·S.C. Witczak, R.C. Lacoe, D.C. Mayer, Daniel M. Fleetwood, Ronald D. Schrimpf, K.F. Galloway	107
14	Total dose hardness of three commercial CMOS microelectronics foundries 1998 ·IEEE Transactions on Nuclear Science ·J.V. Osborn, R.C. Lacoe, D.C. Mayer, (unknown)	47
15	Failure analysis of high power GaAs-based lasers using electron beam induced current analysis and transmission electron microscopy 1998 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·R. E. Mallard, (unknown), D.C. Mayer, (unknown)	8
16	Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures 1997 ·IEEE Transactions on Nuclear Science ·S.C. Witczak, Ronald D. Schrimpf, Daniel M. Fleetwood, K.F. Galloway, R.C. Lacoe, D.C. Mayer, James M. Puhl, R.L. Pease, John S. Suehle	114
17	A high-speed submicrometer CMOS/SOS process in spear material 1985 ·D.C. Mayer, P.K. Vasudev, A. Schmitz, (unknown)	6
18	A low-leakage VLSI CMOS/SOS process with thin EPI layers 1983 ·(unknown), D.C. Mayer, P.K. Vasudev	2
19	Strain-induced anisotropy measurement in oxide films grown on silicon 1982 ·Applied Optics ·(unknown), D.C. Mayer, O. M. Stafsudd, (unknown)	6
20	A vertical-junction field-effect transistor 1980 ·IEEE Transactions on Electron Devices ·D.C. Mayer, (unknown), R.J. Lomax	5

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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