P. Roitman

706 citations

51 papers · 487 indexed · h-index 11

Impact in

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Thin-Film Transistor Technologies
- Silicon and Solar Cell Technologies
- Radiation Effects in Electronics
Structural Biology

Papers in

Electrical and Electronic Engineering 48
- Semiconductor materials and devices 40
- Advancements in Semiconductor Devices and Circuit Design 23
- Integrated Circuits and Semiconductor Failure Analysis 20
- Silicon and Solar Cell Technologies 9
Surfaces, Coatings and Films 4
- Electron and X-Ray Spectroscopy Techniques 4

Co-authors: John F. Conley Patrick M. Lenahan S. J. Krause M.J. Anc Robert E. Stahlbush G.J. Campisi J.B. McKitterick W. Maszara
Journals: IEEE Transactions on Electron Devices (6 papers)IEEE Transactions on Nuclear Science (6 papers)Applied Physics Letters (5 papers)Journal of Applied Physics (3 papers)Journal of Electronic Materials (1 paper)
Partner nations: United States Egypt Ireland

In The Last Decade

P. Roitman

40 papers receiving 461 citations

Peers

Countries citing papers authored by P. Roitman

Since Specialization

Citations

This map shows the geographic impact of P. Roitman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Roitman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Roitman more than expected).

Fields of papers citing papers by P. Roitman

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Roitman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Roitman. The network helps show where P. Roitman may publish in the future.

Co-authors

The 25 scholars most cited alongside P. Roitman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P. Roitman Line = papers co-authored together P. Roitman links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Effect of Thermal Ramping and Annealing Conditions on Defect Formation in Oxygen Implanted Silicon-On-Insulator Material S. J. Krause, J.C. Park, J.D. Lee, M. K. El-Ghor, P. Roitman	2005	0
2	Electron Traps, Structural Change, and Hydrogen Related Simox Defects John F. Conley, Patrick M. Lenahan, P. Roitman	2005	0
3	Effect of anneal temperature on Si/buried oxide interface roughness of SIMOX Christopher B. Jacobs, A. P. Genis, L.P. Allen, P. Roitman	2002	2
4	Observation of latent reliability degradation in ultrathin oxides after heavy-ion irradiation Applied Physics Letters ·John S. Suehle, Eric M. Vogel, P. Roitman, John F. Conley, Allan H. Johnston, Bin Wang, J.B. Bernstein, C. Weintraub	2002	41
5	A SIMS study of the deuterium distribution in SIMOX buried oxides G.J. Campisi, P. Roitman, David S. Simons, W. Krull	2002	0
6	Residual defects in SIMOX: threading dislocations and pipes P. Roitman, Monica D. Edelstein, S. J. Krause, S. Visitserngtrukul	2002	1
7	<title>Simulation of graded video impairment by weighted summation: validation of the methodology</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·John M. Libert, C.P. Fenimore, P. Roitman	1999	5
8	Mechanism of defect formation in low-dose oxygen implanted silicon-on-insulator material Journal of Electronic Materials ·S. Bagchi, J. D. Lee, S. J. Krause, P. Roitman	1996	11
9	Stacking fault pyramid formation and energetics in silicon-on-insulator material formed by multiple cycles of oxygen implantation and annealing Applied Physics Letters ·J. D. Lee, J. C. Park, D. Venables, S. J. Krause, P. Roitman	1993	5
10	Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides IEEE Transactions on Nuclear Science ·John F. Conley, P. M. Lenahan, P. Roitman	1992	1
11	Optical calibration of a submicrometer magnification standard Journal of Research of the National Institute of Standards and Technology ·Jon Geist, Benjamin J. Belzer, M. L. Miller, P. Roitman	1992	9
12	Effect of annealing ambient on the removal of oxide precipitates in high-dose oxygen implanted silicon Applied Physics Letters ·Suṗapan Seraphin, Stephen Krause, P. Roitman, David S. Simons, B. Cordts	1991	4
13	Electron spin resonance study of E' trapping centers in SIMOX buried oxides IEEE Transactions on Nuclear Science ·John F. Conley, Patrick M. Lenahan, P. Roitman	1991	60
14	High Resolution Electron Microscopy of Defects in High-Dose Oxygen Implanted Silicon-On-Insulator Material MRS Proceedings ·S. Visitserngtrakul, C. O. Jung, B. Cordts, P. Roitman, S. J. Krause	1990	3
15	Modeling MOS capacitors to extract Si—SiO₂interface trap densities in the presence of arbitrary doping profiles IEEE Transactions on Electron Devices ·Herbert S. Bennett, Michael Gaitan, P. Roitman, Thomas J. Russell, John S. Suehle	1986	11
16	High-accuracy physical modeling of submicrometer MOSFET's IEEE Transactions on Electron Devices ·Charles L. Wilson, P. Roitman, James L. Blue	1985	5
17	An investigation of the two-dimensional shape of ion-implanted regions Journal of Applied Physics ·P. Roitman, John Albers, David R. Myers	1984	6
18	Verification of models for fabrication of Arsenic source-drains in VLSI MOSFET's IEEE Transactions on Electron Devices ·John Albers, P. Roitman, Charles L. Wilson	1983	8
19	IVB-7 direct observation of lateral redistribution profiles of shallow ion implants IEEE Transactions on Electron Devices ·P. Roitman, David R. Myers, John Albers, James R. Ehrstein, Jeremiah R. Lowney, R. G. Wilson, H.L. Garvin	1981	0
20	Contrast mechanisms in electron beam images of interface structures Journal of Vacuum Science and Technology ·W. R. Bottoms, D.C. Guterman, P. Roitman	1975	7

About P. Roitman

P. Roitman is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Materials Chemistry, Electronic, Optical and Magnetic Materials and Computational Mechanics, having authored 51 papers that have together received 487 indexed citations. Recurring topics across this work include Semiconductor materials and devices (40 papers), Advancements in Semiconductor Devices and Circuit Design (23 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Silicon and Solar Cell Technologies (9 papers), Electronic and Structural Properties of Oxides (8 papers), Advanced Surface Polishing Techniques (5 papers), Electron and X-Ray Spectroscopy Techniques (4 papers) and Ga2O3 and related materials (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (447 citations), Structural Biology (5 citations), Surfaces, Coatings and Films (24 citations), Materials Chemistry (144 citations) and Ceramics and Composites (15 citations). P. Roitman has collaborated with scholars based in United States, Egypt and Ireland. Frequent co-authors include John F. Conley, Patrick M. Lenahan, S. J. Krause, M.J. Anc, Robert E. Stahlbush, G.J. Campisi, J.B. McKitterick, W. Maszara, George Brown and John S. Suehle. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Nuclear Science, Applied Physics Letters, Journal of Applied Physics and Journal of Electronic Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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