M. Doken

618 citations
11 papers · 470 indexed · 1 hit paper · h-index 6

M. Doken

10 papers receiving 443 citations

Hit Papers

C.M.O.S. devices fabricated on buried SiO 2 layers formed...4181978202619942010100200300400

Peers

M. Doken
Comparison fields: 5 of 26
  • Electrical and Electronic Engineering 450
  • Computational Mechanics 71
  • Atomic and Molecular Physics, and Optics 69
  • Materials Chemistry 102
  • Hardware and Architecture 10
Replace K. Ohyu with:
K. Ohyu Japan
K.P. MacWilliams United States
K.A. Pickar United States
P. Roitman United States
A.J. Auberton‐Hervé France
M. Haond France
G. Fuse Japan
H.A.R. Wegener United States
Kazuaki Hotta Japan
A. Chou United States
M. Doken relative to K. Ohyu Japan K. Ohyu's profile →
Citations per field
00.5×1.5×
K. Ohyu · 1×
Citations per year

Countries citing papers authored by M. Doken

Since Specialization
Citations

This map shows the geographic impact of M. Doken's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Doken with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Doken more than expected).

Fields of papers citing papers by M. Doken

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Doken. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Doken. The network helps show where M. Doken may publish in the future.

Co-authorship network

The 10 scholars most cited alongside M. Doken, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Doken Line = papers co-authored together M. Doken links everyone, so they are left out of the graph.

All Works

11 of 11 papers shown
#Work
1 19879
2 19811
3 19809
4 19797
5 19796
6 19793
7 19790
8 197911
9 19782
10
C.M.O.S. devices fabricated on buried SiO 2 layers formed by oxygen implantation into siliconbreakdown →
1978418
11 19674

About M. Doken

M. Doken is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biomedical Engineering, Mechanics of Materials and Materials Chemistry, having authored 11 papers that have together received 470 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Semiconductor Lasers and Optical Devices (3 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Copper Interconnects and Reliability (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Analog and Mixed-Signal Circuit Design (2 papers), Advancements in PLL and VCO Technologies (2 papers) and Plasma Diagnostics and Applications (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (450 citations), Computational Mechanics (71 citations), Atomic and Molecular Physics, and Optics (69 citations), Materials Chemistry (102 citations) and Hardware and Architecture (10 citations). M. Doken has collaborated with scholars based in Japan. Frequent co-authors include Hisashi Ariyoshi, K. Izumi, Yoshinobu Arita, M. Nakamura, T. Kamei, K. Ohwada, Satoshi Okamoto, Hiroshi Fukui, Takashi Unagami and Kenji Kajiyama. Their work appears in journals such as Japanese Journal of Applied Physics, Journal of The Electrochemical Society, Electronics Letters, IEEE Transactions on Electron Devices and IEEE Journal of Solid-State Circuits.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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