S. J. Krause

575 total citations
46 papers, 414 citations indexed

About

S. J. Krause is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, S. J. Krause has authored 46 papers receiving a total of 414 indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 13 papers in Materials Chemistry and 5 papers in Surfaces, Coatings and Films. Recurrent topics in S. J. Krause's work include Semiconductor materials and devices (24 papers), Silicon and Solar Cell Technologies (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). S. J. Krause is often cited by papers focused on Semiconductor materials and devices (24 papers), Silicon and Solar Cell Technologies (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). S. J. Krause collaborates with scholars based in United States, Germany and Australia. S. J. Krause's co-authors include P. Roitman, M.J. Anc, David C. Joy, William W. Adams, S. R. Wilson, Gary E. Price, Joseph F. O’Brien, P. G. Lenhert, W.-F. Hwang and T. E. Helminiak and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Polymer.

In The Last Decade

S. J. Krause

37 papers receiving 391 citations

Peers

S. J. Krause
Zhao Gaoyang China
Tsai-Wei Lin Taiwan
Sang‐Gil Ryu United States
Gun‐Hwan Lee South Korea
Lionel Teulé‐Gay France
Xiaoyan Ye China
Harry D. Rowland United States
Jong-Joo Rha South Korea
Soon Moon Jeong South Korea
Tomasz Stapiński Poland
Zhao Gaoyang China
S. J. Krause
Citations per year, relative to S. J. Krause S. J. Krause (= 1×) peers Zhao Gaoyang

Countries citing papers authored by S. J. Krause

Since Specialization
Citations

This map shows the geographic impact of S. J. Krause's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. J. Krause with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. J. Krause more than expected).

Fields of papers citing papers by S. J. Krause

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. J. Krause. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. J. Krause. The network helps show where S. J. Krause may publish in the future.

Co-authorship network of co-authors of S. J. Krause

This figure shows the co-authorship network connecting the top 25 collaborators of S. J. Krause. A scholar is included among the top collaborators of S. J. Krause based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. J. Krause. S. J. Krause is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Krause, S. J.. (2019). Development of a Database for the Description and Analysis of Use Cases for Automated Driving. 1 indexed citations
2.
Österle, W., et al.. (2008). Influence of heat treatment on microstructure and hot crack susceptibility of laser-drilled turbine blades made from René 80. Materials Characterization. 59(11). 1564–1571. 20 indexed citations
3.
4.
Roitman, P., et al.. (2002). Residual defects in SIMOX: threading dislocations and pipes. 8. 154–155. 1 indexed citations
5.
Krause, S. J., et al.. (2002). Effect of implant dose on formation of buried-oxide Si islands in low-dose SIMOX. 118–119. 2 indexed citations
6.
7.
Krause, S. J., M.J. Anc, & P. Roitman. (1998). Evolution and Future Trends of SIMOX Material. MRS Bulletin. 23(12). 25–29. 59 indexed citations
8.
Krause, S. J., et al.. (1996). Mechanism of defect formation in low-dose oxygen implanted silicon-on-insulator material. Journal of Electronic Materials. 25(1). 7–12. 11 indexed citations
9.
Joy, David C., et al.. (1995). Low-voltage scanning electron microscopy of polymers. Polymer. 36(9). 1781–1790. 68 indexed citations
10.
Park, M., S. J. Krause, & S. R. Wilson. (1993). Growth kinetics of Al2Cu in an Al-1.5Cu thin film by in Situ TEM. Proceedings annual meeting Electron Microscopy Society of America. 51. 1172–1173. 1 indexed citations
11.
Venables, D., et al.. (1993). Stacking fault pyramid formation and energetics in silicon-on-insulator material formed by multiple cycles of oxygen implantation and annealing. Applied Physics Letters. 63(24). 3330–3332. 5 indexed citations
12.
Roitman, P., et al.. (1990). High Resolution Electron Microscopy of Defects in High-Dose Oxygen Implanted Silicon-On-Insulator Material. MRS Proceedings. 183. 3 indexed citations
13.
Ravi, T. S., et al.. (1989). Formation and stability of {113} defects in oxygen implanted silicon-on-insulator material. Proceedings annual meeting Electron Microscopy Society of America. 47. 602–603. 1 indexed citations
14.
15.
Krause, S. J., et al.. (1987). Low-voltage, high-resolution scanning electron microscopy of polymers. Proceedings annual meeting Electron Microscopy Society of America. 45. 466–467. 1 indexed citations
16.
Krause, S. J., et al.. (1986). Galileo probe battery program - An historical overview. NASA Technical Reports Server (NASA).
17.
Wilson, S. R., R. B. Gregory, W. M. Paulson, et al.. (1985). Properties of Ion‐Implanted Polycrystalline Si Layers Subjected to Rapid Thermal Annealing. Journal of The Electrochemical Society. 132(4). 922–929. 18 indexed citations
18.
Varker, C. J., et al.. (1985). Oxygen Implanted Layers in Silicon Electrical and Microstructural Characterization. MRS Proceedings. 45. 5 indexed citations
19.
20.
Krause, S. J., S. R. Wilson, W. M. Paulson, & R. Gregory. (1984). Grain Growth Processes during Transient Annealing of As-Implanted, Polycrystalline-Silicon Films. MRS Proceedings. 35. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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