James R. Ehrstein

1.1k citations
19 papers · 778 · h-index 7

Impact in

    • Semiconductor materials and devices
    • Ferroelectric and Negative Capacitance Devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Electronic and Structural Properties of Oxides
    • ZnO doping and properties
    • Ferroelectric and Piezoelectric Materials

Papers in

James R. Ehrstein

16 papers receiving 752 citations

Peers

James R. Ehrstein
Comparison fields: 5 of 56
  • Electrical and Electronic Engineering 544
  • Materials Chemistry 389
  • Electronic, Optical and Magnetic Materials 120
  • Polymers and Plastics 62
  • Atomic and Molecular Physics, and Optics 129
Replace J. Ishikawa with:
J. Ishikawa Japan
S.P. Wilks United Kingdom
J.E. Bourée France
M.A. Tagliente Italy
Marion Kelsch Germany
Magali Putero France
Shin‐ichi Honda Japan
Takao Tohda Japan
L. Y. Chen China
S. Godey France
James R. Ehrstein relative to J. Ishikawa Japan J. Ishikawa's profile →
Citations per field
00.5×1.5×2.0×
J. Ishikawa · 1×
Citations per year

Countries citing papers authored by James R. Ehrstein

Since Specialization
Citations

This map shows the geographic impact of James R. Ehrstein's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James R. Ehrstein with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James R. Ehrstein more than expected).

Fields of papers citing papers by James R. Ehrstein

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by James R. Ehrstein. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James R. Ehrstein. The network helps show where James R. Ehrstein may publish in the future.

Co-authors

The 25 scholars most cited alongside James R. Ehrstein, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with James R. Ehrstein Line = papers co-authored together James R. Ehrstein links everyone, so they are left out of the graph.

All Works

19 of 19 papers shown
#Work
1 2005395
2 2002136
3 200592
4 200355
5 200554
6 19908
7 19987
8 19966
9 20056
10 20035
11 19874
12 19913
13
Characterization and Production Metrology of Gate Dielectric Films: Optical Models for Oxynitrides and High Dielectric Constant Films
20012
14 19742
15
Progress Toward a Semiconductor Depth-Profiling Standard
19881
16
Semiconductor Measurement Technology: Thin Film Reference Materials Development; Final Report for CRADA CN-1364 | NIST
19981
17 20081
18 19810
19 19800

About James R. Ehrstein

James R. Ehrstein is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Surfaces, Coatings and Films and Condensed Matter Physics, having authored 19 papers that have together received 778 indexed citations. Recurring topics across this work include Semiconductor materials and devices (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Electronic and Structural Properties of Oxides (5 papers), Semiconductor materials and interfaces (3 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Silicon and Solar Cell Technologies (3 papers), Surface and Thin Film Phenomena (2 papers) and Thin-Film Transistor Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (544 citations), Materials Chemistry (389 citations), Electronic, Optical and Magnetic Materials (120 citations), Polymers and Plastics (62 citations) and Atomic and Molecular Physics, and Optics (129 citations). James R. Ehrstein has collaborated with scholars based in United States, Belgium and Brazil. Frequent co-authors include Nhan V. Nguyen, Igor Levin, Şafak Sayan, Eric Garfunkel, Luigi Colombo, Manuel Quevedo-López, M. R. Visokay, Özgür Çelık, James J. Chambers and Daniel A. Fischer. Their work appears in journals such as Journal of The Electrochemical Society, Applied Physics Letters, Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Materials Science in Semiconductor Processing.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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