Patrick M. Lenahan

6.4k total citations · 1 hit paper
205 papers, 5.2k citations indexed

About

Patrick M. Lenahan is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Patrick M. Lenahan has authored 205 papers receiving a total of 5.2k indexed citations (citations by other indexed papers that have themselves been cited), including 194 papers in Electrical and Electronic Engineering, 55 papers in Materials Chemistry and 43 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Patrick M. Lenahan's work include Semiconductor materials and devices (178 papers), Advancements in Semiconductor Devices and Circuit Design (80 papers) and Integrated Circuits and Semiconductor Failure Analysis (61 papers). Patrick M. Lenahan is often cited by papers focused on Semiconductor materials and devices (178 papers), Advancements in Semiconductor Devices and Circuit Design (80 papers) and Integrated Circuits and Semiconductor Failure Analysis (61 papers). Patrick M. Lenahan collaborates with scholars based in United States, Germany and Greece. Patrick M. Lenahan's co-authors include P. V. Dressendorfer, John F. Conley, W. L. Warren, Corey J. Cochrane, Jerzy Kanicki, Aivars J. Lelis, D. T. Krick, J. P. Campbell, S. Krishnan and Mark Anders and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

Patrick M. Lenahan

197 papers receiving 5.0k citations

Hit Papers

Hole traps and trivalent silicon centers in metal/oxide/s... 1984 2026 1998 2012 1984 100 200 300 400 500
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Hole traps and trivalent silicon centers in metal/oxide/silicon devices
    1984 589 citations Patrick M. Lenahan et al. Journal of Applied Physics profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Patrick M. Lenahan United States 39 4.9k 1.7k 845 337 230 205 5.2k
U. Lindefelt Sweden 30 2.9k 0.6× 814 0.5× 1.2k 1.4× 446 1.3× 292 1.3× 88 3.5k
J.-C. Manifacier France 16 2.2k 0.5× 2.1k 1.2× 539 0.6× 327 1.0× 117 0.5× 56 2.9k
Hiroyuki Kageshima Japan 31 2.4k 0.5× 2.8k 1.6× 1.3k 1.6× 238 0.7× 175 0.8× 199 4.0k
J. L. Lindström Sweden 32 2.8k 0.6× 1.1k 0.7× 955 1.1× 184 0.5× 59 0.3× 152 3.0k
W. Fuhs Germany 37 3.7k 0.8× 3.2k 1.9× 781 0.9× 155 0.5× 284 1.2× 232 4.3k
Masataka Hirose Japan 26 2.1k 0.4× 1.5k 0.9× 523 0.6× 113 0.3× 86 0.4× 162 2.4k
Tetsuji Yasuda Japan 36 3.5k 0.7× 1.6k 0.9× 1.6k 1.8× 237 0.7× 73 0.3× 240 4.2k
J.P. Fillard France 17 1.8k 0.4× 1.8k 1.0× 520 0.6× 295 0.9× 136 0.6× 73 2.6k
K. L. Brower United States 23 1.9k 0.4× 1.0k 0.6× 856 1.0× 111 0.3× 155 0.7× 40 2.3k
D. J. Olego United States 30 2.2k 0.5× 1.5k 0.9× 2.1k 2.4× 174 0.5× 146 0.6× 77 3.2k

Countries citing papers authored by Patrick M. Lenahan

Since Specialization
Citations

This map shows the geographic impact of Patrick M. Lenahan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick M. Lenahan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick M. Lenahan more than expected).

Fields of papers citing papers by Patrick M. Lenahan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick M. Lenahan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick M. Lenahan. The network helps show where Patrick M. Lenahan may publish in the future.

Co-authorship network of co-authors of Patrick M. Lenahan

This figure shows the co-authorship network connecting the top 25 collaborators of Patrick M. Lenahan. A scholar is included among the top collaborators of Patrick M. Lenahan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Patrick M. Lenahan. Patrick M. Lenahan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Harmon, Nicholas J., et al.. (2024). Tunable zero-field magnetoresistance responses in Si transistors: Origins and applications. Journal of Applied Physics. 135(15).
2.
Lenahan, Patrick M., et al.. (2024). Near zero-field magnetoresistance and defects in gallium nitride pn junctions. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 42(5). 1 indexed citations
3.
Harmon, Nicholas J., et al.. (2023). Spin-dependent capture mechanism for magnetic field effects on interface recombination current in semiconductor devices. Applied Physics Letters. 123(25). 3 indexed citations
4.
5.
Michalak, David J., Nicholas J. Harmon, Michael E. Flatté, et al.. (2021). Effects of 29Si and 1H on the near-zero field magnetoresistance response of Si/SiO2 interface states: Implications for oxide tunneling currents. Applied Physics Letters. 119(18). 9 indexed citations
6.
Michalak, David J., Nicholas J. Harmon, Michael E. Flatté, et al.. (2021). Electrically detected magnetic resonance and near-zero field magnetoresistance in 28Si/28SiO2. Journal of Applied Physics. 130(6). 8 indexed citations
7.
Anders, Mark, Patrick M. Lenahan, Nicholas J. Harmon, & Michael E. Flatté. (2020). A technique to measure spin-dependent trapping events at the metal–oxide–semiconductor field-effect transistor interface: Near zero field spin-dependent charge pumping. Journal of Applied Physics. 128(24). 6 indexed citations
8.
Harmon, Nicholas J., et al.. (2020). Modeling of Near Zero-Field Magnetoresistance and Electrically Detected Magnetic Resonance in Irradiated Si/SiO2 MOSFETs. IEEE Transactions on Nuclear Science. 67(7). 1669–1673. 14 indexed citations
9.
Lenahan, Patrick M., et al.. (2020). Observation of Radiation-Induced Leakage Current Defects in MOS Oxides With Multifrequency Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance. IEEE Transactions on Nuclear Science. 67(1). 228–233. 14 indexed citations
10.
11.
Anders, Mark, Jason T. Ryan, Pragya R. Shrestha, et al.. (2019). Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station. Review of Scientific Instruments. 90(1). 14708–14708. 9 indexed citations
12.
Lenahan, Patrick M., et al.. (2018). Total Ionizing Dose Effects on TiN/Ti/HfO2/TiN Resistive Random Access Memory Studied via Electrically Detected Magnetic Resonance. IEEE Transactions on Nuclear Science. 65(5). 1101–1107. 9 indexed citations
13.
Anders, Mark, Jason T. Ryan, Pragya R. Shrestha, et al.. (2018). Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station. IEEE Transactions on Device and Materials Reliability. 18(2). 139–143. 9 indexed citations
14.
Cochrane, Corey J., et al.. (2018). Magnetic Field Sensing with 4H SiC Diodes: N vs P Implantation. Materials science forum. 924. 988–992. 5 indexed citations
15.
Cochrane, Corey J., Jordana Blacksberg, Mark Anders, & Patrick M. Lenahan. (2016). Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbide. Scientific Reports. 6(1). 37077–37077. 69 indexed citations
16.
Cochrane, Corey J. & Patrick M. Lenahan. (2008). Real time exponentially weighted recursive least squares adaptive signal averaging for enhancing the sensitivity of continuous wave magnetic resonance. Journal of Magnetic Resonance. 195(1). 17–22. 12 indexed citations
17.
Conley, John F., et al.. (1996). Physically based predictive model of oxide charging. 134–141. 1 indexed citations
18.
Lenahan, Patrick M., et al.. (1993). Bridging nitrogen dangling bond centers and electron trapping in amorphous NH3-nitrided and reoxidized nitrided oxide films. Journal of Non-Crystalline Solids. 164-166. 1069–1072. 20 indexed citations
19.
Warren, W. L. & Patrick M. Lenahan. (1989). Fundamental differences in the nature of electrically active point-defects in plasma enhanced chemical vapor deposited and thermal oxide structures. Applied Surface Science. 39(1-4). 406–411. 1 indexed citations
20.
Lenahan, Patrick M. & T. J. Rowland. (1981). Giant dielectric constant in the one-dimensional semiconductor Meφ3As (TCNQ)2. Solid State Communications. 37(3). 223–227. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by U. Lindefelt Breakdown of academic impact, for papers by J.-C. Manifacier Breakdown of academic impact, for papers by Hiroyuki Kageshima Breakdown of academic impact, for papers by J. L. Lindström Breakdown of academic impact, for papers by W. Fuhs Breakdown of academic impact, for papers by Masataka Hirose Breakdown of academic impact, for papers by Tetsuji Yasuda Breakdown of academic impact, for papers by J.P. Fillard Breakdown of academic impact, for papers by K. L. Brower Breakdown of academic impact, for papers by D. J. Olego
Rankless by CCL
2026