Patrick M. Lenahan
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- Semiconductor materials and devices 178
- Advancements in Semiconductor Devices and Circuit Design 80
- Integrated Circuits and Semiconductor Failure Analysis 61
- Silicon Carbide Semiconductor Technologies 38
- Thin-Film Transistor Technologies 33
- Silicon and Solar Cell Technologies 31
- Ceramics and Composites top 5%
- Materials Chemistry top 2%
- Silicon Nanostructures and Photoluminescence 20
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- Quantum and electron transport phenomena 20
- Co-authors
- P. V. DressendorferJohn F. ConleyW. L. WarrenCorey J. CochraneJerzy KanickiAivars J. LelisD. T. KrickJ. P. Campbell
- Journals
- Applied Physics Letters (48 papers)Journal of Applied Physics (35 papers)IEEE Transactions on Nuclear Science (26 papers)
- Partner nations
- United StatesGermanyGreece
In The Last Decade
Patrick M. Lenahan
197 papers receiving 5.0k citations
Hit Papers
Peers
Comparison fields: 5 of 71
- Electrical and Electronic Engineering 4.9k
- Ceramics and Composites 230
- Materials Chemistry 1.7k
- Atomic and Molecular Physics, and Optics 845
- Electronic, Optical and Magnetic Materials 337
Countries citing papers authored by Patrick M. Lenahan
This map shows the geographic impact of Patrick M. Lenahan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick M. Lenahan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick M. Lenahan more than expected).
Fields of papers citing papers by Patrick M. Lenahan
This network shows the impact of papers produced by Patrick M. Lenahan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick M. Lenahan. The network helps show where Patrick M. Lenahan may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Patrick M. Lenahan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2024 | 1 | |
| 3 | 2023 | 3 | |
| 4 | 2021 | 4 | |
| 5 | 2021 | 9 | |
| 6 | 2021 | 8 | |
| 7 | 2020 | 6 | |
| 8 | 2020 | 14 | |
| 9 | 2020 | 14 | |
| 10 | 2020 | 9 | |
| 11 | 2019 | 9 | |
| 12 | 2018 | 9 | |
| 13 | 2018 | 9 | |
| 14 | 2018 | 5 | |
| 15 | 2016 | 69 | |
| 16 | 2008 | 12 | |
| 17 | Physically based predictive model of oxide charging | 1996 | 1 |
| 18 | 1993 | 20 | |
| 19 | 1989 | 1 | |
| 20 | 1981 | 4 |
About Patrick M. Lenahan
Patrick M. Lenahan is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Electronic, Optical and Magnetic Materials and Ceramics and Composites, having authored 205 papers that have together received 5.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (178 papers), Advancements in Semiconductor Devices and Circuit Design (80 papers), Integrated Circuits and Semiconductor Failure Analysis (61 papers), Silicon Carbide Semiconductor Technologies (38 papers), Thin-Film Transistor Technologies (33 papers), Silicon and Solar Cell Technologies (31 papers), Quantum and electron transport phenomena (20 papers) and Silicon Nanostructures and Photoluminescence (20 papers). The work is most often cited by research in Electrical and Electronic Engineering (4.9k citations), Ceramics and Composites (230 citations), Materials Chemistry (1.7k citations), Atomic and Molecular Physics, and Optics (845 citations) and Electronic, Optical and Magnetic Materials (337 citations). Patrick M. Lenahan has collaborated with scholars based in United States, Germany and Greece. Frequent co-authors include P. V. Dressendorfer, John F. Conley, W. L. Warren, Corey J. Cochrane, Jerzy Kanicki, Aivars J. Lelis, D. T. Krick, J. P. Campbell, S. Krishnan and Mark Anders. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Nuclear Science, Microelectronic Engineering and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.