John Albers
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Mechanical Engineering
- Materials Chemistry
- Mechanics of Materials
- Co-authors
- G. G. HarmanJ. M. DeutchI. OppenheimIrwin OppenheimJ. F. MarchiandoP. RoitmanJoseph J. KopanskiDonald B. Novotny
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (11 papers)Silicon and Solar Cell Technologies (10 papers)Semiconductor materials and devices (7 papers)
- Cited by
- Statistical and Nonlinear PhysicsElectrical and Electronic EngineeringAtomic and Molecular Physics, and Optics
- Journals
- The Journal of Chemical PhysicsJournal of Applied PhysicsJournal of The Electrochemical Society
- Partner nations
- United States
In The Last Decade
John Albers
29 papers receiving 389 citations
Peers
Comparison fields: 5 of 55
- Electrical and Electronic Engineering 226
- Atomic and Molecular Physics, and Optics 115
- Mechanical Engineering 111
- Materials Chemistry 66
- Mechanics of Materials 66
Countries citing papers authored by John Albers
This map shows the geographic impact of John Albers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Albers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Albers more than expected).
Fields of papers citing papers by John Albers
This network shows the impact of papers produced by John Albers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Albers. The network helps show where John Albers may publish in the future.
Co-authorship network of co-authors of John Albers
This figure shows the co-authorship network connecting the top 25 collaborators of John Albers. A scholar is included among the top collaborators of John Albers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John Albers. John Albers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 13 | |
| 2 | Semiconductor Measurement Technology: HOTPAC: Programs for Thermal Analysis Including Version 3.0 of the TXYZ Program, TXYZ30, and the Thermal MultiLayer Program, TML | 1 |
| 3 | Semiconductor Measurement Technology: A Collection of Computer Programs for Two-Probe Resistance (Spreading Resistance) and Four-Probe Resistance Calculations: RESPAC | 1 |
| 4 | Semiconductor Measurement Technology: Version 2.0 of the TXYZ Thermal Analysis Program: TXYZ20 | 3 |
| 5 | 8 | |
| 6 | 1 | |
| 7 | 19 | |
| 8 | 11 | |
| 9 | 6 | |
| 10 | 8 | |
| 11 | 8 | |
| 12 | 1 | |
| 13 | 0 | |
| 14 | 9 | |
| 15 | 3 | |
| 16 | 6 | |
| 17 | 2 | |
| 18 | 31 | |
| 19 | 3 | |
| 20 | 50 |
About John Albers
John Albers is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics, having authored 32 papers that have together received 418 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (11 papers), Silicon and Solar Cell Technologies (10 papers) and Semiconductor materials and devices (7 papers). The work is most often cited by research in Statistical and Nonlinear Physics (60 citations), Electrical and Electronic Engineering (226 citations) and Atomic and Molecular Physics, and Optics (115 citations). John Albers has collaborated with scholars based in United States. Frequent co-authors include G. G. Harman, J. M. Deutch, I. Oppenheim, Irwin Oppenheim, J. F. Marchiando, P. Roitman, Joseph J. Kopanski, Donald B. Novotny, Charles L. Wilson and James R. Ehrstein. Their work appears in journals such as The Journal of Chemical Physics, Journal of Applied Physics and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.