E. Harari

801 citations
17 papers · 628 · 1 hit paper · h-index 11

Impact in

Papers in

    • Semiconductor materials and devices 15
    • Advancements in Semiconductor Devices and Circuit Design 8
    • Integrated Circuits and Semiconductor Failure Analysis 6
    • Radiation Effects in Electronics 3
    • Silicon and Solar Cell Technologies 3
    • Advanced Memory and Neural Computing 2
    • Advanced Data Storage Technologies 2

E. Harari

17 papers receiving 582 citations

Hit Papers

Dielectric breakdown in electrically stressed thin films of thermal SiO2 1978 · 347 citations
3470+16+32Years since publication100200300

Peers

E. Harari
Comparison fields: 5 of 37
  • Electrical and Electronic Engineering 587
  • Ceramics and Composites 28
  • Materials Chemistry 213
  • Surfaces, Coatings and Films 17
  • Atomic and Molecular Physics, and Optics 74
Replace P. Roitman with:
P. Roitman United States
J. Margail France
H.A.R. Wegener United States
A. Cacciato Belgium
Y. Nissan‐Cohen United States
W. Langheinrich Germany
Ken’etsu Yokogawa Japan
Manabu Itsumi Japan
K.P. MacWilliams United States
W. Ting United States
E. Harari relative to P. Roitman United States P. Roitman's profile →
Citations per field
00.5×
P. Roitman · 1×
Citations per year

Countries citing papers authored by E. Harari

Since Specialization
Citations

This map shows the geographic impact of E. Harari's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Harari with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Harari more than expected).

Fields of papers citing papers by E. Harari

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Harari. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Harari. The network helps show where E. Harari may publish in the future.

Co-authors

The 9 scholars most cited alongside E. Harari, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E. Harari Line = papers co-authored together E. Harari links everyone, so they are left out of the graph.

All Works

17 of 17 papers shown
#Work
1
Dielectric breakdown in electrically stressed thin films of thermal SiO2
Hit paper breakdown →
1978347
2 197796
3 197548
4 197323
5 197318
6 197313
7 197512
8 197412
9 201211
10 197711
11 197810
12 19788
13 19776
14 19765
15 20033
16 20113
17 19752

About E. Harari

E. Harari is a scholar working on Electrical and Electronic Engineering, Computer Networks and Communications, Materials Chemistry, Mechanics of Materials and Computational Mechanics, having authored 17 papers that have together received 628 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Radiation Effects in Electronics (3 papers), Silicon and Solar Cell Technologies (3 papers), Advanced Data Storage Technologies (2 papers), Advanced Memory and Neural Computing (2 papers) and Electron and X-Ray Spectroscopy Techniques (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (587 citations), Ceramics and Composites (28 citations), Materials Chemistry (213 citations), Surfaces, Coatings and Films (17 citations) and Atomic and Molecular Physics, and Optics (74 citations). E. Harari has collaborated with scholars based in United States. Frequent co-authors include B. S. H. Royce, Jun Yuan, Jinyun Yuan, Chang Chen, L. Schmitz, Thomas J. Russell, Chi Wah Leung, Sanjay Mehrotra and K. Stiles. Their work appears in journals such as IEEE Transactions on Nuclear Science, Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact