Kenneth M. Butler
- Hardware and Architecture top 0.2%
- Electrical and Electronic Engineering top 2%
- Control and Systems Engineering top 5%
- Industrial and Manufacturing Engineering top 5%
- Software top 5%
- Co-authors
- J. SaxenaL. WhetselVinay JayaramN.V. ArvindSandip KunduMohammad TehranipoorG. HetheringtonAnkit Jain
- Topics
- VLSI and Analog Circuit Testing (56 papers)Integrated Circuits and Semiconductor Failure Analysis (43 papers)Engineering and Test Systems (11 papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsIEEE Transactions on Very Large Scale Integration (VLSI) SystemsJournal of Electronic Testing
- Partner nations
- United StatesIndiaPortugal
In The Last Decade
Kenneth M. Butler
57 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 45
- Hardware and Architecture 1.6k
- Electrical and Electronic Engineering 1.6k
- Control and Systems Engineering 222
- Industrial and Manufacturing Engineering 96
- Software 89
Countries citing papers authored by Kenneth M. Butler
This map shows the geographic impact of Kenneth M. Butler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kenneth M. Butler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kenneth M. Butler more than expected).
Fields of papers citing papers by Kenneth M. Butler
This network shows the impact of papers produced by Kenneth M. Butler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kenneth M. Butler. The network helps show where Kenneth M. Butler may publish in the future.
Co-authorship network of co-authors of Kenneth M. Butler
This figure shows the co-authorship network connecting the top 25 collaborators of Kenneth M. Butler. A scholar is included among the top collaborators of Kenneth M. Butler based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kenneth M. Butler. Kenneth M. Butler is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 9 | |
| 2 | 4 | |
| 3 | 4 | |
| 4 | 17 | |
| 5 | 17 | |
| 6 | 225 | |
| 7 | 306 | |
| 8 | 1 | |
| 9 | 80 | |
| 10 | 1 | |
| 11 | 98 | |
| 12 | 5 | |
| 13 | 6 | |
| 14 | 3 | |
| 15 | 70 | |
| 16 | 138 | |
| 17 | 12 | |
| 18 | 5 | |
| 19 | 4 | |
| 20 | 9 |
About Kenneth M. Butler
Kenneth M. Butler is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Software, having authored 61 papers that have together received 1.8k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (56 papers), Integrated Circuits and Semiconductor Failure Analysis (43 papers) and Engineering and Test Systems (11 papers). The work is most often cited by research in Hardware and Architecture (1.6k citations), Electrical and Electronic Engineering (1.6k citations) and Software (89 citations). Kenneth M. Butler has collaborated with scholars based in United States, India and Portugal. Frequent co-authors include J. Saxena, L. Whetsel, Vinay Jayaram, N.V. Arvind, Sandip Kundu, Mohammad Tehranipoor, G. Hetherington, Ankit Jain, M.R. Mercer and P. Nigh. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Journal of Electronic Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.