Kenneth M. Butler

2.3k citations

61 papers · 1.8k indexed · h-index 20

Hardware and Architecture top 0.2%
- VLSI and Analog Circuit Testing 56
Electrical and Electronic Engineering top 2%
- Integrated Circuits and Semiconductor Failure Analysis 43
- VLSI and FPGA Design Techniques 8
- Radiation Effects in Electronics 6
- Advancements in Photolithography Techniques 5
- Semiconductor materials and devices 5
Software top 5%
Industrial and Manufacturing Engineering top 5%
- Industrial Vision Systems and Defect Detection 5
Control and Systems Engineering top 5%
- Engineering and Test Systems 11

Co-authors: J. Saxena L. Whetsel Vinay Jayaram N.V. Arvind Sandip Kundu Mohammad Tehranipoor G. Hetherington Ankit Jain
Cited by: Hardware and Architecture Electrical and Electronic Engineering Software
Journals: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (3 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)Journal of Electronic Testing (2 papers)
Partner nations: United States India Portugal

In The Last Decade

Kenneth M. Butler

57 papers receiving 1.7k citations

Peers

Countries citing papers authored by Kenneth M. Butler

Since Specialization

Citations

This map shows the geographic impact of Kenneth M. Butler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kenneth M. Butler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kenneth M. Butler more than expected).

Fields of papers citing papers by Kenneth M. Butler

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kenneth M. Butler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kenneth M. Butler. The network helps show where Kenneth M. Butler may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Kenneth M. Butler, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Kenneth M. Butler Line = papers co-authored together Kenneth M. Butler links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	What we know after twelve years developing and deploying test data analytics solutions PDXScholar (Portland State University) ·Kenneth M. Butler,Amit Nahar,W.R. Daasch	2016	9
2	A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits Design, Automation, and Test in Europe ·Hugo Gonçalves,Xin Li,Miguel Correia,Vítor Grade Tavares,John M. Carulli,Kenneth M. Butler	2015	4
3	Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling Portuguese National Funding Agency for Science, Research and Technology (RCAAP Project by FCT) ·Shanghang Zhang,Xin Li,R.D. Blanton,José Machado da Silva,John M. Carulli,Kenneth M. Butler	2014	4
4	Die-level adaptive test: Real-time test reordering and elimination Kapil Gotkhindikar,W.R. Daasch,Kenneth M. Butler,John M. Carulli,Amit Nahar	2011	17
5	Adapting to adaptive testing Erik Jan Marinissen,Adit D. Singh,Dan Glotter,Marco Esposito,John M. Carulli,Amit Nahar,Kenneth M. Butler,D. Appello,Chris Portelli	2010	17
6	Minimizing power consumption in scan testing: pattern generation and DFT techniques Kenneth M. Butler,J. Saxena,Ankit Jain,T. Fryars,J. Lewis,G. Hetherington	2005	225
7	A case study of ir-drop in structured at-speed testing J. Saxena,Kenneth M. Butler,Vinay Jayaram,Sandip Kundu,N.V. Arvind,P. Sreeprakash,M. Hachinger	2004	306
8	CATAPULT: concurrent automatic testing allowing parallelization and using limited topology Rhonda Gaede,M.R. Mercer,Kenneth M. Butler,D.E. Ross	2003	1
9	REDO-random excitation and deterministic observation-first commercial experiment Michael R. Grimaila,Sooryong Lee,Jennifer Dworak,Kenneth M. Butler,B.A. Stewart,H. Balachandran,Bryan Houchins,V. K. Mathur,Jaehong Park,Li-C. Wang,M.R. Mercer	2003	80
10	A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data Kenneth M. Butler	2003	1
11	Scan-based transition fault testing - implementation and low cost test challenges J. Saxena,Kenneth M. Butler,J. Gatt,R. Raghuraman,Sahu Pratap Kumar,Sukla Basu,D.J. Campbell,J. Berech	2003	98
12	Correlating defect level to final test fault coverage for modular structured designs [microcontroller family] T.J. Powell,Kenneth M. Butler,M.D. Ales,R. Haley,M.P. Perry	2002	5
13	Test generation and design for test for a large multiprocessing DSP G. Hetherington,G. Sutton,Kenneth M. Butler,T.J. Powell	2002	6
14	The stuck-at fault: it ain't over 'til it's over Kenneth M. Butler	2002	3
15	So what is an optimal test mix? A discussion of the SEMATECH methods experiment P. Nigh,W. Needham,Kenneth M. Butler,Alexander P. Maxwell,Robert Aitken,W. Maly	2002	70
16	An analysis of power reduction techniques in scan testing J. Saxena,Kenneth M. Butler,L. Whetsel	2002	138
17	Computer-aided fault to defect mapping (CAFDM) for defect diagnosis Zlatan Stanojević,H. Balachandran,D.M.H. Walker,F. Lakbani,S. Jandhyala,J. Saxena,Kenneth M. Butler	2002	12
18	ATPG versus Logic BIST -Now and in the Future International Test Conference ·Kenneth M. Butler	2001	5
19	Relative Effectiveness Of Tests IEEE Design & Test of Computers ·Kenneth M. Butler,Alexander P. Maxwell,W. Needham,P. Nig,Ron Walther,Shianling Wu	1998	4
20	Exact ordered binary decision diagram size when representing classes of symmetric functions Journal of Electronic Testing ·D.E. Ross,Kenneth M. Butler,M.R. Mercer	1991	9

About Kenneth M. Butler

Kenneth M. Butler is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Software, having authored 61 papers that have together received 1.8k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (56 papers), Integrated Circuits and Semiconductor Failure Analysis (43 papers), Engineering and Test Systems (11 papers), VLSI and FPGA Design Techniques (8 papers), Radiation Effects in Electronics (6 papers), Advancements in Photolithography Techniques (5 papers), Industrial Vision Systems and Defect Detection (5 papers) and Semiconductor materials and devices (5 papers). The work is most often cited by research in Hardware and Architecture (1.6k citations), Electrical and Electronic Engineering (1.6k citations) and Software (89 citations). Kenneth M. Butler has collaborated with scholars based in United States, India and Portugal. Frequent co-authors include J. Saxena, L. Whetsel, Vinay Jayaram, N.V. Arvind, Sandip Kundu, Mohammad Tehranipoor, G. Hetherington, Ankit Jain, M.R. Mercer and P. Nigh. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Journal of Electronic Testing.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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