M.R. Mercer
Impact in
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
- Software top 5%
- Software Testing and Debugging Techniques
Papers in
-
- VLSI and Analog Circuit Testing 53
- Software 12
- Software Testing and Debugging Techniques 8
- Model-Driven Software Engineering Techniques 4
- Co-authors
- T.W. WilliamsR. KapurKenneth M. ButlerJennifer DworakLi-C. WangVishwani D. AgrawalR.H. DennardMichael R. Grimaila
- Journals
- IEEE Transactions on Computers (3 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)IEEE Journal of Solid-State Circuits (1 paper)Computer (1 paper)
- Partner nations
- United StatesSouth KoreaSwitzerland
In The Last Decade
M.R. Mercer
60 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 32
- Hardware and Architecture 1.1k
- Software 150
- Electrical and Electronic Engineering 1.1k
- Computational Theory and Mathematics 141
- Control and Systems Engineering 87
Countries citing papers authored by M.R. Mercer
This map shows the geographic impact of M.R. Mercer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.R. Mercer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.R. Mercer more than expected).
Fields of papers citing papers by M.R. Mercer
This network shows the impact of papers produced by M.R. Mercer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.R. Mercer. The network helps show where M.R. Mercer may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M.R. Mercer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 9 | |
| 2 | 2003 | 1 | |
| 3 | 2002 | 36 | |
| 4 | 2002 | 104 | |
| 5 | 2002 | 2 | |
| 6 | 2002 | 3 | |
| 7 | 1995 | 4 | |
| 8 | 1992 | 2 | |
| 9 | 1992 | 32 | |
| 10 | Testing and design verification of electronic components | 1991 | 1 |
| 11 | 1991 | 59 | |
| 12 | 1991 | 9 | |
| 13 | 1986 | 4 | |
| 14 | Calculation of Greatest Lower Bounds Obtainable by the Cutting Algorithm. | 1986 | 12 |
| 15 | Logic Elements for Universally Testable Circuits. | 1986 | 2 |
| 16 | Deterministic Versus Random Testing. | 1986 | 0 |
| 17 | 1985 | 2 | |
| 18 | Correlating testability with fault detection | 1984 | 13 |
| 19 | Testability Measures : What Do They Tell Us ? | 1982 | 46 |
| 20 | Test Generation for Highly Sequential Scan-Testable Circuits Through Logic Transformation. | 1981 | 5 |
About M.R. Mercer
M.R. Mercer is a scholar working on Hardware and Architecture, Software, Electrical and Electronic Engineering, Computational Theory and Mathematics and Industrial and Manufacturing Engineering, having authored 63 papers that have together received 1.2k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (53 papers), Integrated Circuits and Semiconductor Failure Analysis (41 papers), VLSI and FPGA Design Techniques (14 papers), Low-power high-performance VLSI design (13 papers), Formal Methods in Verification (11 papers), Radiation Effects in Electronics (8 papers), Software Testing and Debugging Techniques (8 papers) and Model-Driven Software Engineering Techniques (4 papers). The work is most often cited by research in Hardware and Architecture (1.1k citations), Software (150 citations), Electrical and Electronic Engineering (1.1k citations), Computational Theory and Mathematics (141 citations) and Control and Systems Engineering (87 citations). M.R. Mercer has collaborated with scholars based in United States, South Korea and Switzerland. Frequent co-authors include T.W. Williams, R. Kapur, Kenneth M. Butler, Jennifer Dworak, Li-C. Wang, Vishwani D. Agrawal, T.W. Williams, R.H. Dennard, Michael R. Grimaila and Monica R. Maly. Their work appears in journals such as IEEE Transactions on Computers, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Journal of Solid-State Circuits and Computer.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.