R.D. Blanton

2.4k total citations
142 papers, 1.8k citations indexed

About

R.D. Blanton is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Artificial Intelligence. According to data from OpenAlex, R.D. Blanton has authored 142 papers receiving a total of 1.8k indexed citations (citations by other indexed papers that have themselves been cited), including 125 papers in Electrical and Electronic Engineering, 113 papers in Hardware and Architecture and 15 papers in Artificial Intelligence. Recurrent topics in R.D. Blanton's work include VLSI and Analog Circuit Testing (101 papers), Integrated Circuits and Semiconductor Failure Analysis (90 papers) and Low-power high-performance VLSI design (24 papers). R.D. Blanton is often cited by papers focused on VLSI and Analog Circuit Testing (101 papers), Integrated Circuits and Semiconductor Failure Analysis (90 papers) and Low-power high-performance VLSI design (24 papers). R.D. Blanton collaborates with scholars based in United States, Portugal and Malaysia. R.D. Blanton's co-authors include Osei Poku, Nabamita Deb, John P. Hayes, Xin Li, W. Maly, Lawrence T. Pileggi, Ruizhou Ding, Diana Marculescu, Tao Jiang and P. K. Nag and has published in prestigious journals such as Proceedings of the IEEE, IEEE Transactions on Computers and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

In The Last Decade

R.D. Blanton

137 papers receiving 1.7k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R.D. Blanton United States 25 1.5k 1.3k 155 139 134 142 1.8k
Carl Sechen United States 26 2.0k 1.4× 1.4k 1.1× 128 0.8× 28 0.2× 152 1.1× 134 2.3k
Haoxing Ren United States 24 1.4k 1.0× 1.1k 0.8× 134 0.9× 140 1.0× 19 0.1× 115 1.9k
Sule Ozev United States 21 1.7k 1.1× 1.1k 0.8× 45 0.3× 104 0.7× 405 3.0× 202 1.9k
Mark Zwoliński United Kingdom 18 985 0.7× 713 0.6× 26 0.2× 124 0.9× 109 0.8× 183 1.4k
Yici Cai China 20 1.5k 1.0× 826 0.6× 67 0.4× 32 0.2× 131 1.0× 220 1.7k
Alex Orailoğlu United States 26 2.2k 1.5× 2.3k 1.8× 32 0.2× 286 2.1× 60 0.4× 274 2.7k
Helmut Graeb Germany 21 1.6k 1.1× 874 0.7× 57 0.4× 72 0.5× 236 1.8× 122 1.8k
Ranga Vemuri United States 25 1.6k 1.1× 1.8k 1.4× 44 0.3× 52 0.4× 152 1.1× 282 2.5k
Rishad Shafik United Kingdom 18 1.0k 0.7× 400 0.3× 23 0.1× 45 0.3× 69 0.5× 129 1.4k
Dimitris Gizopoulos Greece 30 2.5k 1.7× 2.3k 1.8× 48 0.3× 217 1.6× 34 0.3× 186 3.0k

Countries citing papers authored by R.D. Blanton

Since Specialization
Citations

This map shows the geographic impact of R.D. Blanton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.D. Blanton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.D. Blanton more than expected).

Fields of papers citing papers by R.D. Blanton

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.D. Blanton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.D. Blanton. The network helps show where R.D. Blanton may publish in the future.

Co-authorship network of co-authors of R.D. Blanton

This figure shows the co-authorship network connecting the top 25 collaborators of R.D. Blanton. A scholar is included among the top collaborators of R.D. Blanton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.D. Blanton. R.D. Blanton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Blanton, R.D., et al.. (2022). Secuirty Metrics for Logic Circuits. 53–56. 1 indexed citations
2.
Blanton, R.D., et al.. (2017). Front-end layout reflection for test chip design. 9871. 1–10. 4 indexed citations
3.
Blanton, R.D., et al.. (2016). DFM Evaluation using IC Diagnosis Data. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 1–1. 3 indexed citations
4.
Blanton, R.D., Xin Li, Ken Mai, et al.. (2015). Statistical Learning in Chip (SLIC). International Conference on Computer Aided Design. 664–669. 1 indexed citations
5.
Blanton, R.D., et al.. (2015). Improving accuracy of on-chip diagnosis via incremental learning. 1–6. 14 indexed citations
6.
Zhang, Shanghang, Xin Li, R.D. Blanton, et al.. (2014). Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. Portuguese National Funding Agency for Science, Research and Technology (RCAAP Project by FCT). 4 indexed citations
7.
Blanton, R.D., Xin Li, Ken Mai, et al.. (2014). SLIC: Statistical learning in chip. 119–123. 1 indexed citations
8.
Blanton, R.D., et al.. (2013). SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states. 1–8. 13 indexed citations
9.
Li, Xin, et al.. (2009). Virtual probe. 433–440. 43 indexed citations
10.
Blanton, R.D., et al.. (2004). Path delay test generation for domino logic circuits in the presence of crosstalk. 1. 122–130. 7 indexed citations
11.
Blanton, R.D., et al.. (2004). Analyzing the effectiveness of multiple-detect test sets. 1. 876–885. 49 indexed citations
12.
Blanton, R.D., et al.. (2003). ATPG for Noise-Induced Switch Failures in Domino Logic. International Conference on Computer Aided Design. 765–768. 4 indexed citations
13.
Blanton, R.D., et al.. (2002). Timed Test Generation Crosstalk Switch Failures in Domino CMOS Circuits. 379–388. 11 indexed citations
14.
Blanton, R.D.. (2000). The Challenge of MEMS Test. International Test Conference. 1133. 3 indexed citations
15.
Blanton, R.D., et al.. (2000). Effectiveness of microarchitecture test program generation. IEEE Design & Test of Computers. 17(4). 38–49. 4 indexed citations
16.
Blanton, R.D., et al.. (1999). Inductive Fault Analysis of a Microresonator. TechConnect Briefs. 498–501. 1 indexed citations
17.
Blanton, R.D., et al.. (1998). Fault Model Generation for MEMS. TechConnect Briefs. 111–116. 7 indexed citations
18.
Blanton, R.D. & John P. Hayes. (1997). The input pattern fault model and its application. 628. 3 indexed citations
19.
Blanton, R.D. & John P. Hayes. (1997). Properties of the input pattern fault model. 372–380. 54 indexed citations
20.
Blanton, R.D. & John P. Hayes. (1997). Testability Properties of Divergent Trees. Journal of Electronic Testing. 11(3). 197–209. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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