Robert Aitken

2.7k total citations
70 papers, 1.8k citations indexed

About

Robert Aitken is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering. According to data from OpenAlex, Robert Aitken has authored 70 papers receiving a total of 1.8k indexed citations (citations by other indexed papers that have themselves been cited), including 63 papers in Electrical and Electronic Engineering, 45 papers in Hardware and Architecture and 7 papers in Industrial and Manufacturing Engineering. Recurrent topics in Robert Aitken's work include VLSI and Analog Circuit Testing (41 papers), Integrated Circuits and Semiconductor Failure Analysis (37 papers) and Semiconductor materials and devices (25 papers). Robert Aitken is often cited by papers focused on VLSI and Analog Circuit Testing (41 papers), Integrated Circuits and Semiconductor Failure Analysis (37 papers) and Semiconductor materials and devices (25 papers). Robert Aitken collaborates with scholars based in United States, United Kingdom and Canada. Robert Aitken's co-authors include P.C. Maxwell, Vikas Chandra, Alexander P. Maxwell, P. Nigh, W. Needham, Kenneth M. Butler, Mihir Choudhury, Kartik Mohanram, Richard Dudley and V.K. Agarwal and has published in prestigious journals such as IEEE Transactions on Electron Devices, Computer and IEEE Transactions on Computers.

In The Last Decade

Robert Aitken

68 papers receiving 1.7k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Robert Aitken United States	24	1.7k	1.3k	124	83	63	70	1.8k
Laung‐Terng Wang United States	17	1.3k 0.8×	1.3k 1.0×	156 1.3×	85 1.0×	15 0.2×	45	1.4k
Kuen-Jong Lee Taiwan	20	1.2k 0.7×	1.2k 0.9×	189 1.5×	97 1.2×	14 0.2×	140	1.3k
Anne Gattiker United States	20	1.5k 0.9×	1.0k 0.8×	53 0.4×	84 1.0×	51 0.8×	51	1.6k
Wu-Tung Cheng United States	29	2.8k 1.6×	2.7k 2.0×	232 1.9×	123 1.5×	155 2.5×	182	3.0k
Colin Maunder United Kingdom	7	1.1k 0.6×	1.2k 0.9×	260 2.1×	77 0.9×	12 0.2×	17	1.3k
F.J. Ferguson United States	17	1.0k 0.6×	993 0.8×	80 0.6×	17 0.2×	33 0.5×	46	1.1k
J. Savir United States	19	1.4k 0.8×	1.4k 1.1×	223 1.8×	20 0.2×	15 0.2×	73	1.5k
M. Renovell France	27	2.0k 1.2×	1.8k 1.4×	104 0.8×	71 0.9×	7 0.1×	179	2.1k
A.J. van de Goor Netherlands	29	2.9k 1.7×	2.8k 2.1×	270 2.2×	202 2.4×	10 0.2×	134	3.1k
Raimund Ubar Estonia	14	841 0.5×	903 0.7×	128 1.0×	171 2.1×	8 0.1×	224	1.1k

Countries citing papers authored by Robert Aitken

Since Specialization

Citations

This map shows the geographic impact of Robert Aitken's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Robert Aitken with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Robert Aitken more than expected).

Fields of papers citing papers by Robert Aitken

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Robert Aitken. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Robert Aitken. The network helps show where Robert Aitken may publish in the future.

Co-authorship network of co-authors of Robert Aitken

This figure shows the co-authorship network connecting the top 25 collaborators of Robert Aitken. A scholar is included among the top collaborators of Robert Aitken based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Robert Aitken. Robert Aitken is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Aitken, Robert, Vikas Chandra, Brian Cline, et al.. (2016). Predicting future complementary metal–oxide–semiconductor technology – challenges and approaches. IET Computers & Digital Techniques. 10(6). 315–322.

Wang, Xingsheng, Vihar Georgiev, Salvatore Amoroso, et al.. (2015). Simulation Study of the Impact of Quantum Confinement on the Electrostatically Driven Performance of n-type Nanowire Transistors. IEEE Transactions on Electron Devices. 62(10). 3229–3236. 20 indexed citations

Lai, Liangzhen, Vikas Chandra, Robert Aitken, & Puneet Gupta. (2014). SlackProbe: A Flexible and Efficient In Situ Timing Slack Monitoring Methodology. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 33(8). 1168–1179. 22 indexed citations

Aitken, Robert, et al.. (2014). DFM is dead - Long live DFM. 300–307. 4 indexed citations

Chandra, Vikas, et al.. (2013). Workload dependent NBTI and PBTI analysis for a sub-45nm commercial microprocessor. 3A.1.1–3A.1.6. 50 indexed citations

Choudhury, Mihir, Vikas Chandra, Robert Aitken, & Kartik Mohanram. (2012). Time-Borrowing Circuit Designs and Hardware Prototyping for Timing Error Resilience. IEEE Transactions on Computers. 63(2). 497–509. 34 indexed citations

Wieckowski, Michael, et al.. (2010). A black box method for stability analysis of arbitrary SRAM cell structures. 795–800. 16 indexed citations

Chandra, Vikas & Robert Aitken. (2008). Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. 100 indexed citations

Aitken, Robert & Susanne Becker. (2004). Cell library techniques using advanced transistor structures. 199–204. 1 indexed citations

10.

Aitken, Robert. (2003). Extending the pseudo-stuck-at fault model to provide complete IDDQ coverage. 128–134. 7 indexed citations

11.

Maxwell, P.C., et al.. (2002). IDDQ and AC scan: the war against unmodelled defects. 250–258. 100 indexed citations

12.

Nigh, P., W. Needham, Kenneth M. Butler, et al.. (2002). So what is an optimal test mix? A discussion of the SEMATECH methods experiment. 1037–1038. 70 indexed citations

13.

Maxwell, P.C., Robert Aitken, & L.M. Huisman. (2002). The effect on quality of non-uniform fault coverage and fault probability. 739–746. 13 indexed citations

14.

Maxwell, P.C. & Robert Aitken. (2002). Biased voting: A method for simulating CMOS bridging faults in the presence of variable gate logic thresholds. 63–72. 108 indexed citations

15.

Agrawal, Vishwani D., et al.. (1997). Power Dissipation During Testing: Should We Worry About it?. 456–457. 13 indexed citations

16.

Aitken, Robert. (1995). An overview of test synthesis tools. IEEE Design & Test of Computers. 12(2). 8–15. 4 indexed citations

17.

Maxwell, P.C. & Robert Aitken. (1993). Test sets and reject rates: all fault coverages are not created equal. IEEE Design & Test of Computers. 10(1). 42–51. 42 indexed citations

18.

Maxwell, P.C., et al.. (1992). The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need?. International Test Conference. 168–177. 102 indexed citations

19.

Maxwell, P.C. & Robert Aitken. (1992). I DDQ testing as a component of a test suite: The need for several fault coverage metrics. Journal of Electronic Testing. 3(4). 305–316. 65 indexed citations

20.

Aitken, Robert. (1992). Diagnosis of leakage faults with I DDQ. Journal of Electronic Testing. 3(4). 367–375. 42 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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