Robert Aitken
- Electrical and Electronic Engineering top 2%
- Hardware and Architecture top 0.5%
- Control and Systems Engineering top 10%
- Computer Networks and Communications top 10%
- Industrial and Manufacturing Engineering top 5%
- Co-authors
- P.C. MaxwellVikas ChandraAlexander P. MaxwellP. NighW. NeedhamKenneth M. ButlerMihir ChoudhuryKartik Mohanram
- Topics
- VLSI and Analog Circuit Testing (41 papers)Integrated Circuits and Semiconductor Failure Analysis (37 papers)Semiconductor materials and devices (25 papers)
- Partner nations
- United StatesUnited KingdomCanada
In The Last Decade
Robert Aitken
68 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 48
- Electrical and Electronic Engineering 1.7k
- Hardware and Architecture 1.3k
- Control and Systems Engineering 124
- Computer Networks and Communications 83
- Industrial and Manufacturing Engineering 63
Countries citing papers authored by Robert Aitken
This map shows the geographic impact of Robert Aitken's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Robert Aitken with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Robert Aitken more than expected).
Fields of papers citing papers by Robert Aitken
This network shows the impact of papers produced by Robert Aitken. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Robert Aitken. The network helps show where Robert Aitken may publish in the future.
Co-authorship network of co-authors of Robert Aitken
This figure shows the co-authorship network connecting the top 25 collaborators of Robert Aitken. A scholar is included among the top collaborators of Robert Aitken based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Robert Aitken. Robert Aitken is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 20 | |
| 3 | 22 | |
| 4 | 4 | |
| 5 | 50 | |
| 6 | 34 | |
| 7 | 16 | |
| 8 | 100 | |
| 9 | 1 | |
| 10 | 7 | |
| 11 | 100 | |
| 12 | 70 | |
| 13 | 13 | |
| 14 | 108 | |
| 15 | Power Dissipation During Testing: Should We Worry About it? | 13 |
| 16 | 4 | |
| 17 | 42 | |
| 18 | The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? | 102 |
| 19 | 65 | |
| 20 | 42 |
About Robert Aitken
Robert Aitken is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 70 papers that have together received 1.8k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (41 papers), Integrated Circuits and Semiconductor Failure Analysis (37 papers) and Semiconductor materials and devices (25 papers). The work is most often cited by research in Hardware and Architecture (1.3k citations), Electrical and Electronic Engineering (1.7k citations) and Software (62 citations). Robert Aitken has collaborated with scholars based in United States, United Kingdom and Canada. Frequent co-authors include P.C. Maxwell, Vikas Chandra, Alexander P. Maxwell, P. Nigh, W. Needham, Kenneth M. Butler, Mihir Choudhury, Kartik Mohanram, Richard Dudley and V.K. Agarwal. Their work appears in journals such as IEEE Transactions on Electron Devices, Computer and IEEE Transactions on Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.