W. Needham

501 total citations
9 papers, 371 citations indexed

About

W. Needham is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, W. Needham has authored 9 papers receiving a total of 371 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Hardware and Architecture, 6 papers in Electrical and Electronic Engineering and 1 paper in Control and Systems Engineering. Recurrent topics in W. Needham's work include VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Advancements in Photolithography Techniques (2 papers). W. Needham is often cited by papers focused on VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Advancements in Photolithography Techniques (2 papers). W. Needham collaborates with scholars based in United States and United Kingdom. W. Needham's co-authors include Eng‐Kiong Yeoh, Kenneth M. Butler, Alexander P. Maxwell, Robert Aitken, P. Nigh, W. Maly, P.C. Maxwell and Shianling Wu and has published in prestigious journals such as Computer, IEEE Design & Test of Computers and Medical Entomology and Zoology.

In The Last Decade

W. Needham

9 papers receiving 344 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
W. Needham United States	7	355	326	30	10	9	9	371
S. Eichenberger Netherlands	12	543 1.5×	509 1.6×	22 0.7×	9 0.9×	8 0.9×	25	567
B. Kruseman Netherlands	14	576 1.6×	516 1.6×	31 1.0×	12 1.2×	6 0.7×	35	600
G. Gronthoud Netherlands	12	447 1.3×	429 1.3×	35 1.2×	11 1.1×	11 1.2×	26	470
A.S.M. Hassan Canada	5	320 0.9×	309 0.9×	40 1.3×	9 0.9×	28 3.1×	6	340
Urban Ingelsson Sweden	10	276 0.8×	285 0.9×	43 1.4×	8 0.8×	27 3.0×	25	307
S.D. Millman United States	9	341 1.0×	346 1.1×	45 1.5×	14 1.4×	7 0.8×	14	356
E. Volkerink United States	10	381 1.1×	390 1.2×	70 2.3×	18 1.8×	14 1.6×	12	402
Emil Gizdarski United States	9	343 1.0×	345 1.1×	63 2.1×	15 1.5×	7 0.8×	24	356
Rubin Parekhji India	12	312 0.9×	293 0.9×	33 1.1×	19 1.9×	29 3.2×	65	332
P. Varma United States	7	278 0.8×	295 0.9×	53 1.8×	11 1.1×	25 2.8×	18	307

Countries citing papers authored by W. Needham

Since Specialization

Citations

This map shows the geographic impact of W. Needham's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Needham with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Needham more than expected).

Fields of papers citing papers by W. Needham

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. Needham. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Needham. The network helps show where W. Needham may publish in the future.

Co-authorship network of co-authors of W. Needham

This figure shows the co-authorship network connecting the top 25 collaborators of W. Needham. A scholar is included among the top collaborators of W. Needham based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W. Needham. W. Needham is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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9 of 9 papers shown

1.

Nigh, P., W. Needham, Kenneth M. Butler, et al.. (2002). So what is an optimal test mix? A discussion of the SEMATECH methods experiment. 1037–1038. 70 indexed citations

2.

Needham, W., et al.. (2002). DFT strategy for Intel microprocessors. 396–399. 15 indexed citations

3.

Nigh, P., W. Needham, Kenneth M. Butler, Alexander P. Maxwell, & Robert Aitken. (2002). An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. 459–464. 105 indexed citations

4.

Needham, W., et al.. (2002). High volume microprocessor test escapes, an analysis of defects our tests are missing. 25–34. 152 indexed citations

5.

Needham, W.. (1999). Nanometer technology challenges for test and test equipment. Computer. 32(11). 52–57. 10 indexed citations

6.

Maxwell, P.C., et al.. (1998). Best Methods for At-Speed Testing?. 10(2). 460–461. 8 indexed citations

7.

Butler, Kenneth M., et al.. (1998). Relative Effectiveness Of Tests. IEEE Design & Test of Computers. 15(1). 83–90. 4 indexed citations

8.

Needham, W.. (1998). Microprocessor Testing Today. IEEE Design & Test of Computers. 15(3). 56–57. 1 indexed citations

9.

Needham, W.. (1991). Designer's Guide to Testable Asic Devices. Medical Entomology and Zoology. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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