John M. Carulli

1.4k total citations · 1 hit paper
50 papers, 1.0k citations indexed

About

John M. Carulli is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering. According to data from OpenAlex, John M. Carulli has authored 50 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 25 papers in Hardware and Architecture and 16 papers in Industrial and Manufacturing Engineering. Recurrent topics in John M. Carulli's work include Integrated Circuits and Semiconductor Failure Analysis (23 papers), VLSI and Analog Circuit Testing (20 papers) and Industrial Vision Systems and Defect Detection (16 papers). John M. Carulli is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (23 papers), VLSI and Analog Circuit Testing (20 papers) and Industrial Vision Systems and Defect Detection (16 papers). John M. Carulli collaborates with scholars based in United States, France and Serbia. John M. Carulli's co-authors include Ke Huang, Yiorgos Makris, Ujjwal Guin, Mohammad Tehranipoor, Daniel DiMase, T. J. Anderson, Nathan Kupp, Kenneth M. Butler, V. Reddy and A.T. Krishnan and has published in prestigious journals such as Journal of Applied Physics, Proceedings of the IEEE and Japanese Journal of Applied Physics.

In The Last Decade

John M. Carulli

48 papers receiving 988 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

2014 353 citations Ke Huang, John M. Carulli et al. profile →

Peers

John M. Carulli

EEE

HA

IME

AI

CMN

M.L. Bushnell United States

Cunxi Yu United States

Benjamin Carrión Schäfer United States

Xuefei Ning China

Qiang Zhou China

Stephen Trimberger United States

Ben Keller United States

Farzan Aminian United States

Mehran Aminian United States

M.L. Bushnell United States

John M. Carulli

1.7k ×2.1

EEE

1.6k ×2.3

HA

56 ×0.3

IME

99 ×1.0

AI

45 ×0.5

CMN

Citations per year, relative to John M. Carulli John M. Carulli (= 1×) peers M.L. Bushnell

Countries citing papers authored by John M. Carulli

Since Specialization

Citations

This map shows the geographic impact of John M. Carulli's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John M. Carulli with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John M. Carulli more than expected).

Fields of papers citing papers by John M. Carulli

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John M. Carulli. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John M. Carulli. The network helps show where John M. Carulli may publish in the future.

Co-authorship network of co-authors of John M. Carulli

This figure shows the co-authorship network connecting the top 25 collaborators of John M. Carulli. A scholar is included among the top collaborators of John M. Carulli based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John M. Carulli. John M. Carulli is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Pan, Yan, et al.. (2017). Systematic defect detection methodology for volume diagnosis: A data mining perspective. di. 1–10. 9 indexed citations

2.

Stratigopoulos, Haralampos‐G., et al.. (2017). Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36(12). 2120–2133. 7 indexed citations

3.

Leisenberger, F.P., et al.. (2016). Variation and failure characterization through pattern classification of test data from multiple test stages. Rare & Special e-Zone (The Hong Kong University of Science and Technology). 5 indexed citations

4.

Li, Xin, et al.. (2015). A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. Design, Automation, and Test in Europe. 1042–1047. 4 indexed citations

5.

Zhang, Shanghang, Xin Li, R.D. Blanton, et al.. (2014). Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. Portuguese National Funding Agency for Science, Research and Technology (RCAAP Project by FCT). 4 indexed citations

6.

Huang, Ke, et al.. (2014). IC laser trimming speed-up through wafer-level spatial correlation modeling. 1–7. 6 indexed citations

7.

Nourani, Mehrdad, et al.. (2014). Reliability improvement of logic and clock paths in power-efficient designs. ACM Journal on Emerging Technologies in Computing Systems. 10(1). 1–23. 2 indexed citations

8.

Huang, Ke, et al.. (2014). Low-Cost Analog/RF IC Testing through Combined Intra- and Inter-Die Correlation Models. IEEE Design and Test. 1–1. 8 indexed citations

9.

Huang, Ke, Nathan Kupp, John M. Carulli, & Yiorgos Makris. (2013). Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. Design, Automation, and Test in Europe. 553–558. 10 indexed citations

10.

Huang, Ke, Nathan Kupp, John M. Carulli, & Yiorgos Makris. (2013). Process monitoring through wafer-level spatial variation decomposition. 1–10. 14 indexed citations

11.

Huang, Ke, John M. Carulli, & Yiorgos Makris. (2013). Counterfeit electronics: A rising threat in the semiconductor manufacturing industry. 1–4. 32 indexed citations

12.

Huang, Ke, Nathan Kupp, John M. Carulli, & Yiorgos Makris. (2013). Handling Discontinuous Effects in Modeling Spatial Correlation of Wafer-level Analog/RF Tests. Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013. 553–558. 12 indexed citations

13.

Chen, Min, Haldun Küflüoğlu, John M. Carulli, & V. Reddy. (2013). Aging sensors for workload centric guardbanding in dynamic voltage scaling applications. 4A.2.1–4A.2.5. 14 indexed citations

14.

Daasch, W.R., et al.. (2011). Die-level adaptive test: Real-time test reordering and elimination. 1–10. 17 indexed citations

15.

Krishnan, Anand, et al.. (2010). Product drift from NBTI: Guardbanding, circuit and statistical effects. 4.3.1–4.3.4. 30 indexed citations

16.

Marinissen, Erik Jan, Adit D. Singh, Marco Esposito, et al.. (2010). Adapting to adaptive testing. 556–561. 17 indexed citations

17.

Carulli, John M. & T. J. Anderson. (2006). The impact of multiple failure modes on estimating product field reliability. IEEE Design & Test of Computers. 23(2). 118–126. 30 indexed citations

18.

Balachandran, H., et al.. (2002). Logic mapping on a microprocessor. 701–710. 14 indexed citations

19.

Carulli, John M., et al.. (1999). <title>Frequency distribution modeling for high-speed microprocessors using on-chip ring oscillators</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3884. 146–155. 1 indexed citations

20.

Varhue, W. J., John M. Carulli, G. G. Peterson, & Jimmie A. Miller. (1992). Low temperature epitaxial growth of Ge using electron-cyclotron-resonance plasma-assisted chemical vapor deposition. Journal of Applied Physics. 71(4). 1949–1954. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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