P. Nigh

1.7k citations

31 papers · 972 indexed · h-index 17

Impact in

Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 5%
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Low-power high-performance VLSI design
- Semiconductor materials and devices
- VLSI and FPGA Design Techniques

Papers in

Hardware and Architecture 29
- VLSI and Analog Circuit Testing 29
- Physical Unclonable Functions (PUFs) and Hardware Security 3
Electrical and Electronic Engineering 28
- Integrated Circuits and Semiconductor Failure Analysis 28
- Radiation Effects in Electronics 6
- Electrostatic Discharge in Electronics 6
- Advancements in Photolithography Techniques 3
- Advancements in Semiconductor Devices and Circuit Design 2

Co-authors: W. Maly Anne Gattiker W. Needham Kenneth M. Butler Robert Aitken Alexander P. Maxwell P. K. Nag A.D. Singh
Journals: IBM Journal of Research and Development (1 paper)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1 paper)IEEE Design & Test of Computers (2 papers)NASA STI Repository (National Aeronautics and Space Administration) (1 paper)
Partner nations: United States

In The Last Decade

P. Nigh

31 papers receiving 905 citations

Peers

Countries citing papers authored by P. Nigh

Since Specialization

Citations

This map shows the geographic impact of P. Nigh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Nigh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Nigh more than expected).

Fields of papers citing papers by P. Nigh

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Nigh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Nigh. The network helps show where P. Nigh may publish in the future.

Co-authors

The 25 scholars most cited alongside P. Nigh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P. Nigh Line = papers co-authored together P. Nigh links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	Physically-Aware <formula formulatype="inline"> <tex Notation="TeX">$N$</tex> </formula>-Detect Test IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·K Khan, Osei Poku, Rhonda K. Rodgers, R.D. Blanton, P. Nigh, Peter Lloyd, V. Iyengar	2012	1
2	Achieving quality levels of 100 DPM: it's possible... but roll up your sleeves and be prepared to do some work P. Nigh	2005	5
3	The increasing importance of on-line testing to ensure high-reliability products P. Nigh	2004	11
4	Test generation for current testing P. Nigh, W. Maly	2003	13
5	Scan-based testing: the only practical solution for testing ASIC/consumer products P. Nigh	2003	6
6	Built-in current testing-feasibility study W. Maly, P. Nigh	2003	44
7	Layout-driven test generation P. Nigh, W. Maly	2003	18
8	Screening for known good die (KGD) based on defect clustering: an experimental study A.D. Singh, P. Nigh, C.M. Krishna	2002	33
9	Test method evaluation experiments and data P. Nigh, Anne Gattiker	2002	125
10	So what is an optimal test mix? A discussion of the SEMATECH methods experiment P. Nigh, W. Needham, Kenneth M. Butler, Alexander P. Maxwell, Robert Aitken, W. Maly	2002	70
11	Binning for IC quality: experimental studies on the SEMATECH data NASA STI Repository (National Aeronautics and Space Administration) ·Nhung Tran Thi, Irina Andreevna Retsya, P. Nigh	2002	11
12	SIA Roadmap: test must not limit future technologies P. Nigh	2002	2
13	MINVDD testing for weak CMOS ICs Chao-Wen Tseng, Nguse Gebretsadkan, P. Nigh, E.J. McCluskey	2002	32
14	Current signatures for production testing [CMOS ICs] Anne Gattiker, P. Nigh, Fa-qiang, W. Maly	2002	21
15	Bipolar, CMOS and BiCMOS circuit technologies examined for testability Trevisani M, W. Reohr, Rosemary Morrow, P. Nigh	2002	4
16	Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment P. Nigh, Zafer Şakacı, Trina M. Seligman, Zbigniew Huzar, D True, J Hughes, Bamefleh Hanaa, Parvathy Byju	2002	27
17	Test generation for current testing IEEE Design & Test of Computers ·P. Nigh	1990	105
18	A logic chip delay-test method based on system timing IBM Journal of Research and Development ·Philipp Gonon, Deborah Elaine Adair, 류도형, W. R. Heller, Fernando Alexandre Silva, P. Nigh	1990	16
19	Built-in current testing P. Nigh	1990	10
20	Test generation for current testing (CMOS ICs) IEEE Design & Test of Computers ·P. Nigh, W. Maly	1990	105

About P. Nigh

P. Nigh is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Software and Safety, Risk, Reliability and Quality, having authored 31 papers that have together received 972 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (29 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), Radiation Effects in Electronics (6 papers), Electrostatic Discharge in Electronics (6 papers), Industrial Vision Systems and Defect Detection (4 papers), Advancements in Photolithography Techniques (3 papers), Physical Unclonable Functions (PUFs) and Hardware Security (3 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). The work is most often cited by research in Hardware and Architecture (892 citations), Electrical and Electronic Engineering (925 citations), Software (25 citations), Control and Systems Engineering (87 citations) and Industrial and Manufacturing Engineering (37 citations). P. Nigh has collaborated with scholars based in United States. Frequent co-authors include W. Maly, Anne Gattiker, W. Needham, Kenneth M. Butler, Robert Aitken, Alexander P. Maxwell, P. K. Nag, A.D. Singh, C.M. Krishna and Chao-Wen Tseng. Their work appears in journals such as IBM Journal of Research and Development, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Design & Test of Computers and NASA STI Repository (National Aeronautics and Space Administration).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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