D. Appello

564 total citations
56 papers, 403 citations indexed

About

D. Appello is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, D. Appello has authored 56 papers receiving a total of 403 indexed citations (citations by other indexed papers that have themselves been cited), including 50 papers in Hardware and Architecture, 47 papers in Electrical and Electronic Engineering and 4 papers in Control and Systems Engineering. Recurrent topics in D. Appello's work include VLSI and Analog Circuit Testing (47 papers), Integrated Circuits and Semiconductor Failure Analysis (39 papers) and Radiation Effects in Electronics (14 papers). D. Appello is often cited by papers focused on VLSI and Analog Circuit Testing (47 papers), Integrated Circuits and Semiconductor Failure Analysis (39 papers) and Radiation Effects in Electronics (14 papers). D. Appello collaborates with scholars based in Italy, United States and Switzerland. D. Appello's co-authors include Paolo Bernardi, M. Sonza Reorda, Michelangelo Grosso, Maurizio Rebaudengo, Aubin Roy, Stephen Sunter, Emil Gizdarski, Ernesto Sánchez, M. Violante and Ilia Polian and has published in prestigious journals such as IEEE Access, IEEE Transactions on Computers and IEEE Transactions on Nuclear Science.

In The Last Decade

D. Appello

54 papers receiving 373 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D. Appello Italy 12 344 340 52 35 24 56 403
Sreejit Chakravarty United States 13 485 1.4× 507 1.5× 55 1.1× 17 0.5× 9 0.4× 57 538
LeRoy Winemberg United States 13 276 0.8× 330 1.0× 24 0.5× 58 1.7× 17 0.7× 41 401
Chris Schuermyer United States 11 400 1.2× 407 1.2× 39 0.8× 72 2.1× 8 0.3× 19 435
C. Hora Netherlands 13 447 1.3× 482 1.4× 36 0.7× 29 0.8× 6 0.3× 27 507
B. Kruseman Netherlands 14 516 1.5× 576 1.7× 31 0.6× 14 0.4× 10 0.4× 35 600
S. Eichenberger Netherlands 12 509 1.5× 543 1.6× 22 0.4× 19 0.5× 7 0.3× 25 567
H. Hashempour United States 12 278 0.8× 392 1.2× 28 0.5× 11 0.3× 50 2.1× 32 412
P. Nigh United States 17 892 2.6× 925 2.7× 87 1.7× 37 1.1× 20 0.8× 31 972
Jeff Rearick United States 12 609 1.8× 594 1.7× 95 1.8× 10 0.3× 12 0.5× 38 638
Prashant Goteti United States 8 248 0.7× 251 0.7× 55 1.1× 10 0.3× 29 1.2× 14 283

Countries citing papers authored by D. Appello

Since Specialization
Citations

This map shows the geographic impact of D. Appello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Appello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Appello more than expected).

Fields of papers citing papers by D. Appello

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Appello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Appello. The network helps show where D. Appello may publish in the future.

Co-authorship network of co-authors of D. Appello

This figure shows the co-authorship network connecting the top 25 collaborators of D. Appello. A scholar is included among the top collaborators of D. Appello based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Appello. D. Appello is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Appello, D., Alessandro Beghi, Santa Di Cataldo, et al.. (2024). An AI-Enabled Framework for Smart Semiconductor Manufacturing. Research Padua Archive (University of Padua). 1–6. 2 indexed citations
2.
Bernardi, Paolo, et al.. (2023). On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. 1–6. 1 indexed citations
3.
Bernardi, Paolo, et al.. (2023). A guided debugger-based fault injection methodology for assessing functional test programs. 1–7. 3 indexed citations
4.
5.
Appello, D., et al.. (2022). A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Transactions on Computers. 72(5). 1447–1459. 1 indexed citations
6.
Bernardi, Paolo, et al.. (2022). An innovative Strategy to Quickly Grade Functional Test Programs. 355–364. 7 indexed citations
7.
Bernardi, Paolo, et al.. (2022). A novel SEU injection setup for Automotive SoC. 623–626. 3 indexed citations
8.
Appello, D., et al.. (2022). Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access. 10. 56440–56457. 3 indexed citations
9.
10.
Appello, D., et al.. (2021). System-Level Test: State of the Art and Challenges. 1–7. 21 indexed citations
11.
12.
Bernardi, Paolo, et al.. (2021). Innovative methods for Burn-In related Stress Metrics Computation. 1–6. 9 indexed citations
13.
14.
Rech, Paolo, et al.. (2010). Evaluating the Impact of DfM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core. IEEE Transactions on Nuclear Science. 57(4). 2098–2105. 5 indexed citations
15.
16.
Appello, D., et al.. (2006). Embedded Memory Diagnosis: An Industrial Workflow. 5. 1–9. 17 indexed citations
17.
Appello, D., et al.. (2004). Understanding yield losses in logic circuits. IEEE Design & Test of Computers. 21(3). 208–215. 21 indexed citations
18.
Appello, D., et al.. (2003). A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. Journal of Electronic Testing. 20(1). 79–87. 6 indexed citations
19.
Appello, D., et al.. (2002). A New Methodology for Debugging Embedded Cores. PORTO Publications Open Repository TOrino (Politecnico di Torino). 1 indexed citations
20.
Appello, D., Fulvio Corno, Mario B. Giovinetto, Maurizio Rebaudengo, & M. Sonza Reorda. (2001). A P1500 compliant BIST-based approach to embedded RAM diagnosis. 97–102. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Sreejit Chakravarty Breakdown of academic impact, for papers by LeRoy Winemberg Breakdown of academic impact, for papers by Chris Schuermyer Breakdown of academic impact, for papers by C. Hora Breakdown of academic impact, for papers by B. Kruseman Breakdown of academic impact, for papers by S. Eichenberger Breakdown of academic impact, for papers by H. Hashempour Breakdown of academic impact, for papers by P. Nigh Breakdown of academic impact, for papers by Jeff Rearick Breakdown of academic impact, for papers by Prashant Goteti
Rankless by CCL
2026