D. Appello
- Hardware and Architecture top 2%
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering
- Industrial and Manufacturing Engineering top 10%
- Biomedical Engineering
- Co-authors
- Paolo BernardiM. Sonza ReordaMichelangelo GrossoMaurizio RebaudengoAubin RoyStephen SunterEmil GizdarskiErnesto Sánchez
- Topics
- VLSI and Analog Circuit Testing (47 papers)Integrated Circuits and Semiconductor Failure Analysis (39 papers)Radiation Effects in Electronics (14 papers)
- Partner nations
- ItalyUnited StatesSwitzerland
In The Last Decade
D. Appello
54 papers receiving 373 citations
Peers
Comparison fields: 5 of 34
- Hardware and Architecture 344
- Electrical and Electronic Engineering 340
- Control and Systems Engineering 52
- Industrial and Manufacturing Engineering 35
- Biomedical Engineering 24
Countries citing papers authored by D. Appello
This map shows the geographic impact of D. Appello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Appello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Appello more than expected).
Fields of papers citing papers by D. Appello
This network shows the impact of papers produced by D. Appello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Appello. The network helps show where D. Appello may publish in the future.
Co-authorship network of co-authors of D. Appello
This figure shows the co-authorship network connecting the top 25 collaborators of D. Appello. A scholar is included among the top collaborators of D. Appello based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Appello. D. Appello is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 1 | |
| 3 | 3 | |
| 4 | 2 | |
| 5 | 1 | |
| 6 | 7 | |
| 7 | 3 | |
| 8 | 3 | |
| 9 | 6 | |
| 10 | 21 | |
| 11 | 6 | |
| 12 | 9 | |
| 13 | 15 | |
| 14 | 5 | |
| 15 | 2 | |
| 16 | 17 | |
| 17 | 21 | |
| 18 | 6 | |
| 19 | A New Methodology for Debugging Embedded Cores | 1 |
| 20 | 14 |
About D. Appello
D. Appello is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 56 papers that have together received 403 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (47 papers), Integrated Circuits and Semiconductor Failure Analysis (39 papers) and Radiation Effects in Electronics (14 papers). The work is most often cited by research in Hardware and Architecture (344 citations), Software (23 citations) and Electrical and Electronic Engineering (340 citations). D. Appello has collaborated with scholars based in Italy, United States and Switzerland. Frequent co-authors include Paolo Bernardi, M. Sonza Reorda, Michelangelo Grosso, Maurizio Rebaudengo, Aubin Roy, Stephen Sunter, Emil Gizdarski, Ernesto Sánchez, M. Violante and Ilia Polian. Their work appears in journals such as IEEE Access, IEEE Transactions on Computers and IEEE Transactions on Nuclear Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.