W. Maly

6.2k citations
181 papers · 4.1k indexed · h-index 34

W. Maly

172 papers receiving 3.8k citations

Peers

W. Maly
Comparison fields: 5 of 68
  • Hardware and Architecture 3.1k
  • Electrical and Electronic Engineering 3.7k
  • Industrial and Manufacturing Engineering 409
  • Software 69
  • Computer Networks and Communications 210
Replace M.A. Breuer with:
M.A. Breuer United States
C.H. Stapper United States
Andrzej J. Strojwas United States
Malgorzata Marek-Sadowska United States
Chris Chu United States
R.D. Blanton United States
Ranga Vemuri United States
Carl Sechen United States
Haoxing Ren United States
Yici Cai China
W. Maly relative to M.A. Breuer United States M.A. Breuer's profile →
Citations per field
00.5×4.8×
M.A. Breuer · 1×
Citations per year

Countries citing papers authored by W. Maly

Since Specialization
Citations

This map shows the geographic impact of W. Maly's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Maly with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Maly more than expected).

Fields of papers citing papers by W. Maly

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. Maly. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Maly. The network helps show where W. Maly may publish in the future.

Co-authorship network

The 25 scholars most cited alongside W. Maly, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with W. Maly Line = papers co-authored together W. Maly links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20181
2
Twin gate, vertical slit FET (VeSFET) for highly periodic layout and 3D integration
201152
3
Adiabatic Circuits using Vertical Slit Field Effect Transistor
20092
4 20069
5 200435
6 20023
7 200216
8 20010
9 19985
10 199618
11 199633
12
Fatal Fault Probability Prediction for Array Based Designs
19961
13 19966
14
Statistical approach to VLSI
199423
15 19927
16
Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987
19886
17 19865
18 19865
19 1985159
20
Systematic characterization of physical defects for fault analysis of MOS IC cells
198484

About W. Maly

W. Maly is a scholar working on Hardware and Architecture, Industrial and Manufacturing Engineering, Electrical and Electronic Engineering, Computer Graphics and Computer-Aided Design and Management Science and Operations Research, having authored 181 papers that have together received 4.1k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (106 papers), Integrated Circuits and Semiconductor Failure Analysis (94 papers), VLSI and FPGA Design Techniques (45 papers), Advancements in Photolithography Techniques (35 papers), Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (30 papers), Low-power high-performance VLSI design (22 papers) and Manufacturing Process and Optimization (21 papers). The work is most often cited by research in Hardware and Architecture (3.1k citations), Electrical and Electronic Engineering (3.7k citations), Industrial and Manufacturing Engineering (409 citations), Software (69 citations) and Computer Networks and Communications (210 citations). W. Maly has collaborated with scholars based in United States, Poland and Germany. Frequent co-authors include John Paul Shen, Anne Gattiker, P. Nigh, Frances Ferguson, J. Khare, Andrzej J. Strojwas, Yangdong Deng, M.J. Patyra, P. K. Nag and D.B.I. Feltham. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Semiconductor Manufacturing, IEEE Journal of Solid-State Circuits, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Quality and Reliability Engineering International.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Rankless by CCL
2026