Keith Jackson

500 total citations
29 papers, 257 citations indexed

About

Keith Jackson is a scholar working on Electrical and Electronic Engineering, Radiation and Computer Vision and Pattern Recognition. According to data from OpenAlex, Keith Jackson has authored 29 papers receiving a total of 257 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 13 papers in Radiation and 9 papers in Computer Vision and Pattern Recognition. Recurrent topics in Keith Jackson's work include Advancements in Photolithography Techniques (22 papers), Advanced X-ray Imaging Techniques (13 papers) and Optical measurement and interference techniques (9 papers). Keith Jackson is often cited by papers focused on Advancements in Photolithography Techniques (22 papers), Advanced X-ray Imaging Techniques (13 papers) and Optical measurement and interference techniques (9 papers). Keith Jackson collaborates with scholars based in United States. Keith Jackson's co-authors include Kenneth A. Goldberg, Patrick Naulleau, Paul Denham, Erik H. Anderson, Jeffrey Bokor, Senajith Rekawa, J. Alexander Liddle, David Attwood, Chantal G. Khan Malek and Tsun‐Hsu Chang and has published in prestigious journals such as Journal of Micromechanics and Microengineering, Journal of Vacuum Science and Technology and Sensors and Materials.

In The Last Decade

Keith Jackson

27 papers receiving 242 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Keith Jackson United States	9	173	88	61	55	50	29	257
Douglas S. Goodman United States	12	88 0.5×	13 0.1×	22 0.4×	46 0.8×	65 1.3×	41	415
Po-Jui Chiang Taiwan	10	200 1.2×	9 0.1×	50 0.8×	8 0.1×	35 0.7×	26	411
David B. Salzman United States	5	133 0.8×	15 0.2×	32 0.5×	14 0.3×	38 0.8×	9	195
Brian Cross United States	6	45 0.3×	105 1.2×	24 0.4×	4 0.1×	83 1.7×	20	224
J. John India	10	182 1.1×	21 0.2×	22 0.4×	3 0.1×	135 2.7×	23	286
Nitesh Pandey Ireland	10	63 0.4×	17 0.2×	20 0.3×	92 1.7×	42 0.8×	21	310
Alexander Mazzolini Australia	13	105 0.6×	119 1.4×	94 1.5×	2 0.0×	111 2.2×	32	395
Jonathan Cobb United States	9	282 1.6×	21 0.2×	92 1.5×	3 0.1×	106 2.1×	41	312
Juan C. González Spain	12	170 1.0×	2 0.0×	62 1.0×	11 0.2×	144 2.9×	23	359
Jan-Christian Kuhr Germany	7	146 0.8×	55 0.6×	173 2.8×	2 0.0×	10 0.2×	11	283

Countries citing papers authored by Keith Jackson

Since Specialization

Citations

This map shows the geographic impact of Keith Jackson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Keith Jackson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Keith Jackson more than expected).

Fields of papers citing papers by Keith Jackson

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Keith Jackson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Keith Jackson. The network helps show where Keith Jackson may publish in the future.

Co-authorship network of co-authors of Keith Jackson

This figure shows the co-authorship network connecting the top 25 collaborators of Keith Jackson. A scholar is included among the top collaborators of Keith Jackson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Keith Jackson. Keith Jackson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Manenti, Riccardo, Eyob A. Sete, Jen-Hao Yeh, et al.. (2021). Full control of superconducting qubits with combined on-chip microwave and flux lines. arXiv (Cornell University). 8 indexed citations

Fitzgerald, Alissa, et al.. (2018). Translational Engineering: Best Practices in Developing MEMS for Volume Manufacturing. Sensors and Materials. 779–779. 1 indexed citations

Naulleau, Patrick, Kenneth A. Goldberg, Erik Anderson, et al.. (2005). Characterization of the synchrotron-based 0.3-NA EUV microexposuretool at the ALS. Journal of Vacuum Science and Technology. 23(6). 1 indexed citations

Goldberg, Kenneth A., Patrick Naulleau, Senajith Rekawa, et al.. (2005). Ultra-high accuracy optical testing: creating diffraction-limited short-wavelength optical systems. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5900. 59000G–59000G. 6 indexed citations

Goldberg, Kenneth A., Patrick Naulleau, Paul Denham, et al.. (2004). EUV interferometric testing and alignment of the 0.3-NA MET optic. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5374. 64–64. 16 indexed citations

Naulleau, Patrick, Kenneth A. Goldberg, Erik Anderson, et al.. (2004). Extreme ultraviolet microexposures at the Advanced Light Source using the 0.3 numerical aperture micro-exposure tool optic. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 22(6). 2962–2965. 29 indexed citations

Goldberg, Kenneth A., Patrick Naulleau, Paul Denham, et al.. (2004). At-wavelength alignment and testing of the 0.3 NA MET optic. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 22(6). 2956–2961. 26 indexed citations

Goldberg, Kenneth A., Patrick Naulleau, Senajith Rekawa, et al.. (2003). At-wavelength interferometry of high-NA diffraction-limited EUV optics. University of North Texas Digital Library (University of North Texas). 1 indexed citations

Goldberg, Kenneth A., Patrick Naulleau, Paul Denham, et al.. (2003). EUV interferometry of the 0.3-NA MET optic. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5037. 69–69. 7 indexed citations

10.

Naulleau, Patrick, Kenneth A. Goldberg, Erik H. Anderson, et al.. (2003). Static EUV micro-exposures using the ETS Set-2 optics. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5037. 36–36. 4 indexed citations

11.

Naulleau, Patrick, Kenneth A. Goldberg, Erik H. Anderson, et al.. (2003). Printing-based performance analysis of the engineering test stand set-2 optic using a synchrotron exposure station with variable sigma. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 21(6). 2697–2700. 2 indexed citations

12.

Naulleau, Patrick, Kenneth A. Goldberg, Erik H. Anderson, et al.. (2002). Lithographic characterization of the printability of programmed EUV substrate defects. University of North Texas Digital Library (University of North Texas). 21(4). 1 indexed citations

13.

Naulleau, Patrick, Kenneth A. Goldberg, Erik H. Anderson, et al.. (2001). <title>Adding static printing capabilities to the EUV phase-shifting point diffraction interferometer</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4343. 639–645. 7 indexed citations

14.

Attwood, David, Erik H. Anderson, Jeffrey Bokor, et al.. (1998). At-Wavelength Metrologies for Extreme Ultraviolet Lithography. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 9(1). 5–14.

15.

Goldberg, Kenneth A., Edita Tejnil, Sang Hun Lee, et al.. (1997). Characterization of an EUV Schwarzschild objective using phase-shifting point diffraction interferometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3048. 264–264. 19 indexed citations

16.

Malek, Chantal Khan, et al.. (1996). Masks for high aspect ratio x-ray lithography. Journal of Micromechanics and Microengineering. 6(2). 228–235. 17 indexed citations

17.

Brennen, Reid A., M. H. Hecht, T. D. Stowe, et al.. (1995). <title>Fabricating subcollimating grids for an x-ray solar imaging spectrometer using LIGA techniques</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2640. 214–225. 1 indexed citations

18.

Jackson, Keith, et al.. (1995). <title>Fabrication of miniaturized electrostatic deflectors using LIGA</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2640. 204–213. 41 indexed citations

19.

Attwood, David, Gary E. Sommargren, Jeffrey Bokor, et al.. (1993). Undulator radiation for at-wavelength interferometry of optics for extreme-ultraviolet lithography. Applied Optics. 32(34). 7022–7022. 32 indexed citations

20.

Jackson, Keith, et al.. (1988). Measurement of stress in semiconductor materials using the photoelastic effect. Conference on Lasers and Electro-Optics. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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