Pei-yang Yan
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 36
- Structural Biology top 10%
- Radiation top 10%
- Advanced X-ray Imaging Techniques 3
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- Advancements in Photolithography Techniques 55
- Integrated Circuits and Semiconductor Failure Analysis 26
- Silicon and Solar Cell Technologies 4
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- Industrial Vision Systems and Defect Detection 9
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- Welding Techniques and Residual Stresses 6
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- Advanced optical system design 3
- Co-authors
- Guojing ZhangTed LiangAlan R. StiversEric M. GulliksonEberhard SpillerRichard H. LivengoodPaul B. MirkarimiAndy Ma
- Journals
- Optics Express (1 paper)Japanese Journal of Applied Physics (2 papers)IEEE Journal of Quantum Electronics (1 paper)
- Partner nations
- United StatesBelgiumGermany
In The Last Decade
Pei-yang Yan
56 papers receiving 482 citations
Peers
Comparison fields: 5 of 41
- Surfaces, Coatings and Films 282
- Structural Biology 16
- Radiation 80
- Electrical and Electronic Engineering 462
- Industrial and Manufacturing Engineering 34
Countries citing papers authored by Pei-yang Yan
This map shows the geographic impact of Pei-yang Yan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Pei-yang Yan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Pei-yang Yan more than expected).
Fields of papers citing papers by Pei-yang Yan
This network shows the impact of papers produced by Pei-yang Yan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Pei-yang Yan. The network helps show where Pei-yang Yan may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Pei-yang Yan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 6 | |
| 2 | 2010 | 31 | |
| 3 | 2007 | 20 | |
| 4 | 2007 | 17 | |
| 5 | 2006 | 8 | |
| 6 | 2005 | 2 | |
| 7 | 2005 | 2 | |
| 8 | 2004 | 1 | |
| 9 | 2003 | 13 | |
| 10 | 2003 | 4 | |
| 11 | 2002 | 27 | |
| 12 | 2001 | 19 | |
| 13 | 1999 | 1 | |
| 14 | 1998 | 9 | |
| 15 | 1997 | 1 | |
| 16 | 1995 | 8 | |
| 17 | 1995 | 3 | |
| 18 | 1995 | 5 | |
| 19 | 1993 | 4 | |
| 20 | 1987 | 9 |
About Pei-yang Yan
Pei-yang Yan is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 58 papers that have together received 514 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (55 papers), Electron and X-Ray Spectroscopy Techniques (36 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers), Industrial Vision Systems and Defect Detection (9 papers), Welding Techniques and Residual Stresses (6 papers), Silicon and Solar Cell Technologies (4 papers), Advanced X-ray Imaging Techniques (3 papers) and Advanced optical system design (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (282 citations), Structural Biology (16 citations) and Radiation (80 citations). Pei-yang Yan has collaborated with scholars based in United States, Belgium and Germany. Frequent co-authors include Guojing Zhang, Ted Liang, Alan R. Stivers, Eric M. Gullikson, Eberhard Spiller, Richard H. Livengood, Paul B. Mirkarimi, Andy Ma, Farhad Salmassi and Kenneth A. Goldberg. Their work appears in journals such as Optics Express, Japanese Journal of Applied Physics and IEEE Journal of Quantum Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.